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    • 3. 发明授权
    • Enhanced stitching by overlap dose and feature reduction
    • 通过重叠剂量和特征降低增强缝合
    • US09460260B2
    • 2016-10-04
    • US14622983
    • 2015-02-16
    • Marco Jan-Jaco Wieland
    • Marco Jan-Jaco Wieland
    • H01L21/263G06F17/50G03F1/78G03F7/20H01J37/317G03B27/42H01J37/302
    • G06F17/5081G03B27/42G03F1/78G03F7/2059G03F7/70475H01J37/3026H01J37/3177H01J2237/31769H01L21/263
    • A method for processing exposure data (40) for exposing a pattern on a target (30) using a plurality of charged particle beams (24), the exposure data comprising pattern data (42) representing one or more features (60) to be written on the target (30) and exposure dose data (52) describing exposure dose of the charged particle beams. The method comprises setting one or more dose values of the exposure dose data (52) such that a sum of dose values corresponding to a position in an overlap area (36) of the target exceeds a maximum dose value for the non-overlap areas (38) of the target where adjacent sub-areas (34) do not overlap, and dividing the pattern data (42) into a plurality of sub-sections (44), each of the sub-sections comprising pattern data describing a part of the pattern to be written in a corresponding sub-area (34) of the target (30), wherein the pattern data (42) comprises overlap pattern data (46) describing a part of the pattern to be written in a corresponding overlap area (36) of the target where adjacent sub-areas (34) overlap, and processing the overlap pattern data (46) to reduce a size of one or more features described by the overlap pattern data.
    • 一种用于处理曝光数据(40)的方法,用于使用多个带电粒子束(24)对目标(30)上的图案进行曝光,所述曝光数据包括表示待写入的一个或多个特征(60)的图案数据(42) (30)和描述带电粒子束的曝光剂量的曝光剂量数据(52)。 该方法包括设置曝光剂量数据(52)的一个或多个剂量值,使得对应于目标重叠区域(36)中的位置的剂量值之和超过非重叠区域的最大剂量值( 38),其中相邻子区域(34)不重叠的目标,并且将模式数据(42)划分为多个子部分(44),每个子部分包括描述部分的图案数据 模式被写入目标(30)的相应子区域(34),其中模式数据(42)包括描述要写入对应重叠区域(36)中的模式的一部分的重叠模式数据(46) ),并且处理重叠图案数据(46)以减小由重叠图案数据描述的一个或多个特征的大小。
    • 6. 发明授权
    • Exposure apparatus, measurement method, stabilization method, and device fabrication method
    • 曝光装置,测量方法,稳定方法和装置制造方法
    • US09229312B2
    • 2016-01-05
    • US13102739
    • 2011-05-06
    • Nobuhiko Yabu
    • Nobuhiko Yabu
    • G03B27/53G03B27/68G03B27/32G03B27/42G03F7/20
    • G03B27/32G03B27/42G03F7/70425G03F7/70941
    • The present invention provides an exposure apparatus including a projection optical system configured to project a reticle pattern onto a wafer, a selector configured to select a dummy wafer to be placed near an image plane of the projection optical system, from a plurality of dummy wafers having the same shape as that of the wafer and different reflectance with each other, a transfer unit configured to place the dummy wafer selected by the selector near the image plane of the projection optical system, and a controller configured to perform control such that dummy exposure is performed by irradiating the dummy wafer, which is placed near the image plane of the projection optical system by the transfer unit, with light via the projection optical system.
    • 本发明提供了一种曝光装置,包括:投影光学系统,其配置为将光罩图案投影到晶片上;选择器,被配置为从多个伪晶片中选择待放置在投影光学系统的像面附近的虚设晶片, 与晶片相同的形状和彼此的反射率不同的传送单元,被配置为将由选择器选择的伪晶片放置在投影光学系统的像面附近的传送单元,以及控制器,被配置为执行控制,使得虚拟曝光是 通过经由投影光学系统的光照射通过转印单元放置在投影光学系统的像面附近的伪晶片。
    • 10. 发明授权
    • System and method for manufacturing three dimensional integrated circuits
    • 制造三维集成电路的系统和方法
    • US09025136B2
    • 2015-05-05
    • US13225404
    • 2011-09-02
    • Jang Fung ChenThomas Laidig
    • Jang Fung ChenThomas Laidig
    • G03B27/44G03F7/20
    • G03B27/42G03F7/70275G03F7/70283G03F7/70291G03F7/70391G03F7/70433G03F7/70475G03F7/70491G03F7/70508
    • System and method for manufacturing three-dimensional integrated circuits are disclosed. In one embodiment, the method includes providing an imaging writer system that includes a plurality of spatial light modulator (SLM) imaging units arranged in one or more parallel arrays, receiving mask data to be written to one or more layers of the three-dimensional integrated circuit, processing the mask data to form a plurality of partitioned mask data patterns corresponding to the one or more layers of the three-dimensional integrated circuit, assigning one or more SLM imaging units to handle each of the partitioned mask data pattern, and controlling the plurality of SLM imaging units to write the plurality of partitioned mask data patterns to the one or more layers of the three-dimensional integrated circuits in parallel. The method of assigning performs at least one of scaling, alignment, inter-ocular displacement, rotational factor, or substrate deformation correction.
    • 公开了用于制造三维集成电路的系统和方法。 在一个实施例中,该方法包括提供一种成像写入器系统,该系统包括布置在一个或多个并行阵列中的多个空间光调制器(SLM)成像单元,接收要写入三维集成的一个或多个层的掩模数据 处理掩模数据以形成与三维集成电路的一层或多层相对应的多个划分的掩模数据模式,分配一个或多个SLM成像单元以处理每个分割的掩模数据模式,并且控制 多个SLM成像单元将多个划分的掩模数据图案并行地写入三维集成电路的一个或多个层。 分配方法执行缩放,对准,眼内位移,旋转因子或基底变形校正中的至少一个。