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91. 发明授权

US4988872A Electron probe microanalyzer having wavelength-dispersive x-ray spectrometer and energy-dispersive x-ray spectrometer 失效
标题翻译：具有波长色散X射线光谱仪和能量色散X射线光谱仪的电子探针微量分析仪
公开(公告)号：US4988872A
公开(公告)日：1991-01-29
申请号：US386416
申请日：1989-07-27
申请人： Yoshitaka Nagatsuka , Masayuki Ohtsuki , Masaki Saito , Koji Yoshida , Kazuyasu Kawabe
发明人： Yoshitaka Nagatsuka , Masayuki Ohtsuki , Masaki Saito , Koji Yoshida , Kazuyasu Kawabe
IPC分类号： G01N23/225 , G01Q30/02 , G01Q30/04 , G01Q60/00
CPC分类号： G01N23/2252
摘要： An electron probe microanalyzer equipped with a wavelength-dispersive x-ray spectrometer and also with an energy-dispersive x-ray spectrometer. X-rays emanating from the same sample region are detected by these two spectrometers, and spectra are created from the detected x-rays. Cursors which can be moved at will are superimposed on the spectra. One of the cursors is moved in relation to the other. That is, when one cursor is moved into the position of a desired wavelength or energy, the other is moved into the position of the corresponding energy or wavelength. The use of the cursors enables one to precisely and easily find the existence of a certain element in the sample region from the spectra obtained by the two x-ray spectrometers.
摘要翻译：配有波长色散X射线光谱仪的电子探针微量分析仪，以及能量色散X射线光谱仪。通过这两个光谱仪检测从相同样品区发出的X射线，并从检测到的X射线产生光谱。可以随意移动的光标叠加在光谱上。其中一个游标相对于另一个移动。也就是说，当一个光标移动到所需波长或能量的位置时，另一个光标移动到相应能量或波长的位置。使用光标使得能够从两个x射线光谱仪获得的光谱中精确和容易地发现样品区域中某一元素的存在。

92. 发明授权

US4985627A Spin-polarized scanning tunneling microscope 失效
标题翻译：自旋极化扫描隧道显微镜
公开(公告)号：US4985627A
公开(公告)日：1991-01-15
申请号：US391908
申请日：1989-08-10
申请人： Santos F. A. Gutierrez , Alexis Baratoff , Wolfgang D. Pohl
发明人： Santos F. A. Gutierrez , Alexis Baratoff , Wolfgang D. Pohl
IPC分类号： G01R33/032 , G01N27/00 , G01N27/72 , G01N37/00 , G01Q10/00 , G01Q30/02 , G01Q60/16 , G01Q60/56 , G01Q70/14 , G01R33/10 , H01J37/26 , H01J37/28
CPC分类号： G01Q60/16 , B82Y35/00 , G01Q60/56 , Y10S977/86 , Y10S977/861
摘要： In a scanning tunneling microscope, the tunnel tip comprises an optically transparent body coated with a semiconductor layer, such as a GaAs layer. A sample being investigated comprises a magnetic material. Tunnel microscope operation permits investigation of the magnetic properties at or near the surface of the sample where a spin-polarized beam of light impinges upon the sample surface, through the transparent body of the tunnel tip, or after traveling through the sample, or when made to impinge upon the surface at an angle of incidence from an axis normal to the sample surface. In addition to conventional scanning tunneling microscope electronics, an oscillator-controlled phase-sensitive detector or gating means and a display unit are provided for direct viewing of the magnetic properties and the topography of the sample.

