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31. 发明授权

US08959661B2 Atomic force microscope probe, method for preparing same, and uses thereof 有权
标题翻译：原子力显微镜探针，其制备方法及其应用
公开(公告)号：US08959661B2
公开(公告)日：2015-02-17
申请号：US13997139
申请日：2011-12-20
申请人： Jérôme Polesel-Maris , Thomas Berthelot , Pascal Viel
发明人： Jérôme Polesel-Maris , Thomas Berthelot , Pascal Viel
IPC分类号： G01Q60/24 , G01Q60/38 , G01Q10/04 , G01Q20/04 , G01Q60/42 , B82Y35/00
CPC分类号： G01Q60/38 , B82Y35/00 , G01Q10/045 , G01Q20/04 , G01Q60/42
摘要： An atomic force microscope probe comprising a piezo-electric resonator provided with two electrodes and coated with an insulating layer and a tip attached on the coated resonator and functionalized with at least one group or molecule of interest is disclosed. The disclosed technology also relates to preparation method and to different uses thereof.
摘要翻译：公开了一种原子力显微镜探针，其包括设置有两个电极并涂覆有绝缘层的压电谐振器和附着在涂覆的谐振器上的末端，并且用至少一个感兴趣的组或分子进行官能化。所公开的技术还涉及制备方法及其不同用途。

32. 发明授权

US08904561B2 Mechanical detection of Raman resonance 有权
标题翻译：拉曼共振的机械检测
公开(公告)号：US08904561B2
公开(公告)日：2014-12-02
申请号：US14129291
申请日：2012-07-02
申请人： H. Kumar Wickramasinghe
发明人： H. Kumar Wickramasinghe
IPC分类号： G01N21/65 , G01N13/16 , G01Q60/38 , G01Q60/18 , G01B5/28
CPC分类号： G01Q60/38 , G01N21/65 , G01Q30/02 , G01Q60/34
摘要： An atomic force microscope based apparatus and method for detecting Raman effect on a sample of interest utilizes first and second electromagnetic sources to emit first electromagnetic radiation of frequency Vi and second electromagnetic radiation of frequency V2 onto a probe tip, which is coupled to a structure that can oscillate the probe tip. The frequency Vi and the frequency v2 are selected to induce Raman effect on a sample engaged by the probe tip that results in Raman force interactions between the probe tip and the sample. Oscillations of the probe tip due to the Raman force interactions are then measured.
摘要翻译：用于检测感兴趣的样本上的拉曼效应的原子力显微镜的装置和方法利用第一和第二电磁源将频率为V 1的第一电磁辐射和频率为V2的第二电磁辐射发射到探针尖端上，该探针尖端与可以使探头尖端振荡。选择频率Vi和频率v2以对由探针尖端接合的样品引起拉曼效应，导致探针尖端和样品之间的拉曼力相互作用。然后测量由于拉曼力相互作用引起的探针尖端的振荡。

33. 发明授权

US08857247B2 Probe for a scanning probe microscope and method of manufacture 有权
标题翻译：探针用于扫描探针显微镜及其制造方法
公开(公告)号：US08857247B2
公开(公告)日：2014-10-14
申请号：US12123363
申请日：2008-05-19
申请人： Kevin J. Kjoller , Ami Chand , Nihat Okulan
发明人： Kevin J. Kjoller , Ami Chand , Nihat Okulan
IPC分类号： G01D21/00 , G01Q60/38 , B82Y35/00
CPC分类号： G01Q60/38 , B82Y35/00
摘要： A probe assembly for an instrument and a method of manufacture includes a substrate and a cantilever having a length that is independent of typical alignment error during fabrication. In one embodiment, the probe assembly includes a buffer section interposed between the substrate and the cantilever. The cantilever extends from the buffer section and a portion of the buffer section extends beyond an edge of the substrate. The portion of the buffer section is more stiff than the cantilever. The corresponding method of producing the probe assembly facilitates batch fabrication without compromising probe performance.
摘要翻译：用于仪器的探针组件和制造方法包括在制造期间具有独立于典型对准误差的长度的衬底和悬臂。在一个实施例中，探针组件包括介于基底和悬臂之间的缓冲部分。悬臂从缓冲部分延伸，并且缓冲部分的一部分延伸超过基底的边缘。缓冲部分的部分比悬臂更硬。生产探针组件的相应方法有利于批量制作而不损害探针性能。

