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11. 发明申请

US20210003504A1 PHOTOTHERMAL IMAGING DEVICE AND SYSTEM 有权
公开(公告)号：US20210003504A1
公开(公告)日：2021-01-07
申请号：US16877152
申请日：2020-05-18
申请人： University of Notre Dame de Lac
发明人： Zhongming Li , Gregory Hartland , Masaru Ken Kuno
IPC分类号： G01N21/3563 , G01Q60/34 , G01J3/28 , G01Q30/02 , G01N21/35 , G01N21/17
摘要： Mid-infrared photothermal heterodyne imaging (MIR-PHI) techniques described herein overcome the diffraction limit of traditional MIR imaging and uses visible photodiodes as detectors. MIR-PHI experiments are shown that achieve high sensitivity, sub-diffraction limit spatial resolution, and high acquisition speed. Sensitive, affordable, and widely applicable, photothermal imaging techniques described herein can serve as a useful imaging tool for biological systems and other submicron-scale applications.

12. 发明授权

US10866262B2 Multi-axis positioning device 有权
公开(公告)号：US10866262B2
公开(公告)日：2020-12-15
申请号：US16619752
申请日：2018-06-07
申请人： GETEC MICROSCOPY GMBH
发明人： Peter Ziger , Georg E. Fantner , Jeffrey M. Markakis
IPC分类号： G01Q30/02 , G01Q10/00 , G01Q60/38 , G01Q70/00 , B23Q1/34 , G01Q10/04 , G01Q70/02
CPC分类号： G01Q30/02 , B23Q1/34 , G01Q10/045 , G01Q60/38 , G01Q70/02
摘要： A device for microscopically precise positioning and guidance of a measurement or manipulation element in at least two spatial axes, comprising an outer base with side walls defining a base interior, and an xy-stage having side walls and mounting means for at least one measurement or manipulation element, the xy-stage being arranged inside of the base interior and being displaceable in an XY-plane relative to the outer base. The xy-stage is coupled to the outer base with bending elements, and with actuators designed for displacing the xy-stage relative to the outer base. The outer base is provided with at least one stiffening element rigidly connected to the side walls of the outer base, and/or that the xy-stage is provided with at least one stiffening element rigidly connected to the side walls of the xy-stage.

13. 发明申请

US20200309815A1 DEVICE INTEGRATED WITH SCANNING PROBE FOR OPTICAL NANOFOCUSING AND NEAR-FIELD OPTICAL IMAGING 审中-公开
公开(公告)号：US20200309815A1
公开(公告)日：2020-10-01
申请号：US16834326
申请日：2020-03-30
申请人： THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
发明人： Ming LIU , Ruoxue YAN
IPC分类号： G01Q20/02 , G01Q60/16 , G01Q30/02 , G01Q60/38 , G01Q60/22
摘要： A method for generating a high-intensity light source at a probe tip, the method includes exciting a TM0 mode of a surface plasmon polariton (SPP) in a sharp-tip metal nanowire (AgNW) waveguide with a linearly-polarized mode (LP01) in a tapered optical fiber (OF); and compressing the TM0 mode through a chemically-sharpened taper to a tip apex of the sharp-tip silver nanowire (AgNW).

14. 发明申请

US20200049735A1 FREQUENCY MODULATION DETECTION FOR PHOTO-INDUCED FORCE MICROSCOPY 审中-公开
公开(公告)号：US20200049735A1
公开(公告)日：2020-02-13
申请号：US16482241
申请日：2018-01-30
申请人： MOLECULAR VISTA, INC.
发明人： Thomas R. ALBRECHT
IPC分类号： G01Q60/34 , G01Q30/18 , G01Q30/02
摘要： An atomic force microscope and method for detecting photo-induced force using the atomic force microscope utilizes light from a photonic source at a tip-sample interface that results in photo-induced force gradient, which is detected by measuring a resonant frequency of a vibrational mode of a cantilever of the atomic force microscope.

15. 发明申请

US20190107556A1 TAPERED NANO-CARBON MATERIAL FUNCTIONALIZED NEEDLE TIP AND PREPARATION METHOD THEREFOR 审中-公开
公开(公告)号：US20190107556A1
公开(公告)日：2019-04-11
申请号：US16086821
申请日：2016-03-29
申请人： (NATIONAL CENTER FOR NANOSCIENCE AND TECHNOLOGY)
发明人： Jianxun Xu , Yuliang Zhao
IPC分类号： G01R1/067 , G01R3/00 , G01Q70/12 , G01Q30/02
摘要： Provided is a conical nano-carbon material functionalized needle tip, formed by assembling a nano-carbon material with a material of a needle tip by means of a covalent bond; and the material of the needle tip is a metal selected from one or more of tungsten, iron, cobalt, nickel and titanium. Further provided is a method for preparing the conical nano-carbon material functionalized needle tip. The conical nano-material functionalized needle tip has an outstanding interface formed by metal-carbide covalent bonds, and the orientation of the conical nano-material is matched with the axial direction of the metal needle tip (illustrated in FIG. 6). The proposed preparation method affords a robust interface and avoids the potential pollution to the nano-material caused during the deposition of fixing materials, such as carbon or platinum or the like, in other preparation methods.

