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    • 42. 发明授权
    • Load characteristic estimating apparatus for driving machine
    • 用于驱动机器的负载特性估计装置
    • US09124212B2
    • 2015-09-01
    • US14115662
    • 2012-03-27
    • Kenji ShimodaHidetoshi IkedaHiroyuki SekiguchiTakashi Isoda
    • Kenji ShimodaHidetoshi IkedaHiroyuki SekiguchiTakashi Isoda
    • H02P1/00H02P7/00G05B13/00G05B11/36G05B11/42H02P31/00H02P23/14G05B19/19
    • H02P31/00G05B19/19H02P23/14H02P2205/05
    • A load characteristic estimating apparatus for a driving machine includes an action-command generating unit for generating an action command for a position and speed of a driving machine, a driving-force-command generating unit for generating a driving force command to cause an action of the driving machine to follow the action command, a driving unit for generating driving force corresponding to the driving force command and drive the driving machine, a sign determining unit for determining, based on driving speed of the driving machine, the state of the driving machine, a load-driving-force estimating unit for calculating, based on the driving force command, a load driving force signal, and a normal reverse-rotation-average calculating unit and a reverse-rotation-average calculating unit, configured to calculate a sequential average of the load driving force signal, respectively when the determination result is a normal and reverse rotation action.
    • 一种用于驱动机器的负载特性估计装置,包括用于产生用于驱动机器的位置和速度的动作指令的动作指令生成单元,用于产生驱动力命令的驱动力指令生成单元, 所述驱动机器跟随动作指令,用于产生与所述驱动力指令相对应的驱动力并驱动所述驱动机构的驱动单元,符号确定单元,用于基于所述驱动机器的驱动速度来确定所述驱动机器的状态 ,负载驱动力估计单元,用于基于所述驱动力指令计算负载驱动力信号,以及正向反转平均值计算单元和反向旋转平均值计算单元,用于计算顺序 当确定结果是正常和反向旋转动作时,分别是负载驱动力信号的平均值。
    • 43. 发明申请
    • PARALLEL DRIVE SYSTEM
    • 并行驱动系统
    • US20120299524A1
    • 2012-11-29
    • US13579237
    • 2010-02-17
    • Shigeo AmigasayaHiroyuki SekiguchiHidetoshi Ikeda
    • Shigeo AmigasayaHiroyuki SekiguchiHidetoshi Ikeda
    • G05B11/32H02P25/06
    • G05B19/237G05B2219/50228
    • To provide a parallel drive system that can reduce vibrations of an arm member and can realize positioning at a high speed even when a slave servomotor does not have a position detector, at a low cost. To achieve this object, a parallel drive system of the invention includes: a master servomotor and a slave servomotor that include linearly-moving movable units that are arranged in parallel to each other, respectively; and an arm member that forms a bridge between the two movable units. The system includes: a position detector detecting position information on the movable unit of the master servomotor; an acceleration sensor detecting acceleration information on the movable unit of the slave servomotor; a master servo amplifier controlling the master servomotor based on the position information; and a slave servo amplifier controlling the slave servomotor based on the position information and the acceleration information.
    • 为了提供能够降低臂构件的振动的并联驱动系统,即使在从动伺服电动机不具有位置检测器的情况下也能够以高速实现定位。 为了实现该目的,本发明的并联驱动系统包括:主伺服电动机和从动伺服电动机,其分别包括彼此平行布置的线性运动的可移动单元; 以及在两个可移动单元之间形成桥的臂构件。 该系统包括:位置检测器,检测主伺服电机的可移动单元上的位置信息; 检测从动伺服电机的可动部的加速度信息的加速度传感器; 主伺服放大器,基于位置信息控制主伺服电动机; 以及从伺服放大器,其基于位置信息和加速度信息来控制从伺服马达。
    • 45. 发明申请
    • VEHICLE DRIVE ASSIST SYSTEM
    • 车辆驾驶辅助系统
    • US20090248270A1
    • 2009-10-01
    • US12408189
    • 2009-03-20
    • Hiroyuki SEKIGUCHI
    • Hiroyuki SEKIGUCHI
    • G06F17/00
    • B60W30/16B60W10/06B60W10/184B60W2420/42B60W2520/10B60W2520/14B60W2550/10G08G1/166
    • When a preceding vehicle moves away during follow-up running control, it is determined whether or not a forward obstacle is recognized. When a forward obstacle is recognized, it is determined whether or not the forward obstacle satisfies any of obstacle specifying conditions corresponding to a plurality of preset types. A basic threshold value set corresponding to the satisfied type is corrected by three correction values so as to set first to third estimated-collision-time determining values. The estimated-collision-time determining values are compared with an estimated collision time of a subject vehicle with respect to the forward obstacle, and acceleration control on the subject vehicle is limited stepwise in accordance with the comparison values.
