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61. 发明授权

US5503010A Directional atomic force microscope and method of observing a sample with the microscope 失效
标题翻译：定向原子力显微镜和用显微镜观察样品的方法
公开(公告)号：US5503010A
公开(公告)日：1996-04-02
申请号：US338179
申请日：1994-11-09
申请人： Kazushi Yamanaka
发明人： Kazushi Yamanaka
IPC分类号： G01B21/30 , G01B5/28 , G01N37/00 , G01Q10/06 , G01Q30/04 , G01Q60/24 , G01Q60/26 , G01Q60/28 , G01Q60/32 , G01Q60/34 , H01J37/28
CPC分类号： G01Q60/32 , B82Y35/00 , G01Q60/26 , Y10S977/851 , Y10S977/852
摘要： An atomic force microscope includes a vibrator which imparts vibration between a probe and a sample such that a relative vertical vibration and a relative lateral vibration are superimposed. A method of observing a sample with the microscope includes the steps of imparting phase-controlled vertical and lateral vibration between a sample and a probe so that the probe moves along a straight line or a ring relative to the sample, controlling the direction of the straight line or the ring, and measuring the amplitude and/or the phase of the bending vibration and/or the torsional vibration of a cantilever excited by the vibration.
摘要翻译：原子力显微镜包括振动器，其在探针和样品之间施加振动，使得叠加相对垂直振动和相对横向振动。用显微镜观察样品的方法包括以下步骤：在样品和探针之间施加相位控制的垂直和横向振动，使得探针相对于样品沿着直线或环移动，控制直线的方向线或环，并且测量由振动激励的悬臂的弯曲振动和/或扭转振动的振幅和/或相位。

62. 发明授权

US5502710A Recording bit extraction by calculating curvature of pixels in scanning probe microscope 失效
标题翻译：通过计算扫描探针显微镜中像素的曲率来记录位提取
公开(公告)号：US5502710A
公开(公告)日：1996-03-26
申请号：US207064
申请日：1994-03-08
申请人： Teruyoshi Washizawa , Katsunori Hatanaka , Kunihiro Sakai , Takahiro Oguchi , Akihiko Yamano , Shunichi Shido
发明人： Teruyoshi Washizawa , Katsunori Hatanaka , Kunihiro Sakai , Takahiro Oguchi , Akihiko Yamano , Shunichi Shido
IPC分类号： G01Q30/04 , G06T5/20 , G11B9/00
CPC分类号： G06T5/20 , Y10S977/85
摘要： An image information processing apparatus for processing image information includes a total curvature calculating unit, mean curvature calculating unit, a logical product computing unit and a median filter. A total curvature at each pixel of the image information is calculated by the total curvature calculating unit. A mean curvature at each pixel of the image information is calculated by the mean curvature calculating unit. The logical product computing unit executes computation of a logical product of outputs from the total curvature calculating unit and the mean curvature calculating unit. An output from the logical product computing unit is filtered by the median filter.
摘要翻译：用于处理图像信息的图像信息处理装置包括总曲率计算单元，平均曲率计算单元，逻辑积计算单元和中值滤波器。通过总曲率计算单元计算图像信息的每个像素处的总曲率。通过平均曲率计算单元计算图像信息的每个像素处的平均曲率。逻辑积计算单元执行来自总曲率计算单元和平均曲率计算单元的输出的逻辑积的计算。来自逻辑积计算单元的输出由中值滤波器滤波。

63. 发明授权

US5481908A Resonance contact scanning force microscope 失效
标题翻译：共振接触扫描力显微镜
公开(公告)号：US5481908A
公开(公告)日：1996-01-09
申请号：US55236
申请日：1993-04-28
申请人： Ronald C. Gamble
发明人： Ronald C. Gamble
IPC分类号： G01Q30/04 , G01B11/24 , G01Q20/00
CPC分类号： G01Q60/34 , B82Y35/00 , G01Q20/02 , Y10S977/851
摘要： The resonance contact scanning force microscope includes a reflective cantilever arm which is oscillated at a high harmonic of the resonance frequency of the cantilever arm, while the probe tip is maintained in substantially constant contact with the surface of the specimen. The motion of the free end of the cantilever arm is measured, to generate a deflection signal indicative of the amount of actual deflection of the probe tip. The method and apparatus permit high speed scans and real time imaging of the surface of a specimen with a substantial reduction in noise normally arising due to tip-surface interaction and acoustic noise.
摘要翻译：共振接触扫描力显微镜包括以悬臂的谐振频率的高谐波振荡的反射悬臂，同时探针头保持与试样的表面基本恒定接触。测量悬臂的自由端的运动，以产生指示探针尖端的实际偏转量的偏转信号。该方法和装置允许通过尖端表面相互作用和声学噪声通常产生的噪声的显着降低来高速扫描和样品表面的实时成像。