93. 发明授权

US4958079A Detector for scanning electron microscopy apparatus 失效
标题翻译：扫描电子显微镜检测仪
公开(公告)号：US4958079A
公开(公告)日：1990-09-18
申请号：US313022
申请日：1989-02-21
申请人： John W. Gray
发明人： John W. Gray
IPC分类号： H01J37/26 , G01Q30/02 , H01J37/244
CPC分类号： H01J37/244 , H01J2237/24435 , H01J2237/24475 , H01J2237/2448 , H01J2237/2449 , H01J2237/24507
摘要： Scanning electron microscopy apparatus employing a detector to detect emission of electrons resulting from the impingement of electrons of an electron beam on an object being viewed, the apparatus including an electron beam source providing the electron beam, a magnet providing a magnetic field to direct the electron beam to the object, a first microchannel plate having a first hole through it aligned with the electron beam, a first surface directed toward the electron beam source for receiving low energy electrons that have been emitted from the object and directed through the hole by the magnetic field, a second surface on the opposite side of side first microchannel plate for discharge of multiplied electrons, and a first anode facing the second surface, the first anode being positioned to collect electrons discharged from the second surface.
摘要翻译：扫描电子显微镜装置采用检测器来检测由被观察的物体上的电子束的电子的撞击产生的电子的发射，该装置包括提供电子束的电子束源，提供磁场以引导电子的磁体射束到物体，具有通过其与电子束对准的第一孔的第一微通道板，指向电子束源的第一表面，用于接收已经从物体发射的低能电子，并通过磁性引导通过孔场，第二表面位于侧面第一微通道板的相反侧，用于放电倍增电子;以及第一阳极，面对第二表面，第一阳极被定位成收集从第二表面排出的电子。

94. 发明授权

US4954712A Specimen retaining ring system for an electron microscope 失效
标题翻译：用于电子显微镜的样品保持环系统
公开(公告)号：US4954712A
公开(公告)日：1990-09-04
申请号：US421827
申请日：1989-10-16
申请人： Harry P. Wilcox
发明人： Harry P. Wilcox
IPC分类号： G01Q30/02 , G01Q30/20 , H01J37/20
CPC分类号： H01J37/20
摘要： A movable specimen holder for an electron microscope has a pivotal support block defining a cylindrical counterbore extending from an annular internal shoulder which supports a circular specimen grid. The grid is retained in the counterbore by a resilient split band or ring having an outer cylindrical surface for engaging the counterbore with a friction fit. The ring has a cylindrical inner surface interrupted by an annular recess or groove which is adapted to receive the outwardly projecting feet on the spring legs of a tweezers-like tool. The tool is used to insert the retaining ring into the counterbore adjacent the specimen grid and to remove the ring from the counterbore without losing the ring.
摘要翻译：用于电子显微镜的可移动的样品架具有枢转的支撑块，其限定了从支撑圆形样品网格的环形内部肩部延伸的圆柱形沉孔。格栅通过具有外圆柱形表面的弹性分裂带或环保持在沉孔中，用于与摩擦配合的沉孔接合。环具有由环形凹槽或凹槽中断的圆柱形内表面，该环形凹槽或槽适于将镊子状工具的弹簧腿上的向外突出的脚接收。该工具用于将保持环插入邻近样品网格的沉孔中，并从沉孔中取出环，而不会丢失环。

95. 发明授权

US4935634A Atomic force microscope with optional replaceable fluid cell 失效
标题翻译：原子力显微镜与可选的可更换流体池
公开(公告)号：US4935634A
公开(公告)日：1990-06-19
申请号：US322001
申请日：1989-03-13
申请人： Paul K. Hansma , Barney Drake
发明人： Paul K. Hansma , Barney Drake
IPC分类号： G01B7/34 , B01L7/00 , G01B11/24 , G01B21/30 , G01L5/00 , G01N21/88 , G01N37/00 , G01Q30/02 , G01Q30/14 , G01Q60/00 , G01Q60/24 , G01Q60/38 , G01Q70/02 , G01Q70/04 , H01J37/20
CPC分类号： G01Q60/38 , B82Y35/00 , G01Q30/025 , G01Q30/14 , G01Q70/02 , G01Q70/04 , Y10S977/863 , Y10S977/87
摘要： An atomic force microscope which is readily useable for researchers for its intended use without extensive lost time for setup and repair. The probe used therein is a cantilevered optical lever which imparts surface information in a gentle and reliable manner by reflecting an incident laser beam. The probe is carried by a replaceable probe-carrying module which is factory set up and merely inserted and fine tuned by the user. The probe-carrying module also includes the provision for forming a fluid cell around the probe. Fluid can be inserted into and/or be circulated through the fluid cell through incorporated tubes in the porbe-carrying module. Electrodes are also provided in the fluid cell for various uses including real-time studies of electro-chemical operations taking place in the fluid cell. The piezoelectric scan tube employed includes a voltage shield to prevent scanning voltages to the tube from affecting data readings. Samples are easily mounted, replaced, and horizontally adjusted using a sample stage which is magnetically attached to the top of the scan tube. Calibration tools are provided to make initial set up and fine tuning of the microscope a simple and straightforward operation requiring little or no technical talent.

