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    • 52. 发明申请
    • Rewrite prevention in a variable resistance memory
    • 在可变电阻存储器中重写防止
    • US20050146958A1
    • 2005-07-07
    • US11070213
    • 2005-03-03
    • John MooreR. Baker
    • John MooreR. Baker
    • G11C13/00G11C8/02G11C11/34G11C11/406G11C11/4091G11C13/02G11C16/02G11C16/28G11C7/00
    • G11C13/0004G11C11/406G11C11/4091G11C13/0011G11C13/003G11C13/0033G11C13/004G11C13/0061G11C2013/0054G11C2207/2281G11C2213/72G11C2213/76G11C2213/79
    • A variable resistance memory cell is read by a sense amplifier but without rewriting the contents of the memory cell. If the memory cell has an access transistor, the access transistor is switched off to decouple the cell from the bit line after a predetermined amount of time. The predetermined amount of time is sufficiently long enough to permit the logical state of the cell to be transferred to the bit line and also sufficiently short to isolate the cell from the bit line before the sense amplifier operates. For memory cells which do not utilize an access transistor, an isolation transistor may be placed in the bit line located between and serially connection the portion of the bit line from the sense amplifier to the isolation transistor and the portion of the bit line from the isolation transistor to the memory cell. The isolation transistor, normally conducting, is switched off after the predetermined time past the time the bit line begins to discharge through the memory cell, thereby isolating the memory cell from the sense amplifier before a sensing operation begins.
    • 可变电阻存储单元由读出放大器读取,但不重写存储单元的内容。 如果存储单元具有存取晶体管,则在预定时间量之后,存取晶体管被切断以将单元与位线去耦。 预定的时间量足够长以允许将单元的逻辑状态传送到位线,并且还足够短以在读出放大器操作之前将单元与位线隔离。 对于不使用存取晶体管的存储单元,可以将隔离晶体管放置在位线之间,位线之间并且将位线的从读出放大器的部分串联连接到隔离晶体管,并且位线的部分与隔离 晶体管到存储单元。 在通过存储单元的位线开始放电的时间之后的预定时间之后,正常导通的隔离晶体管被关断,从而在感测操作开始之前将存储单元与读出放大器隔离。