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    • 7. 发明授权
    • Method and apparatus for determination of source polarization matrix
    • 用于确定源极化矩阵的方法和装置
    • US07697138B2
    • 2010-04-13
    • US11336532
    • 2006-01-19
    • Adlai H. SmithRobert O. Hunter, Jr.
    • Adlai H. SmithRobert O. Hunter, Jr.
    • G01J4/00
    • G03F7/70566G01J4/04G01N21/21G03F7/70591
    • A method and apparatus for resolving both the angular (nx,ny) and spatial (x,y) dependence of the effective source coherence matrix for lithographic steppers and scanners is described. First an in-situ source metrology instrument is combined with in-situ polarization elements to create an in-situ source imaging polarizer or ISIP. The ISIP is loaded into a photolithographic exposure tool, aligned, and then exposed onto a suitable recording media or recording sensor. The recording sensor comprising either resist coated wafers or electronic sensors capture the image intensity at a multiplicity of different field points. The resulting measurements are entered into a computer program that reconstructs the source coherence matrix as a function of direction cosine at multiple field points. Alternative ISIP configurations are discussed in some detail. Applications of the ISIP include polarization source mapping for deep-UV and EUV lithography, process optimization, process monitoring, and chip manufacturing.
    • 描述了用于解决用于光刻步进机和扫描仪的有效源相干矩阵的角(nx,ny)和空间(x,y)依赖性的方法和装置。 首先,原位测量仪器与原位偏振元件组合以创建原位成像偏振器或ISIP。 将ISIP装载到光刻曝光工具中,对齐,然后暴露在合适的记录介质或记录传感器上。 包括抗蚀剂涂覆的晶片或电子传感器的记录传感器在多个不同的场点捕获图像强度。 所得到的测量值被输入到在多个场点上重建源相干矩阵作为方向余弦的函数的计算机程序。 备选的ISIP配置将在一些细节中进行讨论。 ISIP的应用包括用于深UV和EUV光刻,工艺优化,过程监控和芯片制造的极化源映射。