96. 发明授权

US4935625A Electron holography apparatus 失效
标题翻译：电子全息设备
公开(公告)号：US4935625A
公开(公告)日：1990-06-19
申请号：US238143
申请日：1988-08-30
申请人： Shuji Hasegawa , Junji Endo , Nobuyuki Osakabe , Akira Tonomura
发明人： Shuji Hasegawa , Junji Endo , Nobuyuki Osakabe , Akira Tonomura
IPC分类号： G01Q30/02 , G03H5/00 , H01J37/04 , H01J37/22 , H01J37/26
CPC分类号： H01J37/26 , G03H5/00 , H01J2237/1514 , H01J2237/228 , H01J2237/2614
摘要： An electron holography apparatus includes an electron microscope which is provided with an electron source, a beam splitter for dividing an electron beam emitted from the electron source into first and second electron beams, and a phase controller for controllably changing a phase difference between the first and second electron beams, and further includes an image detector for detecting an electron interference fringe pattern which varies in accordance with the phase difference between the first and second electron beams, as a picture image, and an image data processor for determining the phase distribution of one of the first and second electron beams from detected image data.
摘要翻译：一种电子全息摄影装置，具备：具有电子源的电子显微镜，将从电子源射出的电子束分割成第一和第二电子束的分束器，以及相位控制器，用于可控地改变第一和第二电子束之间的相位差第二电子束，还包括用于检测根据第一和第二电子束之间的相位差而变化的电子干涉条纹图案作为图像图像的图像检测器，以及用于确定第一和第二电子束的相位分布的图像数据处理器的来自检测到的图像数据的第一和第二电子束。

97. 发明授权

US4928016A Magazine for accommodating recording medium for electron microscope 失效
标题翻译：用于容纳电子显微镜记录介质的杂志
公开(公告)号：US4928016A
公开(公告)日：1990-05-22
申请号：US281414
申请日：1988-12-08
申请人： Nobufumi Mori , Katsuaki Muraishi , Terumi Matsuda , Masahiro Ohnishi , Hiromi Nunome , Tadao Koyama , Tetsuo Oikawa
发明人： Nobufumi Mori , Katsuaki Muraishi , Terumi Matsuda , Masahiro Ohnishi , Hiromi Nunome , Tadao Koyama , Tetsuo Oikawa
IPC分类号： G01Q30/02 , G03B27/58 , H01J37/22
CPC分类号： H01J37/224 , G03B27/585
摘要： A rack for housing recording media for an electron microscope includes a vertically movable rack for accommodating the recording media and composed of a plurality of shelves, and a unit for pushing out the recording media as well as a unit for entrance and exit of the recording media are provided at a predetermined height position. Two-dimensional sensors or cassettes for photographic films are accommodated within the rack. For photography, the rack is moved up and down to extract the desired two-dimensional sensors or cassettes for photographic films by the recording media pushing unit and the exit unit. After photography, the recording media are returned by the recording media entrance unit to the original position in the rack, so that a single magazine suffices for the receiving magazine and the feed magazine.
摘要翻译：用于容纳用于电子显微镜的记录介质的机架包括用于容纳记录介质并由多个搁架构成的可垂直移动的架，以及用于推出记录介质的单元以及用于记录介质的入口和出口的单元设置在预定高度位置。用于摄影胶片的二维传感器或盒式磁带容纳在机架内。对于摄影，机架上下移动以通过记录介质推动单元和出口单元提取用于摄影胶片的所需二维传感器或盒。拍摄后，记录介质由记录介质入口单元返回到机架中的原始位置，从而单个的杂志足以用于接收盒和进纸盒。

