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    • 1. 发明授权
    • Precision passive circuit structure
    • 精密无源电路结构
    • US07566946B2
    • 2009-07-28
    • US11865432
    • 2007-10-01
    • Douglas D. CoolbaughHayden C. Cranford, Jr.Terence B. HookAnthony K. Stamper
    • Douglas D. CoolbaughHayden C. Cranford, Jr.Terence B. HookAnthony K. Stamper
    • H01C10/00
    • H01L27/0802H01L23/5256H01L2924/0002H01L2924/00
    • A circuit having a precision passive circuit element, such as a resistor or a capacitor, with a target value of an electrical parameter is fabricated on a substrate with a plurality of independent parallel-connected passive circuit elements. The plurality of passive circuit elements are designed to have a plurality of values of the electrical parameter which are spaced or offset at or around the target value of the electrical parameter, such as three circuit elements with one having a value at the target value, one having a value above the target value, and one having a value below the target value. Each passive circuit element also has a fuse in series therewith. A reference calibration structure is also fabricated, which can be a passive circuit element having the target value of the electrical parameter, in a reference area of the substrate under the same conditions and at the same time as fabrication of the plurality of passive circuit elements. The actual component value of the reference calibration structure is then measured, and based upon the measurement a single precision passive element of the plurality of parallel passive circuit elements is selected by blowing the fuses of, and thus deselecting, the other independent parallel connected passive circuit elements.
    • 在具有多个独立并联无源电路元件的基板上制造具有目标值为电参数的精密无源电路元件(例如电阻器或电容器)的电路。 多个无源电路元件被设计为具有电参数的多个值,其在电参数的目标值处或周围被间隔或偏移,例如具有值在目标值的三个电路元件,一个 具有高于目标值的值,并且具有低于目标值的值。 每个无源电路元件还具有与其串联的保险丝。 还可以在相同条件下的基板的参考区域中以及在制造多个无源电路元件的同时,制造参考校准结构,其可以是具有电参数的目标值的无源电路元件。 然后测量参考校准结构的实际分量值,并且基于测量,多个并联无源电路元件中的单精度无源元件通过吹入另一个独立并联无源电路的熔丝并因此取消选择来选择 元素。
    • 2. 发明授权
    • Static noise margin monitoring circuit and method
    • 静态噪声容限监控电路及方法
    • US08729908B2
    • 2014-05-20
    • US13407822
    • 2012-02-29
    • Hayden C. Cranford, Jr.Terence B. Hook
    • Hayden C. Cranford, Jr.Terence B. Hook
    • G01R29/26
    • G11C29/50G11C11/41G11C2029/0409G11C2029/5002
    • A monitoring circuit and method, wherein a voltage waveform having a linear falling edge is applied to a first node of at least one test memory cell (e.g., a plurality of test memory cells connected in parallel). The input voltage at the first node is captured when the output voltage at a second node of the test memory cell(s) rises above a high reference voltage during the falling edge. Then, a difference is determined between the input voltage as captured and either (1) the output voltage at the second node, as captured when the input voltage at the first node falls below the first reference voltage during the falling edge, or (2) a low reference voltage. This difference is proportional to the static noise margin (SNM) of the test memory cell(s) such that any changes in the difference noted with repeated monitoring are indicative of corresponding changes in the SNM.
