会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 5. 发明申请
    • FLASH MEMORY DEVICE AND METHOD OF PROGRAMMING THE SAME
    • 闪存存储器件及其编程方法
    • US20130275658A1
    • 2013-10-17
    • US13767535
    • 2013-02-14
    • JINMAN HANHO-CHUL LEEMIN-SU KIMSANGWAN NAMJUNGHOON PARK
    • JINMAN HANHO-CHUL LEEMIN-SU KIMSANGWAN NAMJUNGHOON PARK
    • G06F12/02
    • G06F12/0246G11C16/0483G11C16/3418H01L27/11582
    • A method is provided for programming a flash memory device including memory cells formed in a direction perpendicular to a substrate, a first sub word line connected to first memory cells and selectable by a first selection line, and a second sub word line connected to second memory cells and selectable by a second selection line, the first and second memory cells being formed at the same level and being supplied with a program voltage at the same time. The method includes performing LSB program operations on the first and second sub word lines by enabling the first and second selection lines, respectively; performing CSB program operations on the first and second sub word lines by enabling the first and second selection lines, respectively; and performing MSB program operations on the first and second sub word lines by enabling the first and second selection lines, respectively.
    • 提供一种用于编程闪存器件的方法,所述闪存器件包括沿垂直于衬底的方向形成的存储器单元,连接到第一存储器单元并由第一选择线选择的第一子字线以及连接到第二存储器的第二子字线 并且可由第二选择线选择,第一和第二存储器单元在同一电平上形成,同时被提供有编程电压。 该方法包括分别通过启用第一和第二选择线来对第一和第二子字线执行LSB编程操作; 通过分别启用第一和第二选择线来对第一和第二子字线执行CSB编程操作; 以及通过分别启用第一和第二选择线来对第一和第二子字线执行MSB编程操作。
    • 6. 发明申请
    • NONVOLATILE MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME
    • 非易失性存储器件和包括其的存储器系统
    • US20130170297A1
    • 2013-07-04
    • US13619118
    • 2012-09-14
    • Sang-Wan NAMKyung-Hwa KANGJunghoon PARK
    • Sang-Wan NAMKyung-Hwa KANGJunghoon PARK
    • G11C16/04
    • G11C16/04G11C16/0483G11C16/08G11C16/10H01L27/115H01L27/11582
    • According to example embodiments, a nonvolatile memory device includes a first and a second NAND string. The first NAND string includes a first string selection transistor, a first local ground and a first global ground selection transistor, and first memory cells stacked in a direction perpendicular to a substrate. The second NAND string includes a second string selection transistor, a second local ground and a second global ground selection transistor, and second memory cells stacked in the direction perpendicular to the substrate. The device includes a selection line driver including path transistors configured to select and provide at least one operation voltage to the first and second string selection transistors, the first and second local and global ground selection transistors. The first and second string selection transistors are electrically isolated from each other, and the first and second global ground selection transistors are electrically connected.
    • 根据示例性实施例,非易失性存储器件包括第一和第二NAND串。 第一NAND串包括第一串选择晶体管,第一局部地和第一全局接地选择晶体管,以及沿垂直于衬底的方向堆叠的第一存储单元。 第二NAND串包括第二串选择晶体管,第二局部地和第二全局接地选择晶体管,以及沿与基板垂直的方向堆叠的第二存储单元。 该器件包括选择线驱动器,其包括被配置为选择并向第一和第二串选择晶体管,第一和第二局部和全局地选择晶体管提供至少一个操作电压的路径晶体管。 第一和第二串选择晶体管彼此电绝缘,并且第一和第二全局接地选择晶体管电连接。