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    • 8. 发明授权
    • Clock generation circuit for analog value memory circuit
    • 模拟值存储电路的时钟发生电路
    • US5999462A
    • 1999-12-07
    • US205200
    • 1998-12-04
    • Masayuki KatakuraMasashi Takeda
    • Masayuki KatakuraMasashi Takeda
    • G11C7/22G11C27/04G11C7/00
    • G11C7/222G11C27/04G11C7/22
    • An analog delay circuit which includes an analog memory circuit wherein a plurality of memory cells each including a memory capacitor and a selection switch for the memory capacitor are arranged in a matrix includes row switches provided for the individual columns for individually being driven by row selection signals. A same clock signal from a clock generation circuit is supplied commonly to an X direction scanning circuit and a Y direction scanning circuit. The number of stages of registers of the X direction scanning circuit and the number of stages of registers of the Y direction scanning circuit are set so that they have no common divisor other than 1. Consequently, when the memory cells are to be selectively scanned, a same selection condition can be provided to all of the memory cells without relying upon the positions of the memory cells, and the parasitic capacitance connected to a signal write/read terminal is reduced.
    • 一种包括模拟存储电路的模拟延迟电路,其中包括存储电容器和用于存储电容器的选择开关的多个存储单元被布置成矩阵,包括为各个列提供的行开关,用于单独由行选择信号驱动 。 来自时钟发生电路的相同时钟信号被共同地提供给X方向扫描电路和Y方向扫描电路。 将X方向扫描电路的寄存器的级数和Y方向扫描电路的寄存器的级数设置为除了1以外没有公共除数。因此,当要选择性地扫描存储器单元时, 可以在不依赖于存储单元的位置的情况下向所有存储单元提供相同的选择条件,并且减少连接到信号写/读终端的寄生电容。