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    • 6. 发明授权
    • Scanning probe microscope
    • 扫描探针显微镜
    • US5496999A
    • 1996-03-05
    • US320490
    • 1994-10-11
    • Frederick I. LinkerMichael D. KirkJohn D. AlexanderSang-il ParkSung-il ParkIan R. SmithPeter R. Swift
    • Frederick I. LinkerMichael D. KirkJohn D. AlexanderSang-il ParkSung-il ParkIan R. SmithPeter R. Swift
    • G01Q10/02G01Q10/04G01Q10/06G01Q20/00G01Q30/02G01Q30/06G01Q60/10G01Q60/24G01Q70/02G02B21/00H01J37/26
    • G01Q10/04B82Y35/00G01Q10/06G01Q20/02G01Q30/025G01Q70/02G02B21/002Y10S977/851Y10S977/86Y10S977/873
    • A scanning probe microscope having numerous advantages is disclosed. Respective scanning force and scanning tunneling probes are removably mounted in the head using kinematic mounting techniques so that they may be substituted for one another without the need to adjust the cantilever deflection sensor. A linear position-sensitive photodetector in the deflection sensor eliminates further the need for adjustments. A motorized, non-stacked x,y coarse movement stage is kinematically positioned with respect to the base and features a minimized mechanical loop to reduce thermal and vibrational effects on the position of the sample. A z coarse movement stage positions the head kinematically with respect to the base and includes a motorized drive means which allows the height, tilt and pitch of the probe to be adjusted. The scanner includes x,y and z sample position detectors which provide an accurate measurement of the position of the sample with respect to the probe. The z position detector provides an output which is exclusive of sample tilt and which may be used as an output of the scanning probe microscope. The outputs of the x,y and z position detectors may also be connected in feedback loops with the controller to improve the performance of the scanning probe microscope.
    • 公开了具有许多优点的扫描探针显微镜。 使用运动学安装技术将各扫描力和扫描隧道探针可拆卸地安装在头部中,使得它们可以彼此替代,而不需要调整悬臂偏转传感器。 偏转传感器中的线性位置敏感光电检测器进一步消除了对调整的需要。 机动的,非堆叠的x,y粗移动台相对于基座运动地定位,并具有最小化的机械回路,以减少对样品位置的热和振动影响。 z粗移动台将头相对于基座运动地定位,并且包括允许调节探头的高度,倾斜和俯仰的电动驱动装置。 扫描器包括x,y和z采样位置检测器,其提供样品相对于探针的位置的精确测量。 z位置检测器提供的输出不包括样品倾斜,可用作扫描探针显微镜的输出。 x,y和z位置检测器的输出也可以与控制器连接在反馈回路中,以提高扫描探针显微镜的性能。
    • 7. 发明授权
    • Scanning probe microscope
    • 扫描探针显微镜
    • US5376790A
    • 1994-12-27
    • US850669
    • 1992-03-13
    • Frederick I. LinkerMichael D. KirkJohn D. AlexanderSang-il ParkSung-il ParkIan R. Smith
    • Frederick I. LinkerMichael D. KirkJohn D. AlexanderSang-il ParkSung-il ParkIan R. Smith
    • G01Q10/02G01Q10/04G01Q10/06G01Q20/00G01Q30/02G01Q30/06G01Q60/10G01Q60/24G01Q70/02G02B21/00H01J37/00
    • G01Q10/04B82Y35/00G01Q10/06G01Q20/02G01Q30/025G01Q70/02G02B21/002Y10S977/851Y10S977/86Y10S977/873
    • A scanning probe microscope having numerous advantages is disclosed. Respective scanning force and scanning tunneling probes are removably mounted in the head using kinematic mounting techniques so that they may be substituted for one another without the need to adjust the cantilever deflection sensor. A linear position-sensitive photodetector in the deflection sensor eliminates further the need for adjustments. A motorized, non-stacked x,y coarse movement stage is kinematically positioned with respect to the base and features a minimized mechanical loop to reduce thermal and vibrational effects on the position of the sample. A z coarse movement stage positions the head kinematically with respect to the base and includes a motorized drive means which allows the height, tilt and pitch of the probe to be adjusted. The scanner includes x,y and z sample position detectors which provide an accurate measurement of the position of the sample with respect to the probe. The z position detector provides an output which is exclusive of sample tilt and which may be used as an output of the scanning probe microscope. The outputs of the x,y and z position detectors may also be connected in feedback loops with the controller to improve the performance of the scanning probe microscope.