    • 一种监视电路和方法,其中具有线性下降沿的电压波形被施加到至少一个测试存储器单元(例如,并联连接的多个测试存储单元)的第一节点。 当在下降沿期间,当测试存储单元的第二个节点处的输出电压上升到高于参考电压时,捕获第一节点处的输入电压。 然后,在捕获的输入电压和(1)第二节点处的输出电压之间确定差异,如在第一节点处的输入电压在下降沿期间低于第一参考电压时捕获的,或者(2) 低参考电压。 该差异与测试存储器单元的静态噪声容限(SNM)成比例,使得通过重复监测指出的差异中的任何变化表示SNM的相应变化。
    • 4. 发明授权
    • Structure and method for providing precision passive elements
    • 提供精密无源元件的结构和方法
    • US07300807B2
    • 2007-11-27
    • US10709109
    • 2004-04-14
    • Douglas D CoolbaughHayden C. Cranford, Jr.Terence B. HookAnthony K. Stamper
    • Douglas D CoolbaughHayden C. Cranford, Jr.Terence B. HookAnthony K. Stamper
    • H01L21/66
    • H01L27/0802H01L23/5256H01L2924/0002H01L2924/00
    • A circuit having a precision passive circuit element, such as a resistor or a capacitor, with a target value of an electrical parameter is fabricated on a substrate with a plurality of independent parallel-connected passive circuit elements. The plurality of passive circuit elements are designed to have a plurality of values of the electrical parameter which are spaced or offset at or around the target value of the electrical parameter, such as three circuit elements with one having a value at the target value, one having a value above the target value, and one having a value below the target value. Each passive circuit element also has a fuse in series therewith. A reference calibration structure is also fabricated, which can be a passive circuit element having the target value of the electrical parameter, in a reference area of the substrate under the same conditions and at the same time as fabrication of the plurality of passive circuit elements. The actual component value of the reference calibration structure is then measured, and based upon the measurement a single precision passive element of the plurality of parallel passive circuit elements is selected by blowing the fuses of, and thus deselecting, the other independent parallel connected passive circuit elements.
    • 在具有多个独立并联无源电路元件的基板上制造具有目标值为电参数的精密无源电路元件(例如电阻器或电容器)的电路。 多个无源电路元件被设计为具有电参数的多个值,其在电参数的目标值处或周围被间隔或偏移,例如具有值在目标值的三个电路元件,一个 具有高于目标值的值,并且具有低于目标值的值。 每个无源电路元件还具有与其串联的保险丝。 还可以在相同条件下的基板的参考区域中以及在制造多个无源电路元件的同时,制造参考校准结构,其可以是具有电参数的目标值的无源电路元件。 然后测量参考校准结构的实际分量值,并且基于测量,多个并联无源电路元件中的单精度无源元件通过吹入另一个独立并联无源电路的熔丝并因此取消选择来选择 元素。
    • 5. 发明授权
    • One-sample-per-bit decision feedback equalizer (DFE) clock and data recovery
    • 单采样每位决策反馈均衡器(DFE)时钟和数据恢复
    • US07809054B2
    • 2010-10-05
    • US11405997
    • 2006-04-18
    • Juan A. CarballoHayden C. Cranford, Jr.Gareth J. NichollsVernon R. NormanMartin L. Schmatz
    • Juan A. CarballoHayden C. Cranford, Jr.Gareth J. NichollsVernon R. NormanMartin L. Schmatz
    • H03H7/30H03H7/40H03K5/159
    • H04L25/03063
    • Disclosed are a receiver circuit, method and design architecture of a decision feedback equalizer (DFE) Clock-And-Data Recovery (CDR) architecture that utilizes/produces one sample-per-bit in the receiver and reduces bit-error-rate (BER). An integrating receiver is combined with a decision feedback equalizer along with the appropriate (CDR) loop phase detector to maintain a single sample per bit requirement. The incoming voltage is converted to a current and connected to a current summing node. Weighted currents determined by the values of previously detected bits and their respective feedback coefficients are also connected to this node. Additionally, the summed currents is integrated and converted to a voltage. A sampler is utilized to make a bit decision based on the resulting voltage. After sampling, the integrator is reset before analysis of the next bit. The necessary amplification is achieved by maximizing the sensitivity of the latch, using integration in front of the data latch.