98. 发明授权

US4912327A Pulsed microfocused ion beams 失效
标题翻译：脉冲聚焦离子束
公开(公告)号：US4912327A
公开(公告)日：1990-03-27
申请号：US364202
申请日：1989-06-09
申请人： Allen R. Waugh
发明人： Allen R. Waugh
IPC分类号： G01Q10/00 , G01Q30/02 , G01Q30/04 , H01J27/02 , H01J49/40
CPC分类号： H01J49/061 , H01J27/02 , H01J49/40
摘要： An ion gun for producing a pulsed microfocused beam of ions comprises an ion source arranged to produce a continuous ion beam along a z-axis toward a collector having an aperture on the axis. A deflector is arranged to maintain the beam substantially stationary and incident on the aperture for a pulse time, to deflect the beam away from the aperture to the collector and subsequently to return the beam to be incident at the aperture. A focussing lens focusses the beam from the deflection point to a final image point, and a condensing lens focusses the beam at the deflection point. A mass filter selects a single ion species, and a second deflector deflects the beam orthogonally to the deflector so that the returning path of the beam on the collector does not cross the aperture. A stigmator and a beam scanner are also provided.

99. 发明授权

US4900932A Cathodoluminescence detector utilizing a hollow tube for directing light radiation from the sample to the detector 失效
标题翻译：阴极发光检测器利用中空管将来自样品的光辐射引导到检测器
公开(公告)号：US4900932A
公开(公告)日：1990-02-13
申请号：US239317
申请日：1988-09-01
申请人： Norbert Schafer , Eugen Weimer , Herbert Gross , Bernd Eppli , Eberhard Rossow
发明人： Norbert Schafer , Eugen Weimer , Herbert Gross , Bernd Eppli , Eberhard Rossow
IPC分类号： G01N23/225 , G01Q30/02 , G01Q90/00 , H01J37/244
CPC分类号： H01J37/228 , G01N23/2254 , H01J37/244 , H01J2237/2445 , H01J2237/2808
摘要： A detector is disclosed which includes an elliptical hollow mirror and a tube having a reflecting inner surface for conducting the light emitted by a specimen under investigation in a scanning electron microscope. A vacuum window is seated at the outer end portion of the tube directly ahead of a receiver.
摘要翻译：公开了一种检测器，其包括椭圆形中空反射镜和具有反射内表面的管，用于在扫描电子显微镜中传导被研究中的试样发射的光。真空窗口位于接收器正前方的管的外端部分。

100. 发明授权

US4896036A Detector objective for scanning microscopes 失效
标题翻译：扫描显微镜检测器的目的
公开(公告)号：US4896036A
公开(公告)日：1990-01-23
申请号：US150245
申请日：1988-01-29
申请人： Harald Rose , Joachim Zach
发明人： Harald Rose , Joachim Zach
IPC分类号： H01J37/12 , G01Q30/02 , H01J37/141 , H01J37/147 , H01J37/244 , H01J37/28
CPC分类号： H01J37/28 , H01J37/141
摘要： In a high resolution imaging system for close inspection of sub-micrometer structures, a scanning electron microscope includes a detector objective essentially composed of an immersion lens and an annular detector which is arranged between a source side electrode lying at a positive potential and a middle electrode of the immersion lens which likewise lies at a variable positive potential and is arranged concentrically relative to a beam axis of a scanning microscope. The middle electrode and the source side electrode are preferrably formed as truncated cones. The two-stage deflection element for positioning the primary electron beam on the specimen is preferrably integrated into the source side electrode of the immersion lens, the source side electrode being composed of an annular diaphragm and a hollow cylinder.
摘要翻译：在用于仔细检查亚微米结构的高分辨率成像系统中，扫描电子显微镜包括基本上由浸没透镜组成的检测器物镜和布置在位于正电位的源极电极和中间电极之间的环形检测器的浸没透镜同样位于可变的正电位并且相对于扫描显微镜的光束轴线同心地布置。中间电极和源极电极优选地形成为截锥体。用于将一次电子束定位在试样上的两级偏转元件优选地集成到浸没透镜的源极侧电极中，源极电极由环形隔膜和中空圆筒构成。

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