64. 发明授权

US5468959A Scanning probe microscope and method for measuring surfaces by using this microscope 失效
标题翻译：扫描探针显微镜和使用该显微镜测量表面的方法
公开(公告)号：US5468959A
公开(公告)日：1995-11-21
申请号：US210397
申请日：1994-03-18
申请人： Takao Tohda , Hiroyuki Kado , Shinichi Yamamoto
发明人： Takao Tohda , Hiroyuki Kado , Shinichi Yamamoto
IPC分类号： G01B5/28 , G01B7/34 , G01B21/30 , G01N27/00 , G01N37/00 , G01Q10/04 , G01Q20/02 , G01Q30/02 , G01Q30/04 , G01Q60/04 , G01Q60/10 , G01Q60/24 , G11B9/14 , H01J37/28
CPC分类号： G01Q10/06 , B82Y35/00 , G01Q60/04 , Y10S977/851
摘要： A microscope comprises a cantilever having a distal end equipped with an electrically conductive probe allowing current to flow and having a fine tip whose voltage is controllable, a position control mechanism for controlling position of a sample with respect to a base end of the cantilever, a small displacement measuring mechanism for measuring a deflection amount of the cantilever, and a deflection control mechanism for controlling deflection of the cantilever so as to adjust a distance between the fine tip of the probe and the sample. A method for measuring surfaces using this novel microscope comprises steps of: maintaining deflection of the cantilever at a constant value by using the small displacement measuring mechanism and the deflection control mechanism; applying a constant voltage between the electrically conductive probe and the sample; scanning the sample along surface of the sample with the probe, while a tunneling current is maintained at a constant value by using the position control mechanism; and measuring a control amount of the position control mechanism in a direction vertical to the sample and a control amount of the deflection control mechanism.
摘要翻译：显微镜包括具有远端的悬臂，其具有允许电流流动并具有可控电压的细尖端的导电探针，用于控制样品相对于悬臂的基端的位置的位置控制机构，用于测量悬臂的偏转量的小位移测量机构，以及用于控制悬臂的偏转的偏转控制机构，以调节探针的细尖端与样品之间的距离。使用这种新型显微镜测量表面的方法包括以下步骤：通过使用小位移测量机构和偏转控制机构来将悬臂的偏转维持在恒定值; 在导电探针和样品之间施加恒定电压; 用探头沿着样品的表面扫描样品，同时通过使用位置控制机构将隧道电流维持在恒定值; 并且在垂直于样品的方向和偏转控制机构的控制量中测量位置控制机构的控制量。

65. 发明授权

US5463221A Electron beam measuring apparatus 失效
标题翻译：电子束测量装置
公开(公告)号：US5463221A
公开(公告)日：1995-10-31
申请号：US216288
申请日：1994-03-23
申请人： Tadashi Otaka , Hiroyoshi Mori , Hideo Todokoro
发明人： Tadashi Otaka , Hiroyoshi Mori , Hideo Todokoro
IPC分类号： G01B11/02 , G01B11/24 , G01B15/00 , G01Q30/02 , G01Q30/04 , G06T7/60 , H01J37/28
CPC分类号： G01B15/00
摘要： When an image display unit displays a magnified image of an object being examined, a measuring unit automatically computes the dimensions of the image at the preset position. A tolerance range setting unit has been supplied with an upper and a lower limit value according to which it can judge the dimensions of the object at the preset position to be normal, whereas a comparison-decision unit decides that the dimensions thus computed are held between the upper and lower limit values. When the measured result is found outside the range of upper to lower limit values, the right-or-wrong decision data is stored in a memory and is redisplayed in the form of an image by the image display unit at proper timing.
摘要翻译：当图像显示单元显示被检查物体的放大图像时，测量单元自动计算预设位置处的图像的尺寸。已经提供了公差范围设定单元，其具有上限值和下限值，根据该上限值和下限值，其可以将预设位置处的对象的尺寸判断为正常，而比较判定单元判定如此计算的尺寸保持在上下限值。当测量结果被发现在上下限范围之外时，将错误的判定数据存储在存储器中，并且在适当的定时由图像显示单元以图像形式重新显示。