34. 发明授权

US08701211B2 Method to reduce wedge effects in molded trigonal tips 有权
标题翻译：减少模制三角尖端楔形效应的方法
公开(公告)号：US08701211B2
公开(公告)日：2014-04-15
申请号：US12868601
申请日：2010-08-25
申请人： Nicolae Moldovan
发明人： Nicolae Moldovan
IPC分类号： G01Q60/38 , G01Q70/08 , G01Q70/10
CPC分类号： G01Q70/10 , B29C33/3857 , B29C33/424 , G01Q70/16
摘要： A method of producing sharp tips useful for scanning probe microscopy and related applications is described. The tips are formed by deposition into a mold(s) formed in a sacrificial crystalline semiconductor substrate with an exposed {311} surface which has been etched with a crystallographic etchant to form a 3-sided, trihedral or trigonal pyramidal mold(s) or indentation(s). The resultant tips, when released from the sacrificial mold material or substrate, are typically formed in the shape of a trigonal pyramid or a tetrahedron. Another embodiment involves starting with a {100} surface and the formation of two tips on opposite ends of a wedge at trigonal or trihedral points of the wedge. These tips are less susceptible to the tip wedge effect typical of tips formed using known methods.
摘要翻译：描述了可用于扫描探针显微镜和相关应用的尖锐尖端的方法。尖端通过沉积到形成于牺牲晶体半导体衬底中的模具中而形成，所述模具具有暴露的{311}表面，其已用结晶学蚀刻剂蚀刻以形成三面体，三面体或三角锥体模具或缩进（s）。当从牺牲模具材料或基底释放时，所得到的尖端通常形成为三角锥体或四面体的形状。另一个实施例涉及从{100}表面开始并且在楔的三角形或三角形点处在楔形物的相对端上形成两个尖端。这些尖端对于使用已知方法形成的尖端的典型的尖端楔形效应较不敏感。

35. 发明申请

US20130276176A1 ATOMIC FORCE MICROSCOPE PROBE, METHOD FOR PREPARING SAME, AND USES THEREOF 有权
标题翻译：原子力显微镜探针，其制备方法及其用途
公开(公告)号：US20130276176A1
公开(公告)日：2013-10-17
申请号：US13997139
申请日：2011-12-20
申请人： Jérôme Polesel-Maris , Thomas Berthelot , Pascal Viel
发明人： Jérôme Polesel-Maris , Thomas Berthelot , Pascal Viel
IPC分类号： G01Q60/38
CPC分类号： G01Q60/38 , B82Y35/00 , G01Q10/045 , G01Q20/04 , G01Q60/42
摘要： An atomic force microscope probe comprising a piezo-electric resonator provided with two electrodes and coated with an insulating layer and a tip attached on the coated resonator and functionalized with at least one group or molecule of interest is disclosed. The disclosed technology also relates to preparation method and to different uses thereof.
摘要翻译：公开了一种原子力显微镜探针，其包括设置有两个电极并涂覆有绝缘层的压电谐振器和附着在涂覆的谐振器上的末端，并且用至少一个感兴趣的组或分子进行官能化。所公开的技术还涉及制备方法及其不同用途。

36. 发明授权

US08484758B2 Apparatus and method for the functionalisation of AFM tips 失效
标题翻译： AFM提示功能化的装置和方法
公开(公告)号：US08484758B2
公开(公告)日：2013-07-09
申请号：US13262475
申请日：2010-03-29
申请人： Elena Martines , Isabel Garcia Martin , Soledad Penades Ullate
发明人： Elena Martines , Isabel Garcia Martin , Soledad Penades Ullate
IPC分类号： G01Q60/42 , G01Q60/38 , G01Q70/18
CPC分类号： G01Q60/42
摘要： The present invention includes an apparatus that holds the probes to a solid support throughout the passages of the functionalization process, thus avoiding user-dependent breakage or damage of the fragile AFM cantilevers. The apparatus allows the tips of the AFM probes to be placed face-down, which avoids the deposition of contaminants on their functional side. The device also allows functionalizing the tips with small liquid volumes and cleaning. The present invention includes a functionalization process preventing non-specific adsorption of molecules on the tip.
摘要翻译：本发明包括一种在功能化过程的整个通道中将探针保持在固体支持物上的装置，从而避免用户依赖的脆弱的AFM悬臂的破坏或破坏。该设备允许AFM探针的顶端面朝下放置，这避免了污染物在其功能侧的沉积。该设备还允许使用小液体体积和清洁功能化尖端。本发明包括阻止分子在尖端上的非特异性吸附的官能化过程。

