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    • 5. 发明授权
    • Master controller architecture
    • 主控制器架构
    • US07308633B2
    • 2007-12-11
    • US10999720
    • 2004-11-30
    • Alexandre AndreevSergey GribokAnatoli Bolotov
    • Alexandre AndreevSergey GribokAnatoli Bolotov
    • G01R31/28G11C29/00
    • G11C29/16G11C29/44G11C29/4401G11C29/72
    • A master controller for an RRAM subsystem. An interface communicates with at least one RRAM controller. A main control unit selects and implements test and repair operations on the RRAM subsystem through the RRAM controller. A timer determines a maximum number of test and repair operations that can be implemented within a given time. Thus, a master controller is included in the RRAM subsystem. The master controller has a relatively simple interface, and performs test and repair operations on the RRAM subsystem. The advantages of using the master controller include an elimination of additional test ports, simplification of the process of preparing the test vectors for RRAM testing, and the master controller is able to accumulate test results and initiate repairs based on those results. In this manner, the RRAM subsystem has a self-repair functionality.
    • 用于RRAM子系统的主控制器。 接口与至少一个RRAM控制器通信。 主控单元通过RRAM控制器对RRAM子系统进行测试和修复操作。 定时器确定在给定时间内可以实现的最大测试和修复操作数。 因此,主控制器包含在RRAM子系统中。 主控制器具有相对简单的接口,并对RRAM子系统执行测试和修复操作。 使用主控制器的优点包括消除额外的测试端口,简化了用于RRAM测试的测试向量的准备过程,并且主控制器能够根据这些结果积累测试结果并启动修复。 以这种方式,RRAM子系统具有自修复功能。
    • 6. 发明授权
    • Method and system for classifying an integrated circuit for optical proximity correction
    • 用于对用于光学邻近校正的集成电路进行分类的方法和系统
    • US07093228B2
    • 2006-08-15
    • US10327304
    • 2002-12-20
    • Alexandre AndreevIvan PavisicLav Ivanovic
    • Alexandre AndreevIvan PavisicLav Ivanovic
    • G06F17/50
    • G03F1/36G03F7/70441
    • A method and system for performing optical proximity correction (OPC) on an integrated circuit (IC) chip design is disclosed. The system and method of the present invention includes dividing the IC chip into a plurality of local task regions, identifying congruent local task regions, classifying congruent local task regions into corresponding groups, and performing OPC for each group of congruent local task regions.By identifying and grouping congruent local task regions in the IC chip, according to the method and system disclosed herein, only one OPC procedure (e.g., evaluation and correction) needs to be performed per group of congruent local task regions. The amount of data to be evaluated and the number of corrections performed is greatly reduced because OPC is not performed on repetitive portions of the IC chip design, thereby resulting in significant savings in computing resources and time.
    • 公开了一种在集成电路(IC)芯片设计上执行光学邻近校正(OPC)的方法和系统。 本发明的系统和方法包括将IC芯片划分为多个本地任务区域,识别同一个本地任务区域,将等同的本地任务区域分类为相应的组,并为每组全局本地任务区域执行OPC。 通过根据本文所公开的方法和系统识别和分组IC芯片中的一致的本地任务区域,需要在每一组一致的本地任务区域中执行一个OPC过程(例如,评估和校正)。 由于不对IC芯片设计的重复部分执行OPC,所以要评估的数据量和校正次数大大降低,从而大大节省了计算资源和时间。