66. 发明授权

US5396453A Recording/reproducing apparatus such as a memory apparatus 失效
标题翻译：诸如存储装置的记录/再现装置
公开(公告)号：US5396453A
公开(公告)日：1995-03-07
申请号：US272373
申请日：1994-07-06
申请人： Haruki Kawada , Toshihiko Miyazaki , Hideyuki Kawagishi , Akihiko Yamano
发明人： Haruki Kawada , Toshihiko Miyazaki , Hideyuki Kawagishi , Akihiko Yamano
IPC分类号： G01Q30/04 , G11B9/00 , G11B9/14 , G11B25/04
CPC分类号： G11B25/04 , G11B9/14 , G11B9/1418 , G11B9/1454 , B82Y10/00 , Y10S977/861 , Y10S977/869 , Y10S977/874 , Y10S977/943 , Y10S977/947
摘要： A memory apparatus for effecting the writing or reading of information on a recording medium by a probe has a base having the probe attached thereto, a substrate supporting the recording medium thereon and movable relative to the base, and a frame containing the base and the substrate therein, and the coefficients of linear expansion of the base and the substrate are made approximate to each other since the coefficients of linear expansion of the base and the substrate are approximate to each other, any relative positional deviation between the probe and the recording medium will not occur even if temperature changes.
摘要翻译：用于通过探头进行记录介质上的信息的写入或读取的存储装置具有安装有探针的底座，支撑其上的记录介质并能相对于基座移动的基板，以及容纳基座和基板的框架并且基底和基板的线性膨胀系数彼此相近，因为基底和基底的线性膨胀系数彼此接近，探针和记录介质之间的任何相对位置偏差将即使温度变化也不会发生。

67. 发明授权

US5378983A Scanning tunneling potentio-spectroscopic microscope and a data detecting method 失效
标题翻译：扫描隧道电位显微镜和数据检测方法
公开(公告)号：US5378983A
公开(公告)日：1995-01-03
申请号：US977572
申请日：1992-11-17
申请人： Akira Yagi , Takao Okada , Seizo Morita , Nobuo Mikoshiba
发明人： Akira Yagi , Takao Okada , Seizo Morita , Nobuo Mikoshiba
IPC分类号： G01Q60/12 , G01B7/34 , G01Q30/04 , G01Q60/14 , G01K1/16
CPC分类号： G01Q60/12 , B82Y35/00 , G01B7/34 , G01Q30/04 , G01Q60/14 , Y10S977/852
摘要： A scanning tunneling potentio-spectroscopic microscope, includes a conductive probe and a circuit for selectively applying one of first, second and third bias voltages to a sample. A tunnel current flowing between the probe and sample is detected, and a tunnel current signal is produced upon detection thereof. A servo circuit controls a distance between the probe and sample on the basis of the tunnel current signal by producing a servo signal as a feedback signal. A hold circuit switches the servo circuit between operating and non-operating states. Configuration data on a surface of the sample is obtained, on the basis of the servo signal, with the first bias voltage applied to the sample and with the servo circuit in the operating state. A first dependence of the tunnel current on the bias voltage is obtained, from the tunnel current signal and the second bias voltage, with the second bias voltage applied to the sample and with the servo circuit in the non-operating state. A second dependence of the tunnel current on the bias voltage is obtained from the tunnel current signal and the third bias voltage, with the third bias voltage applied to the sample and with the servo circuit in the non-operating state. Electron state data is obtained on the basis of the first dependence, and potential data is obtained on the basis of the first and second dependencies.
摘要翻译：扫描隧道电位分光显微镜包括导电探针和用于选择性地将一个第一，第二和第三偏置电压施加到样品的电路。检测在探针和样品之间流动的隧道电流，并且在检测到隧道电流信号时产生隧道电流信号。伺服电路通过产生伺服信号作为反馈信号，根据隧道电流信号来控制探头和样品之间的距离。保持电路在操作状态和非工作状态之间切换伺服电路。基于伺服信号获得样品表面上的配置数据，其中施加到样品的第一偏置电压和处于操作状态的伺服电路。从隧道电流信号和第二偏置电压获得隧道电流对偏置电压的第一依赖性，其中第二偏置电压施加到样品并且伺服电路处于非操作状态。从隧道电流信号和第三偏置电压获得隧道电流对偏置电压的第二依赖性，其中第三偏压施加到样品并且伺服电路处于非操作状态。基于第一依赖性获得电子状态数据，并且基于第一和第二依赖性获得潜在数据。