16. 发明授权

US10175263B2 Sample vessel retention structure for scanning probe microscope 有权
公开(公告)号：US10175263B2
公开(公告)日：2019-01-08
申请号：US15739094
申请日：2016-06-15
申请人： Bruker Nano, Inc.
发明人： Charles Meyer , Shuiqing Hu , James Shaw , Chanmin Su
IPC分类号： G02B21/02 , G01Q30/14 , G01Q30/16 , G01Q30/02 , G01Q30/20 , G02B21/26 , G01Q30/18
摘要： A sample vessel retention mechanism for an inverted microscope having an optical objective and a scanning probe microscope (SPM) head. The inverted microscope includes a platform for supporting a sample vessel, in which is formed an aperture sized to provide a passage for the objective of the inverted microscope to approach the sample vessel from below. The retention mechanism provides a vacuum region formed in the platform, with the vacuum region being barometrically coupled with a vacuum generator. Establishment of a vacuum in the vacuum region prevents or substantially reduces oscillation of the sample vessel floor in an operating frequency range of the SPM head.

17. 发明授权

US10132830B2 Method of measuring a topographic profile and/or a topographic image 有权
公开(公告)号：US10132830B2
公开(公告)日：2018-11-20
申请号：US15001049
申请日：2016-01-19
申请人： Anton Paar TriTec SA
发明人： Bertrand Bellaton , Richard Consiglio , Jacques Woirgard
IPC分类号： G01Q20/00 , G01Q30/02 , G01N3/42 , G01Q60/38
摘要： Measuring a topographic profile and/or a topographic image of a surface of a sample includes positioning an indenter out of contact with a sample and in a constant position with respect to a headstock; positioning a topographic tip to detect a surface of the sample and positioning a reference structure at a predetermined distance from said surface; measuring the relative position of the indenter with respect to the reference structure by a relative position sensor; translating said sample perpendicular to said longitudinal axis while maintaining the reference structure at said predetermined distance from the surface of the sample by the feedback control system and the second actuator while measuring the relative position of the indenter with respect to the reference structure by the relative position sensor; and generating a topographic profile and/or a topographic image based on measurements of the relative position.

18. 发明授权

US10088499B2 Scanning probe microscope 有权
公开(公告)号：US10088499B2
公开(公告)日：2018-10-02
申请号：US15712760
申请日：2017-09-22
申请人： Shimadzu Corporation
发明人： Kanji Kobayashi , Masato Hirade
IPC分类号： G01Q30/02 , G01Q20/02
摘要： Provided is a scanning probe microscope capable of performing observation with high accuracy even when a beam splitter is configured to be movable.When checking positions of a sample and a cantilever in a scanning probe microscope, by disposing an optical microscope to face a first opening portion of a top surface of a housing, and by gripping and rotating an operating portion provided on a side surface of the housing, a user rotates and moves a beam splitter held by a holding portion in the housing, and retracts the beam splitter from the field of view of the optical microscope. Therefore, the beam splitter can always be disposed in the housing, and the user can be prevented from touching the beam splitter. As a result, it is possible to prevent the beam splitter from being damaged or stains from adhering to the beam splitter. Further, the moving distance of the bears splitter 6 can be shortened. Therefore, it is possible to suppress the occurrence of a deviation in the position of the beam splitter.

19. 发明申请

US20180275164A1 Method of carrier profiling in semiconductors 审中-公开
公开(公告)号：US20180275164A1
公开(公告)日：2018-09-27
申请号：US15928712
申请日：2018-03-22
申请人： Mark J. Hagmann
发明人： Mark J. Hagmann
IPC分类号： G01Q30/02 , G01Q60/12
CPC分类号： G01Q30/02 , G01Q60/12 , G01Q60/14
摘要： The superimposition of a periodic potential wave to the tip movement control or the bias supply of an STM, in which a microwave frequency comb is generated in its tunneling junction, may be used to reduce or eliminate artifacts or other noise generated from outside the tunneling junction.

20. 发明申请

US20180246032A1 PHOTOTHERMAL IMAGING DEVICE AND SYSTEM 审中-公开
公开(公告)号：US20180246032A1
公开(公告)日：2018-08-30
申请号：US15480218
申请日：2017-04-05
申请人： University of Notre Dame du Lac
发明人： Zhongming Li , Gregory Hartland , Masaru Ken Kuno
IPC分类号： G01N21/3563 , G01Q60/34 , G01Q30/02 , G01J3/28
CPC分类号： G01N21/3563 , G01J3/2823 , G01N21/171 , G01N21/35 , G01N2021/1712 , G01N2021/1714 , G01Q30/02 , G01Q60/34
摘要： Mid-infrared photothermal heterodyne imaging (MIR-PHI) techniques described herein overcome the diffraction limit of traditional MIR imaging and uses visible photodiodes as detectors. MIR-PHI experiments are shown that achieve high sensitivity, sub-diffraction limit spatial resolution, and high acquisition speed. Sensitive, affordable, and widely applicable, photothermal imaging techniques described herein can serve as a useful imaging tool for biological systems and other submicron-scale applications.

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