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    • 11. 发明授权
    • Master controller architecture
    • 主控制器架构
    • US07308633B2
    • 2007-12-11
    • US10999720
    • 2004-11-30
    • Alexandre AndreevSergey GribokAnatoli Bolotov
    • Alexandre AndreevSergey GribokAnatoli Bolotov
    • G01R31/28G11C29/00
    • G11C29/16G11C29/44G11C29/4401G11C29/72
    • A master controller for an RRAM subsystem. An interface communicates with at least one RRAM controller. A main control unit selects and implements test and repair operations on the RRAM subsystem through the RRAM controller. A timer determines a maximum number of test and repair operations that can be implemented within a given time. Thus, a master controller is included in the RRAM subsystem. The master controller has a relatively simple interface, and performs test and repair operations on the RRAM subsystem. The advantages of using the master controller include an elimination of additional test ports, simplification of the process of preparing the test vectors for RRAM testing, and the master controller is able to accumulate test results and initiate repairs based on those results. In this manner, the RRAM subsystem has a self-repair functionality.
    • 用于RRAM子系统的主控制器。 接口与至少一个RRAM控制器通信。 主控单元通过RRAM控制器对RRAM子系统进行测试和修复操作。 定时器确定在给定时间内可以实现的最大测试和修复操作数。 因此,主控制器包含在RRAM子系统中。 主控制器具有相对简单的接口,并对RRAM子系统执行测试和修复操作。 使用主控制器的优点包括消除额外的测试端口,简化了用于RRAM测试的测试向量的准备过程,并且主控制器能够根据这些结果积累测试结果并启动修复。 以这种方式,RRAM子系统具有自修复功能。
    • 12. 发明授权
    • Method and system for classifying an integrated circuit for optical proximity correction
    • 用于对用于光学邻近校正的集成电路进行分类的方法和系统
    • US07093228B2
    • 2006-08-15
    • US10327304
    • 2002-12-20
    • Alexandre AndreevIvan PavisicLav Ivanovic
    • Alexandre AndreevIvan PavisicLav Ivanovic
    • G06F17/50
    • G03F1/36G03F7/70441
    • A method and system for performing optical proximity correction (OPC) on an integrated circuit (IC) chip design is disclosed. The system and method of the present invention includes dividing the IC chip into a plurality of local task regions, identifying congruent local task regions, classifying congruent local task regions into corresponding groups, and performing OPC for each group of congruent local task regions.By identifying and grouping congruent local task regions in the IC chip, according to the method and system disclosed herein, only one OPC procedure (e.g., evaluation and correction) needs to be performed per group of congruent local task regions. The amount of data to be evaluated and the number of corrections performed is greatly reduced because OPC is not performed on repetitive portions of the IC chip design, thereby resulting in significant savings in computing resources and time.
    • 公开了一种在集成电路(IC)芯片设计上执行光学邻近校正(OPC)的方法和系统。 本发明的系统和方法包括将IC芯片划分为多个本地任务区域,识别同一个本地任务区域,将等同的本地任务区域分类为相应的组,并为每组全局本地任务区域执行OPC。 通过根据本文所公开的方法和系统识别和分组IC芯片中的一致的本地任务区域,需要在每一组一致的本地任务区域中执行一个OPC过程(例如,评估和校正)。 由于不对IC芯片设计的重复部分执行OPC,所以要评估的数据量和校正次数大大降低,从而大大节省了计算资源和时间。
    • 15. 发明授权
    • Transport subsystem for an MBIST chain architecture
    • 用于MBIST链架构的传输子系统
    • US08046643B2
    • 2011-10-25
    • US12183512
    • 2008-07-31
    • Alexandre AndreevAnatoli BolotovMikhail Grinchuk
    • Alexandre AndreevAnatoli BolotovMikhail Grinchuk
    • G11C29/00G01R31/28
    • G11C29/48G11C29/1201G11C29/26G11C29/32G11C2029/2602G11C2029/5602
    • An apparatus including a controller configured to present one or more commands and receive one or more responses, a plurality of transport circuits configured to receive one of the commands, present the responses, and generate one or more control signals, and a plurality of memory-controlling circuits, each coupled to a respective one of the plurality of transport circuits and configured to generate one or more memory access signals in response to the one or more control signals, receive one or more memory output signals from a respective memory in response to the one or more memory access signals, and generate the responses in response to the one or more memory output signals. Each respective memory may be independently sized. The controller generally provides a common testing routine for each respective memory that may be adjusted for the size of each respective memory by the memory-controlling circuits.
    • 一种装置,包括:控制器,被配置为呈现一个或多个命令并接收一个或多个响应;多个传输电路,被配置为接收命令中的一个,呈现响应,并产生一个或多个控制信号;以及多个存储器 - 控制电路,每个耦合到所述多个传输电路中的相应一个,并被配置为响应于所述一个或多个控制信号而产生一个或多个存储器访问信号,响应于所述控制电路响应于所述控制电路接收来自相应存储器的一个或多个存储器输出信号 一个或多个存储器访问信号,并且响应于一个或多个存储器输出信号而产生响应。 各个存储器可以独立地定尺寸。 控制器通常为每个相应的存储器提供通用的测试程序,这些存储器可以通过存储器控制电路为每个相应的存储器的大小进行调整。
    • 19. 发明申请
    • Memory tiling architecture
    • 记忆瓷砖结构
    • US20060104145A1
    • 2006-05-18
    • US10990237
    • 2004-11-16
    • Alexandre AndreevIgor VikhliantsevIvan Pavisic
    • Alexandre AndreevIgor VikhliantsevIvan Pavisic
    • G11C8/00
    • G06F17/5045
    • A method of tiling a customer memory design to configurable memory blocks within a standardized memory matrix. A customer memory capacity and a customer memory width is determined for the customer memory design, and a standardized memory capacity and a standardized memory width is determined for the configurable memory blocks. The customer memory capacity and the customer memory width are selectively transformed by inverse factors based at least in part on a comparison of the customer memory capacity and the standardized memory capacity. Case independent blocks are formed within the configurable memory blocks, where the case independent blocks include gate structures formed in a standardized array in a substrate in which the customer memory design is to be implemented. Case dependent blocks are formed within the configurable memory blocks, where the case dependent blocks are electrically conductive routing layers that selectively connect the case independent blocks according to the transformation of the customer memory design.
    • 将客户存储器设计平铺到标准化存储器矩阵内的可配置存储器块的方法。 为客户存储器设计确定客户存储器容量和客户存储器宽度,并且为可配置存储器块确定标准化存储容量和标准化存储器宽度。 至少部分地基于客户存储器容量与标准化存储器容量的比较,客户存储器容量和客户存储器宽度被反向因素选择性地变换。 在可配置的存储器块内形成与箱体无关的块,其中与壳体无关的块包括形成在衬底中的标准化阵列中的栅极结构,其中将实现客户存储器设计。 在可配置的存储器块内部形成与情况相关的块,其中与盒相关的块是根据客户存储器设计的变换选择性地连接不依赖于盒的块的导电路由层。