    • 公开了具有许多优点的扫描探针显微镜。 使用运动学安装技术将各扫描力和扫描隧道探针可拆卸地安装在头部中,使得它们可以彼此替代,而不需要调整悬臂偏转传感器。 偏转传感器中的线性位置敏感光电检测器进一步消除了对调整的需要。 机动的,非堆叠的x,y粗移动台相对于基座运动地定位,并具有最小化的机械回路,以减少对样品位置的热和振动影响。 z粗移动台将头相对于基座运动地定位,并且包括允许调节探头的高度,倾斜和俯仰的电动驱动装置。 扫描器包括x,y和z采样位置检测器,其提供样品相对于探针的位置的精确测量。 z位置检测器提供的输出不包括样品倾斜,可用作扫描探针显微镜的输出。 x,y和z位置检测器的输出也可以与控制器连接在反馈回路中,以提高扫描探针显微镜的性能。
    • 8. 发明授权
    • Infill drilling pattern
    • 填充钻孔图案
    • US4610301A
    • 1986-09-09
    • US781574
    • 1985-09-30
    • Farhad GhassemiJohn D. Alexander
    • Farhad GhassemiJohn D. Alexander
    • E21B43/30E21B43/24
    • E21B43/30
    • A method is provided for modifying an original distribution pattern including an original central injection well and four original corner production wells. One or more new injection wells are provided at locations approximately aligned midway between adjacent ones of the original corner production wells. In addition to the two original corner production wells between which it is located, there are associated with each new injection well four additional new production wells. A first pair of these new production wells is provided at locations substantially aligned between and preferably substantially midway between the original central injection well and the two adjacent ones of the original corner production wells. A second pair of new production wells is located substantially as a mirror image of the first pair about an imaginary straight line between the two adjacent ones of the original corner production wells. This forms a new seven-spot pattern having its new injection well located substantially in the center of an area which was relatively unaffected by the original fluid distribution pattern.
    • 提供一种用于修改包括原始中央注入井和四个原始角生产井的原始分布模式的方法。 一个或多个新的注入井提供在相邻的原始角生产井之间大致对准的位置处。 除了位于其之间的两个原始角落生产井之外,还与每个新的注入井有四个附加的新生产井。 这些新生产井中的第一对提供在原始中心注入井和两个相邻的原始角生产井之间基本上对准且优选地基本上中间的位置处。 第二对新的生产井基本上被定位为第一对的镜像,围绕两个相邻的原始角生产井之间的假想直线。 这形成了新的七点图案,其新的注射井基本上位于相对不受原始流体分布模式影响的区域的中心。
    • 9. 发明授权
    • High resolution surface potential microscope
    • 高分辨率表面电位显微镜
    • US08087289B2
    • 2012-01-03
    • US12172640
    • 2008-07-14
    • John D. AlexanderSergei Magonov
    • John D. AlexanderSergei Magonov
    • G01N23/00
    • G01Q60/30
    • A scanning probe system and method for using the same are disclosed. The system includes a probe that interacts with a specimen. The probe is caused to vibrate at a first frequency of the probe. A probe deflection signal indicative of an oscillation amplitude of the probe is generated and used to set the z-position probe position to maintain a property of the probe deflection signal at the first frequency at a predetermined value. A probe signal, having a DC and an AC component is applied between the specimen and the probe. The amplitude of a frequency component of the deflection signal at a mixing frequency of the first frequency and the second frequency is measured and used to generate an image or adjust the DC component.
    • 公开了一种扫描探针系统及其使用方法。 该系统包括与样品相互作用的探针。 使探针以探针的第一频率振动。 产生指示探针的振荡幅度的探针偏转信号,并用于设定z位置探针位置,以将探测偏转信号的特性保持在第一频率处于预定值。 在样本和探针之间施加具有DC和AC分量的探针信号。 测量在第一频率和第二频率的混合频率处的偏转信号的频率分量的振幅,并用于产生图像或调整DC分量。
    • 10. 发明申请
    • High Resolution Surface Potential Microscope
    • 高分辨率表面电位显微镜
    • US20100005868A1
    • 2010-01-14
    • US12172640
    • 2008-07-14
    • John D. AlexanderSergei Magonov
    • John D. AlexanderSergei Magonov
    • G01B5/28
    • G01Q60/30
    • A scanning probe system and method for using the same are disclosed. The system includes a probe that interacts with a specimen. The probe is caused to vibrate at a first frequency of the probe. A probe deflection signal indicative of an oscillation amplitude of the probe is generated and used to set the z-position probe position to maintain a property of the probe deflection signal at the first frequency at a predetermined value. A probe signal, having a DC and an AC component is applied between the specimen and the probe. The amplitude of a frequency component of the deflection signal at a mixing frequency of the first frequency and the second frequency is measured and used to generate an image or adjust the DC component.
    • 公开了一种扫描探针系统及其使用方法。 该系统包括与样品相互作用的探针。 使探针以探针的第一频率振动。 产生指示探针的振荡幅度的探针偏转信号,并用于设定z位置探针位置,以将探测偏转信号的特性保持在第一频率处于预定值。 在样本和探针之间施加具有DC和AC分量的探针信号。 测量在第一频率和第二频率的混合频率处的偏转信号的频率分量的振幅,并用于产生图像或调整DC分量。