68. 发明授权

US5349735A Information detection apparatus and displacement information measurement apparatus 失效
标题翻译：信息检测装置和位移信息测量装置
公开(公告)号：US5349735A
公开(公告)日：1994-09-27
申请号：US132161
申请日：1993-10-05
申请人： Toshimitsu Kawase , Akihiko Yamano , Ryo Kuroda , Hiroyasu Nose , Toshihiko Miyazaki
发明人： Toshimitsu Kawase , Akihiko Yamano , Ryo Kuroda , Hiroyasu Nose , Toshihiko Miyazaki
IPC分类号： G01B7/00 , G01B7/34 , G01D5/244 , G01D5/245 , G01N27/00 , G01Q10/04 , G01Q30/04 , G01Q30/06 , G01Q60/00 , G01Q60/10 , G01Q70/00 , G01Q80/00 , G11B9/00 , H01J37/00
CPC分类号： G01B7/003 , G11B9/14 , G11B9/1409 , B82Y10/00 , G01Q70/06 , G01Q80/00 , Y10S977/874 , Y10T29/49764 , Y10T29/49771
摘要： An information detection apparatus is disclosed. A plurality of probes are arranged in the apparatus so as to face a medium which carries an information, Each of the plurality of probes produces a detection signal from the medium. A performance testing device is provided in the apparatus for testing the performance of each of the plurality of probes. A detection device in the apparatus selects the signal from at least one normal probe on the basis of the test result of the testing device and detects the information in accordance with the selected signal. By such the construction in the apparatus, the detection of the information can be continuously effected even if one of the probes is broken.
摘要翻译：公开了一种信息检测装置。多个探针被布置在装置中以便面向携带信息的介质。多个探针中的每个探针从介质产生检测信号。在用于测试多个探针中的每一个的性能的装置中提供性能测试装置。该装置中的检测装置基于测试装置的测试结果从至少一个正常探针中选择信号，并根据所选择的信号检测信息。通过这样的装置的结构，即使其中一个探针被破坏，也可以连续地进行信息的检测。

69. 再颁专利

USRE34708E Scanning ion conductance microscope 失效
标题翻译：扫描离子电导显微镜
公开(公告)号：USRE34708E
公开(公告)日：1994-08-30
申请号：US875441
申请日：1992-04-29
申请人： Paul K. Hansma , Barney Drake
发明人： Paul K. Hansma , Barney Drake
IPC分类号： G01N27/416 , G01N27/49 , G01Q10/06 , G01Q20/00 , G01Q30/04 , G01Q30/20 , G01Q60/44 , G21K5/08
CPC分类号： G01Q60/44 , B82Y35/00 , G01Q70/06 , Y10S977/852 , Y10S977/86
摘要： A scanning ion conductance microscope, SICM, which can image the topography of soft non-conducting surfaces covered with electrolytes by maintaining a micropipette probe at a constant conductance distance from the surface. It can also sample and image the local ion currents above the surfaces by scanning the micropipette probe in a plane located at a constant distance above the surface. Multiple micropipettes mounted in a multi-barrel head and containing various ion specific electrodes allow simultaneous scanning for different ion currents.
摘要翻译：扫描离子电导显微镜SICM，其可以通过将微量吸管探针保持在与表面恒定的电导距离，来对覆盖有电解质的软非导电表面的形貌进行成像。它也可以通过在位于表面上方恒定距离的平面上扫描微量移液管探针来对表面上的局部离子流进行采样和成像。安装在多枪管头并包含各种离子特定电极的多个微量移液器允许同时扫描不同的离子电流。

70. 发明授权

US5329122A Information processing apparatus and scanning tunnel microscope 失效
标题翻译：信息处理设备和扫描隧道显微镜
公开(公告)号：US5329122A
公开(公告)日：1994-07-12
申请号：US935399
申请日：1992-08-26
申请人： Kunihiro Sakai , Katsunori Hatanaka , Takahiro Oguchi , Akihiko Yamano , Shunichi Shido
发明人： Kunihiro Sakai , Katsunori Hatanaka , Takahiro Oguchi , Akihiko Yamano , Shunichi Shido
IPC分类号： G01Q30/04 , G01N27/00 , G01Q10/06 , G01Q60/16 , G01Q80/00 , G11B3/00 , G11B9/00 , H01J37/26
CPC分类号： G01Q10/065 , B82Y35/00 , G01Q60/16 , G01Q70/06 , G11B9/14 , G11B9/1427 , B82Y10/00 , G01Q80/00
摘要： An information processing apparatus for effecting recording of information on and/or reproduction of information from a recording medium is provided with a probe electrode, a cantilever piezo-electric member, a controller and a detector. The probe electrode is relatively displaced to the recording medium by the cantilever piezo-electric member. The controller applies a control signal to the cantilever piezo-electric member to control the cantilever piezo-electric member. The detector detects a minute signal obtained on the tunnel effect caused between the probe electrode and the recording medium. A switch element is further provided on the apparatus so as to electrically disconnect between the cantilever piezo-electric member and the controller during the minute signal being detected by the detector.
摘要翻译：用于对来自记录介质的信息进行信息记录和/或再现的信息处理设备设置有探针电极，悬臂压电构件，控制器和检测器。探针电极通过悬臂压电部件相对于记录介质移位。控制器向悬臂压电构件施加控制信号以控制悬臂压电构件。检测器检测在探针电极和记录介质之间引起的隧道效应上获得的微小信号。在设备上进一步设置开关元件，以便在由检测器检测的微小信号期间，在悬臂压电部件与控制器之间电断开。

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