    • 在后续行驶控制中,前方车辆离开时,判定是否识别出前方障碍物。 当识别出前方障碍物时,确定前方障碍物是否满足与多种预设类型对应的障碍物指定条件。 通过三个校正值来校正对应于满足类型的基本阈值集,以便设置第一至第三估计碰撞时间确定值。 将估计碰撞时间确定值与目标车辆相对于前方障碍物的估计碰撞时间进行比较,并且根据比较值逐步限制对主车辆的加速控制。
    • 46. 发明申请
    • Vehicle running control system
    • 车辆运行控制系统
    • US20090234553A1
    • 2009-09-17
    • US12382181
    • 2009-03-10
    • Hiroyuki Sekiguchi
    • Hiroyuki Sekiguchi
    • B60W30/16
    • B60W30/16B60W2420/403G08G1/165G08G1/167
    • In a vehicle running control system, when an estimated collision time taken until a subject vehicle collides with a target object is shorter than a set threshold value, the target object is regarded as a preceding vehicle, and the subject vehicle is caused to follow the target object. Even in a case in which the estimated collision time is longer than or equal to the threshold value, when the target object is present on a subject-vehicle traveling lane or when the subject-vehicle traveling lane is not recognized, if an overlapping ratio between the subject vehicle and the target object is more than or equal to an overlapping-ratio determining threshold value, the target object is regarded as a preceding vehicle, and the subject vehicle is caused to follow the target object.
    • 在车辆行驶控制系统中,当对象车辆与目标物体碰撞时所估计的碰撞时间短于设定的阈值时,将目标对象视为前方车辆,并使被检体车辆跟随目标 目的。 即使在估计碰撞时间大于或等于阈值的情况下,当目标对象存在于主车辆行驶车道上时或者当未被识别的车辆行驶车道时,如果目标对象之间的重叠比例 本车辆和目标物体大于或等于重叠比确定阈值,则将目标物体视为前方车辆,并使本车辆跟随目标物体。
    • 47. 发明授权
    • Test apparatus, test method, electronic device manufacturing method, test simulator and test simulation method
    • 试验装置,试验方法,电子装置制造方法,试验模拟装置及试验模拟方法
    • US07532994B2
    • 2009-05-12
    • US11395094
    • 2006-03-31
    • Hideki TadaMitsuo HoriTakahiro KataokaHiroyuki Sekiguchi
    • Hideki TadaMitsuo HoriTakahiro KataokaHiroyuki Sekiguchi
    • G01R27/28
    • G01R31/31932G01R31/31928G01R31/31937
    • A test apparatus for testing an electronic device by providing test signals to the electronic device and comparing multiple output signals with respective anticipated values is disclosed, the test apparatus including: a reference timing detecting unit for detecting that one of the output signals has changed; a setting unit for setting beforehand a minimum time from changing of the output signal to changing of another output signal; an acquisition unit for acquiring the value of the latter output signal at a timing at which the minimum time has elapsed from detection of change of the former output signal; and a determination unit for determining the electronic device to be defective in the event that the value of the latter output signal thus acquired does not match the value which the latter output signal should assume following elapsing of the minimum time.
    • 公开了一种用于通过向电子设备提供测试信号并将多个输出信号与各自的预期值进行比较来测试电子设备的测试设备,该测试设备包括:用于检测输出信号中的一个已经改变的参考定时检测单元; 设置单元,用于预先设置从输出信号的改变到另一个输出信号的改变的最小时间; 获取单元,用于在从前一个输出信号的改变的检测经过最小时间的定时获取后一个输出信号的值; 以及确定单元,用于在如此获取的后一个输出信号的值与后一个输出信号应该在最小时间之后应该呈现的值不匹配的情况下确定该电子设备是有缺陷的。
    • 48. 发明申请
    • SEMICONDUCTOR INTEGRATED CIRCUIT AND MEMORY CHECKING METHOD
    • 半导体集成电路和存储器检查方法
    • US20080253208A1
    • 2008-10-16
    • US12053944
    • 2008-03-24
    • Tokushi YamaguchiHiroyuki SekiguchiRyoji ShiotaMitsuya Nakano
    • Tokushi YamaguchiHiroyuki SekiguchiRyoji ShiotaMitsuya Nakano
    • G11C29/12
    • G11C29/46G11C2029/0407
    • The semiconductor integrated circuit includes a memory for storing secret data, a memory BIST circuit for executing a memory. BIST, a first selector for switching between a path for a memory isolation test via an external terminal and a path from the memory BIST circuit, a second selector for switching between a path from the output of the first selector and a path from a normal circuit and having an output coupled to the memory, and a third selector for switching between a path from the output of the memory and a path for receiving a pseudo signal and receiving a check completion signal outputted from the memory BIST circuit as a selection signal. In this semiconductor integrated circuit, after the memory is initialized by executing the memory BIST, the memory can be accessed from the external terminal via the path for the memory isolation test.
    • 半导体集成电路包括用于存储秘密数据的存储器,用于执行存储器的存储器BIST电路。 BIST,用于在经由外部终端的存储器隔离测试的路径和来自存储器BIST电路的路径之间切换的第一选择器,用于在来自第一选择器的输出的路径与来自正常电路的路径之间切换的第二选择器 并且具有耦合到存储器的输出,以及第三选择器,用于在从存储器的输出的路径和用于接收伪信号的路径之间切换并接收从存储器BIST电路输出的检查完成信号作为选择信号。 在该半导体集成电路中,在通过执行存储器BIST初始化存储器之后,可以通过用于存储器隔离测试的路径从外部端子访问存储器。