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1. 发明申请

US20220260612A1 PHASE-SHIFT-BASED AMPLITUDE DETECTOR FOR A HIGH-SPEED ATOMIC FORCE MICROSCOPE 有权
公开(公告)号：US20220260612A1
公开(公告)日：2022-08-18
申请号：US17666132
申请日：2022-02-07
申请人： Cornell University
发明人： Atsushi Miyagi , Simon Scheuring
IPC分类号： G01Q60/34 , G01Q10/06
摘要： An atomic force microscope includes a cantilever operating in amplitude modulation mode. A controller determines the amplitude of the cantilever oscillation by processing a signal representative of the cantilever motion by square-rooting a signal having a value substantially equal to a sum of a square of the received signal and a squared and phase-shifted version of the received signal. The aforementioned processing, in some implementations is implemented using analog circuit components.

2. 发明申请

US20170199219A1 HIGH SPEED ADAPTIVE-MULTI-LOOP MODE IMAGING ATOMIC FORCE MICROSCOPY 审中-公开
公开(公告)号：US20170199219A1
公开(公告)日：2017-07-13
申请号：US15326237
申请日：2015-07-14
申请人： Rutgers, The State University of New Jersey
发明人： Qingze Zou , Juan Ren , Jiangbo Liu
IPC分类号： G01Q10/06 , G01Q60/34
CPC分类号： G01Q10/065 , G01Q60/34
摘要： A method for imaging a sample using a high speed dynamic mode atomic force microscope may include scanning a tip of a cantilever probe over a surface of the sample, regulating a vibration amplitude of the tip to remain constant at a set point value (Aset), via a first signal generated in a first feedback controller, measuring a mean tapping deflection of the tip, regulating the mean tapping deflection via a second signal generated in a second feedback controller, tracking and measuring an adjustment to the measured mean tapping deflection during the regulating. The method may further include generating an image topography of the sample based on the first signal, the second signal, and the measured adjustment of the mean tapping deflection of the cantilever probe.

3. 发明申请

US20160178659A1 Method and Apparatus of Electrical Property Measurement Using an AFM Operating in Peak Force Tapping Mode 有权
公开(公告)号：US20160178659A1
公开(公告)日：2016-06-23
申请号：US14970237
申请日：2015-12-15
申请人： Bruker Nano, Inc.
发明人： Chunzeng Li , Yan Hu , Ji Ma , Jianli He , Lin Huang , Stephen C. Minne , Henry Mittel , Weijie Wang , Shuiqing Hu , Chanmin Su
IPC分类号： G01Q60/34
CPC分类号： G01Q20/00 , B82Y35/00 , G01Q10/065 , G01Q20/02 , G01Q60/24 , G01Q60/30 , G01Q60/32 , G01Q60/34
摘要： An apparatus and method of collecting topography, mechanical property data and electrical property data with an atomic force microscope (AFM) in either a single pass or a dual pass operation. PFT mode is preferably employed thus allowing the use of a wide range of probes, one benefit of which is to enhance the sensitivity of electrical property measurement.

4. 发明授权

US09116167B2 Method and apparatus of tuning a scanning probe microscope 有权
标题翻译：调整扫描探针显微镜的方法和装置
公开(公告)号：US09116167B2
公开(公告)日：2015-08-25
申请号：US14675140
申请日：2015-03-31
申请人： Bruker Nano, Inc.
发明人： Chanmin Su , Paul Silva , Lin Huang , Bede Pittenger , Shuiqing Hu
IPC分类号： G01Q30/04 , G01Q60/34
CPC分类号： G01Q30/04 , B82Y35/00 , G01Q30/00 , G01Q40/00 , G01Q60/24 , G01Q60/34
摘要： An apparatus and method of automatically determining an operating frequency of a scanning probe microscope such as an atomic force microscope (AFM) is shown. The operating frequency is not selected based on a peak of the amplitude response of the probe when swept over a range of frequencies; rather, the operating frequency is selected using only peak data corresponding to a TIDPS curve.
摘要翻译：示出了自动确定诸如原子力显微镜（AFM）的扫描探针显微镜的操作频率的装置和方法。基于在扫描频率范围时探头的振幅响应的峰值，不选择工作频率; 而是仅使用对应于TIDPS曲线的峰值数据来选择工作频率。

5. 发明授权

US08923595B2 Method of identification of cancerous and normal cells 有权
标题翻译：鉴定癌细胞和正常细胞的方法
公开(公告)号：US08923595B2
公开(公告)日：2014-12-30
申请号：US13013209
申请日：2011-01-25
申请人： Igor Sokolov , Maxim Dokukin
发明人： Igor Sokolov , Maxim Dokukin
IPC分类号： G06K9/00 , G01Q60/24 , G01Q60/28 , G01Q60/34 , G01Q30/04 , B82Y35/00
CPC分类号： G06K9/00127 , B82Y35/00 , G01Q30/04
摘要： A method is described for distinguishing between cancerous and normal human cells. The method includes collecting cells; preparing cells for scanning; scanning of the prepared cells by means of atomic force microscopy; processing of the obtained images through specific algorithms; wherein the algorithms allowing one to identify whether the cell is cancerous or normal.
摘要翻译：描述了用于区分癌细胞和正常人细胞的方法。该方法包括收集细胞; 准备细胞进行扫描; 通过原子力显微镜扫描制备的细胞; 通过特定算法处理所获得的图像; 其中所述算法允许人们识别细胞是癌细胞还是正常细胞。