37. 发明授权

US08474061B2 Production scale fabrication method for high resolution AFM tips 失效
标题翻译：高分辨率AFM提示的生产规模制作方法
公开(公告)号：US08474061B2
公开(公告)日：2013-06-25
申请号：US13608396
申请日：2012-09-10
申请人： Guy Cohen , Mark C. Reuter , Brent A. Wacaser , Maha M. Khayyat
发明人： Guy Cohen , Mark C. Reuter , Brent A. Wacaser , Maha M. Khayyat
IPC分类号： G01Q60/38 , B82Y40/00
CPC分类号： G01Q70/12 , G01Q60/38
摘要： A method of fabricating high resolution atomic force microscopy (AFM) tips including a single semiconductor nanowire grown at an apex of a semiconductor pyramid of each AFM tip is provided. The semiconductor nanowire that is grown has a controllable diameter and a high aspect ratio, without significant tapering from the tip of the semiconductor nanowire to its base. The method includes providing an AFM probe including a semiconductor cantilever having a semiconductor pyramid extending upward from a surface of said semiconductor cantilever. The semiconductor pyramid has an apex. A patterned oxide layer is formed on the AFM probe. The patterned oxide layer has an opening that exposes the apex of the semiconductor pyramid. A single semiconductor nanowire is grown on the exposed apex of the semiconductor pyramid utilizing a non-oxidized Al seed material as a catalyst for nanowire growth.
摘要翻译：提供了一种制造高分辨率原子力显微镜（AFM）尖端的方法，其包括在每个AFM尖端的半导体金字塔的顶点处生长的单个半导体纳米线。生长的半导体纳米线具有可控直径和高纵横比，而没有从半导体纳米线的尖端到其基底的显着锥形化。该方法包括提供包括半导体悬臂的AFM探针，该半导体悬臂具有从所述半导体悬臂的表面向上延伸的半导体金字塔。半导体金字塔有顶点。在AFM探针上形成图案化的氧化物层。图案化氧化物层具有暴露半导体金字塔的顶点的开口。使用未氧化的Al种子材料作为纳米线生长的催化剂，在半导体金字塔的暴露的顶点上生长单个半导体纳米线。

38. 发明授权

US08458811B2 Micro/nano devices fabricated from Cu-Hf thin films 失效
标题翻译：由Cu-Hf薄膜制成的微/纳米器件
公开(公告)号：US08458811B2
公开(公告)日：2013-06-04
申请号：US13072343
申请日：2011-03-25
申请人： Erik J. Luber , Colin Ophus , David Mitlin , Brian Olsen , Christopher Harrower , Velimir Radmilović
发明人： Erik J. Luber , Colin Ophus , David Mitlin , Brian Olsen , Christopher Harrower , Velimir Radmilović
IPC分类号： G01Q60/38
CPC分类号： G01Q60/40
摘要： An all-metal microdevice or nanodevice such as an atomic force microscope probe is manufactured from a copper-hafnium alloy thin film having an x-ray amorphous microstructure.
摘要翻译：全金属微器件或纳米器件如原子力显微镜探针由具有x射线无定形微结构的铜 - 铪合金薄膜制成。

39. 发明申请

US20130111637A1 MODIFICATION OF ATOMIC FORCE MICROSCOPY TIPS BY DEPOSITION OF NANOPARTICLES WITH AN AGGREGATE SOURCE 有权
标题翻译：通过用聚集源沉积纳米颗粒来改变原子力显微镜
公开(公告)号：US20130111637A1
公开(公告)日：2013-05-02
申请号：US13697598
申请日：2011-05-04
申请人： Elisa Leonor Roman Garcia , Lidia Martinez Orellana , Mercedes Diaz Lagos , Yves Huttel
发明人： Elisa Leonor Roman Garcia , Lidia Martinez Orellana , Mercedes Diaz Lagos , Yves Huttel
IPC分类号： G01Q60/38
CPC分类号： G01Q60/38 , B82Y15/00 , B82Y35/00 , C23C14/22 , G01Q60/42 , G01Q60/56
摘要： The present invention relates to a method for covering Atomic Force Microscopy (AFM) tips by depositing a material in the form of nanoparticles with an aggregate source.
摘要翻译：本发明涉及通过用聚集源沉积纳米颗粒形式的材料来覆盖原子力显微镜（AFM）尖端的方法。

40. 发明申请

US20120011624A1 MICRO/NANO DEVICES FABRICATED FROM CU-HF THIN FILMS 失效
标题翻译：由CU-HF薄膜制成的MICRO / NANO器件
公开(公告)号：US20120011624A1
公开(公告)日：2012-01-12
申请号：US13072343
申请日：2011-03-25
申请人： Erik J. LUBER , Colin OPHUS , David MITLIN , Brian OLSEN , Christopher HARROWER , Velimir RADMILOVIC
发明人： Erik J. LUBER , Colin OPHUS , David MITLIN , Brian OLSEN , Christopher HARROWER , Velimir RADMILOVIC
IPC分类号： G01Q60/38
CPC分类号： G01Q60/40
摘要： An all-metal microdevice or nanodevice such as an atomic force microscope probe is manufactured from a copper-hafnium alloy thin film having an x-ray amorphous microstructure.
摘要翻译：全金属微器件或纳米器件如原子力显微镜探针由具有x射线无定形微结构的铜 - 铪合金薄膜制成。

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