    • 公开了一种在接收机中利用/产生一个每位采样的判决反馈均衡器(DFE)时钟和数据恢复(CDR)架构的接收器电路,方法和设计架构,并且降低了误码率(BER )。 集成接收机与决策反馈均衡器以及适当的(CDR)环路相位检测器相结合,以保持每位需求的单个采样。 输入电压被转换为电流并连接到电流求和节点。 由先前检测到的位及其各自的反馈系数的值确定的加权电流也连接到该节点。 另外,总和电流被积分并转换成电压。 采样器用于基于所得到的电压进行位决定。 采样后,积分器在分析下一位之前被复位。 通过使用在数据锁存器前面的积分来最大化锁存器的灵敏度来实现必要的放大。
    • 7. 发明授权
    • Method for on-chip diagnostic testing and checking of receiver margins
    • 用于片上诊断测试和接收器边距检查的方法
    • US07721134B2
    • 2010-05-18
    • US11566576
    • 2006-12-04
    • Hayden C. Cranford, Jr.Daniel J. FriedmanMounir MeghelliThomas H. Toifl
    • Hayden C. Cranford, Jr.Daniel J. FriedmanMounir MeghelliThomas H. Toifl
    • H04L25/00H03D3/24
    • G01R31/3171B82Y25/00G01R33/093
    • A method and system for determining the eye pattern margin parameters of a receiver system during diagnostic testing is presented. The circuitry in the receiver's front end comprises a series of latches, XOR gates and OR gates which first provide the data samples and edge samples, i.e., data sampled at the rising or falling edge of an (edge) clock characterized by a phase delay relative to the data sampling clock. The receiver also comprises optimization circuitry for the ideal alignment of the edge clock (edges) with the data edges. The method further provides for a phase shifting of the edge clock to the left and right from the ideal/locked position to screen the data eye pattern in order to compute the Bit Error Rate (BER) value. The position of the edge clock relative to the data sampling clock determines the horizontal eye opening for the computed BER.
    • 提出了一种用于在诊断测试期间确定接收机系统的眼图边缘参数的方法和系统。 接收机前端的电路包括一系列锁存器,XOR门和OR门,它们首先提供数据样本和边缘采样,即在(边沿)时钟的上升沿或下降沿采样的数据,其特征在于相位延迟相对 到数据采样时钟。 接收机还包括用于边缘时钟(边缘)与数据边缘的理想对准的优化电路。 该方法还提供了边缘时钟从理想/锁定位置向左和向右移相以屏蔽数据眼图,以便计算误码率(BER)值。 边缘时钟相对于数据采样时钟的位置决定了计算的BER的水平眼睛开度。
    • 8. 发明授权
    • Generating an eye diagram of integrated circuit transmitted signals
    • 生成集成电路传输信号的眼图
    • US07684478B2
    • 2010-03-23
    • US11427831
    • 2006-06-30
    • Hayden C. Cranford, Jr.Fadi H. GebaraJeremy D. Schaub
    • Hayden C. Cranford, Jr.Fadi H. GebaraJeremy D. Schaub
    • H04B17/00H04L27/06
    • G01R31/31711H04L1/205H04L1/24
    • A sequence of K voltage samples of a transmitted data signal is generated by sampling, digitizing, and storing voltage samples of the data signal with an imbedded sample clock on an IC having an unknown period TS. The K voltage samples are plotted against a time base of K sequential times TB[K] normalized so all samples fall within one cycle of the data clock used to generate the data signal or a unit time of 1. The time base is generated by estimating the sample clock period TSE to be some multiple of 1/P where P is greater than K. Eye diagrams are analyzed for time jitter wherein only the minimum value of jitter is saved. TSE is incremented by 1/P until TS is greater than one half the data clock period. The eye diagram at the TSE with the minimum time jitter is used to analyze the data channels.
    • 通过在具有未知周期TS的IC上以嵌入的采样时钟采样,数字化和存储数据信号的电压采样来生成发送数据信号的K个电压样本的序列。 K电压样本相对于K次顺序TB [K]的时基绘制,归一化,所以所有采样都落在用于生成数据信号的数据时钟或单位时间为1的一个周期内。时基是通过估计 采样时钟周期TSE为1 / P的某个倍数,其中P大于K.眼图分析时间抖动,其中只保存抖动的最小值。 TSE递增1 / P,直到TS大于数据时钟周期的一半。 TSE具有最小时间抖动的眼图用于分析数据通道。