6. 发明授权

US08763160B2 Measurement of the surface potential of a material 有权
标题翻译：测量材料的表面电位
公开(公告)号：US08763160B2
公开(公告)日：2014-06-24
申请号：US13576381
申请日：2011-02-09
申请人： Thierry Melin , Didier Theron , Sophie Barbet , Dominique Deresmes , Heinrich Diesinger
发明人： Thierry Melin , Didier Theron , Sophie Barbet , Dominique Deresmes , Heinrich Diesinger
IPC分类号： G01Q10/06 , G01Q60/02 , G01Q60/24 , G01Q60/34
CPC分类号： G01Q10/06 , G01Q60/02 , G01Q60/24 , G01Q60/30 , G01Q60/34 , G01Q60/40
摘要： During a measurement in KFM mode of the surface potential of a material (P), a detection point (1) is arranged above a surface (S) of the material. Two piezoelectric actuators (2, 5) are used to monitor a mean distance of the detection point relative to the surface of the material and a mechanical oscillation of said point. During the measurement, a control voltage is applied between control electrodes (2a, 2b) of the piezoelectric actuator (2) which is dedicated to the mechanical oscillation of the detection point (1), said control voltage not having an alternative component to an angular frequency of electrical energization of said detection point. A result of the KFM measurement is therefore separate from operating parameters such as a projection angle used to perform closed-loop control and a value of the angular frequency of electrical energization. The invention thus provides absolute measurements of surface potentials.
摘要翻译：在用KFM模式测量材料（P）的表面电位时，检测点（1）设置在材料的表面（S）的上方。两个压电致动器（2,5）用于监测检测点相对于材料表面的平均距离和所述点的机械振荡。在测量期间，在专用于检测点（1）的机械振荡的压电致动器（2）的控制电极（2a，2b）之间施加控制电压，所述控制电压不具有与角度所述检测点的电通电频率。因此，KFM测量的结果与操作参数分离，例如用于执行闭环控制的投影角和电激励角频率的值。因此，本发明提供了表面电位的绝对测量。

7. 发明授权

US07954165B2 Scanning probe microscope 有权
标题翻译：扫描探针显微镜
公开(公告)号：US07954165B2
公开(公告)日：2011-05-31
申请号：US12095953
申请日：2006-10-12
申请人： Toshio Ando , Mitsuru Sakashita , Takayuki Uchihashi
发明人： Toshio Ando , Mitsuru Sakashita , Takayuki Uchihashi
IPC分类号： G01Q10/06 , G01Q60/34
CPC分类号： G01Q60/32 , G01Q10/065 , Y10S977/851
摘要： A scanning probe microscope is provided, which can be stably used for a long time even if excitation efficiency varies during scan. A cantilever (5) is excited, and the cantilever (5) and a sample are subjected to relative scanning. A second-harmonic component detection circuit (31) detects second-harmonic component amplitude of oscillation of the cantilever (5) as integral-multiple component amplitude. The second-harmonic component amplitude is amplitude of a second-harmonic component having a frequency twice as high as excitation frequency. An excitation intensity adjustment circuit (33) controls excitation intensity based on the detected second-harmonic component amplitude such that the second-harmonic component amplitude is kept constant.
摘要翻译：提供扫描探针显微镜，其即使在扫描期间激发效率变化也可以长时间稳定使用。悬臂（5）被激发，并且悬臂（5）和样品进行相对扫描。二次谐波分量检测电路（31）将悬臂（5）的振荡的二次谐波分量振幅检测为积分 - 多分量振幅。二次谐波分量幅度是具有激励频率的两倍的频率的二次谐波分量的振幅。励磁强度调节电路（33）基于所检测到的二次谐波分量振幅来控制激励强度，使得二次谐波分量振幅保持恒定。

