会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 5. 发明授权
    • Scanning electron microscope
    • 扫描电子显微镜
    • US07619219B2
    • 2009-11-17
    • US11953496
    • 2007-12-10
    • Naomasa SuzukiHiroyuki ItoIchiro Tachibana
    • Naomasa SuzukiHiroyuki ItoIchiro Tachibana
    • H01J37/28H01J37/256
    • H01J37/141H01J37/28H01J2237/1405H01J2237/141H01J2237/244
    • The present invention was made in view of a problem of an electron microscope in which a reduction in detection efficiency of electrons detected by a detector should be prevented by eliminating any influence of a leakage magnetic field through a gap in an objective lens onto the electrons emitted from a specimen. To solve the problem, the present invention provides an electron microscope having a configuration with: a pole piece electrode for accelerating primary electrons emitted at an electrons source; and an objective lens including the pole piece electrode. In the objective lens, an electrically and magnetically insulated gap is formed between the pole piece electrode and other pole piece, and an auxiliary coil is concentrically disposed with the objective lens at a middle position between the gap and a detection surface of the electron detector, with an electric current flowing through the auxiliary coil in the opposite direction from that of an electric current flowing through the objective lens coil.
    • 本发明考虑到电子显微镜的问题,其中通过消除通过物镜中的间隙的泄漏磁场对发射的电子的任何影响来防止检测器检测到的电子的检测效率的降低 从标本。 为了解决该问题,本发明提供一种具有以下结构的电子显微镜:具有用于加速在电子源发射的一次电子的极片电极; 以及包括极片电极的物镜。 在物镜中,在极片电极和其它极片之间形成电磁绝缘的间隙,并且辅助线圈与物镜同心地设置在间隙和电子检测器的检测表面之间的中间位置, 电流以与流过物镜线圈的电流相反的方向流过辅助线圈。
    • 6. 发明申请
    • Scanning Electron Microscope
    • 扫描电子显微镜
    • US20080135755A1
    • 2008-06-12
    • US11953496
    • 2007-12-10
    • Naomasa SUZUKIHiroyuki ItoIchiro Tachibana
    • Naomasa SUZUKIHiroyuki ItoIchiro Tachibana
    • H01J37/28
    • H01J37/141H01J37/28H01J2237/1405H01J2237/141H01J2237/244
    • The present invention was made in view of a problem of an electron microscope in which a reduction in detection efficiency of electrons detected by a detector should be prevented by eliminating any influence of a leakage magnetic field through a gap in an objective lens onto the electrons emitted from a specimen. To solve the problem, the present invention provides an electron microscope having a configuration with: a pole piece electrode for accelerating primary electrons emitted at an electrons source; and an objective lens including the pole piece electrode. In the objective lens, an electrically and magnetically insulated gap is formed between the pole piece electrode and other pole piece, and an auxiliary coil is concentrically disposed with the objective lens at a middle position between the gap and a detection surface of the electron detector, with an electric current flowing through the auxiliary coil in the opposite direction from that of an electric current flowing through the objective lens coil.
    • 本发明考虑到电子显微镜的问题,其中通过消除通过物镜中的间隙的泄漏磁场对发射的电子的任何影响来防止检测器检测到的电子的检测效率的降低 从标本。 为了解决该问题,本发明提供一种具有以下结构的电子显微镜:具有用于加速在电子源发射的一次电子的极片电极; 以及包括极片电极的物镜。 在物镜中,在极片电极和其它极片之间形成电气且磁绝缘的间隙,并且辅助线圈与物镜同心地设置在间隙和电子检测器的检测表面之间的中间位置, 电流以与流过物镜线圈的电流相反的方向流过辅助线圈。