8. 发明申请

US20050241392A1 Atomic force microscope tip holder for imaging in liquid 审中-公开
标题翻译：用于在液体中成像的原子力显微镜尖头支架
公开(公告)号：US20050241392A1
公开(公告)日：2005-11-03
申请号：US11077525
申请日：2005-03-09
申请人： Yuri Lyubchenko
发明人： Yuri Lyubchenko
IPC分类号： G01L19/14 , G01Q30/08 , G01Q30/12 , G01Q60/32 , G01Q60/34 , G01Q60/38
CPC分类号： G01Q60/38 , G01Q30/14 , G01Q60/34
摘要： An atomic force microscope (ARM) tip holder includes a vessel open at the bottom with gas-tight walls and top. A piezoelectrically activated cantilever vibratory tip holder is secured at one end within the vessel and extends to a tip-holding end at a location proximate a liquid level established when the vessel is placed open end downward in a liquid trapping air or gas. Only a small portion of the tip extends into the liquid to contact the specimen for examination by e.g. “tapping mode” AFM. Presence of the cantilever and part of the tip in gas virtually eliminates the loss of performance encountered with liquid submersion.
摘要翻译：原子力显微镜（ARM）尖端保持器包括在底部开口的容器，其具有气密的壁和顶部。压电激活的悬臂振动尖端保持器固定在容器内的一端，并且在容器在液体捕获空气或气体中向下放置开放端时建立的接近液位的位置延伸到尖端保持端。只有一小部分尖端延伸到液体中以接触样品以进行检查。 “敲击模式”AFM。气体的悬臂和尖端部分的存在实际上消除了液体浸没所遇到的性能损失。

9. 发明申请

US20050140387A1 Probe device and method of controlling the same 有权
标题翻译：探头装置及其控制方法
公开(公告)号：US20050140387A1
公开(公告)日：2005-06-30
申请号：US11065025
申请日：2005-02-25
申请人： Takuya Matsumoto , Yoichi Otsuka , Yasuhisa Naitoh , Tomoji Kawai
发明人： Takuya Matsumoto , Yoichi Otsuka , Yasuhisa Naitoh , Tomoji Kawai
IPC分类号： G01Q60/00 , G01Q60/34 , G01Q60/38 , G01Q60/40 , G01R31/02
CPC分类号： G01Q60/34
摘要： A probe device comprises a cantilever comprising a probe allocated to be opposed to a surface of a sample, and means for carrying out measurement of the sample while switching at a predetermined period two operating modes, a tapping mode for measuring a surface structure of the sample while vibrating the cantilever and a point contact mode for measuring an electrical characteristic of the sample while bringing the probe into contact with the sample.
摘要翻译：探针装置包括悬臂，其包括被分配为与样品的表面相对的探针，以及用于在以预定周期切换两个操作模式时进行样品的测量的装置，用于测量样品的表面结构的攻丝模式同时振动悬臂和点接触模式，用于测量样品的电特性，同时使探针与样品接触。

10. 发明授权

US06897015B2 Device and method of use for detection and characterization of pathogens and biological materials 失效
标题翻译：用于检测和表征病原体和生物材料的装置和方法
公开(公告)号：US06897015B2
公开(公告)日：2005-05-24
申请号：US10160372
申请日：2002-05-30
申请人： Eric R. Henderson , Saju R. Nettikadan , Curtis L. Mosher
发明人： Eric R. Henderson , Saju R. Nettikadan , Curtis L. Mosher
IPC分类号： B05D3/00 , C12Q1/02 , C12Q1/68 , C12Q1/70 , G01N33/552 , G01N33/553 , G01N33/554 , G01N33/569 , G01Q10/00 , G01Q30/20 , G01Q60/34 , G02B26/10
CPC分类号： G01N33/553 , G01N33/56983 , G01N2333/07 , Y10S977/853
摘要： The present invention includes a method and apparatus for the detection of a target material. The method and apparatus includes providing a substrate with a surface and forming a domains of deposited materials thereon. The deposited material can be placed on the surface and bound directly and non-specifically to the surface, or it may be specifically or non-specifically bound to the surface. The deposited material has an affinity for a specific target material. The domains thus created are termed affinity domains or deposition domains. Multiple affinity domains of deposited materials can be deposited on a single surface, creating a plurality of specific binding affinity domains for a plurality of target materials. Target materials may include, for example, pathogens or pathogenic markers such as viruses, bacteria, bacterial spores, parasites, prions, fungi, mold or pollen spores. The device thus created is incubated with a test solution, gas or other supporting environment suspected of containing one or more of the target materials. Specific binding interactions between the target materials and a particular affinity domain occurs and is detected by various methods.
摘要翻译：本发明包括用于检测目标材料的方法和装置。该方法和装置包括提供具有表面的基底并在其上形成沉积材料的区域。沉积的材料可以放置在表面上并且非特异性地结合到表面上，或者可以特异性地或非特异性地结合到表面上。沉积材料对特定靶材料具有亲和力。由此产生的结构域称为亲和结构域或沉积域。沉积材料的多个亲和性结构域可以沉积在单个表面上，为多个目标材料产生多个特异性结合亲和结构域。靶物质可包括例如病原体或致病性标志物，例如病毒，细菌，细菌孢子，寄生虫，朊病毒，真菌，霉菌或花粉孢子。将如此产生的装置与怀疑含有一种或多种目标材料的测试溶液，气体或其它支持环境一起温育。目标材料与特定亲和力域之间的特异性结合相互作用发生并通过各种方法检测。

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