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61. 发明授权

US5367165A Cantilever chip for scanning probe microscope 失效
标题翻译：悬臂芯片用于扫描探针显微镜
公开(公告)号：US5367165A
公开(公告)日：1994-11-22
申请号：US3322
申请日：1993-01-12
申请人： Akitoshi Toda , Katsuhiro Matsuyama
发明人： Akitoshi Toda , Katsuhiro Matsuyama
IPC分类号： G01Q70/10 , G01Q60/38 , H01J37/00
CPC分类号： G01Q60/38 , B82Y35/00 , Y10S977/873
摘要： A cantilever chip has a holding substrate, and a cantilever having the shape of a hollow triangle extends from the holding substrate. A probe is arranged at the distal end portion of the cantilever. An axis of the probe is inclined at a predetermined angle with respect to a normal extending from the surface of the cantilever. This angle is set such that the axis of the probe is perpendicular to a sample surface when the cantilever chip is mounted on an atomic force microscope.
摘要翻译：悬臂芯片具有保持基板，并且具有中空三角形的悬臂从保持基板延伸。探针位于悬臂的远端部分。相对于从悬臂的表面延伸的法线，探针的轴线以预定的角度倾斜。当将悬臂芯片安装在原子力显微镜上时，该角度被设定为使得探针的轴线垂直于样品表面。

62. 发明授权

US5353632A Probe for atomic force microscope usable for scanning tunneling microscope 失效
标题翻译：探针用于扫描隧道显微镜的原子力显微镜
公开(公告)号：US5353632A
公开(公告)日：1994-10-11
申请号：US934272
申请日：1992-08-25
申请人： Tohru Nakagawa
发明人： Tohru Nakagawa
IPC分类号： G01B21/30 , C09D183/04 , G01B7/34 , G01N27/00 , G01N27/416 , G01Q60/04 , G01Q60/10 , G01Q60/16 , G01Q60/24 , G01Q60/38 , G01Q60/40 , G01Q70/14 , H01J37/26
CPC分类号： G01Q60/40 , B82Y35/00 , G01Q60/04 , G01Q60/16 , B82Y30/00 , Y10S977/877
摘要： According to the invention, a probe for an atomic force microscope comprising a means for tunneling current is disclosed. The probe has a metal tip which is covered with a monomolecular film. The body of the probe is covered with a monomolecular laminated film, wherein conductive molecules are fixed on the the monomolecular film and/or the said monomolecular laminated film. The monomolecular laminated film has a crosslinked electroconductive surface. The monomolecular laminated film is fixed on the metal by a covalent bond comprising a siloxane base (--SiO--), and the laminated part of the molecule is also chemically fixed on the metal surface of a covalent bond comprising a siloxane base (--SiO--). The probe of this invention is durable and can be put to practical use, because the films are surface conductive rather than conductive through its thickness. Moreover, compared with a conventional probe, since this probe does not metal deposited on the surface, it has high reproductibility with less process step to manufacture the probe.
摘要翻译：根据本发明，公开了一种用于包括用于隧穿电流的装置的原子力显微镜的探针。探针具有用单分子膜覆盖的金属尖端。探针的主体由单分子层压膜覆盖，其中导电分子固定在单分子膜和/或所述单分子层压膜上。单分子层叠膜具有交联的导电性表面。通过包含硅氧烷基（-SiO-）的共价键将单分子层压膜固定在金属上，分子的层叠部分也化学地固定在包含硅氧烷基（-SiO-）的共价键的金属表面上，）。本发明的探针是耐用的并且可以投入实际使用，因为膜的表面导电而不是通过其厚度导电。此外，与常规探针相比，由于该探针没有金属沉积在表面上，所以在制造探针的过程中具有较高的再生性。

63. 发明授权

US5253515A Atomic probe microscope and cantilever unit for use in the microscope 失效
标题翻译：原子探针显微镜和悬臂单元用于显微镜
公开(公告)号：US5253515A
公开(公告)日：1993-10-19
申请号：US661485
申请日：1991-02-26
申请人： Akitoshi Toda , Shuzo Mishima
发明人： Akitoshi Toda , Shuzo Mishima
IPC分类号： G01B11/30 , G01B21/30 , G01N27/00 , G01Q60/38 , G01Q70/02 , H01J37/252 , H01J37/26
CPC分类号： G01Q60/38 , B82Y35/00 , G01Q70/02 , Y10S977/873
摘要： An atomic probe microscope comprises a cantilever which includes a lever section provided with a probe, a lever attaching section for supporting the lever section, and a positioning striking section formed at the lever attaching section. A cantilever unit comprises a seat for supporting the cantilever and provided with a face against which the positioning striking section is received.

64. 发明授权

US11555827B2 Torsion wing probe assembly 有权
公开(公告)号：US11555827B2
公开(公告)日：2023-01-17
申请号：US17473577
申请日：2021-09-13
申请人： Bruker Nano, Inc.
发明人： Shuiqing Hu , Martin Wagner , Weijie Wang , Chanmin Su
IPC分类号： G01Q20/02 , G01Q60/38
摘要： A torsional probe for a metrology instrument includes a cantilever coupled to a support structure via a torsion bar. The cantilever, support structure, and arms of torsion bar have substantially the same thickness. A method of manufacture of the torsion probe, as well as a method of using the torsion probe to measure photothermal induced surface displacement of a sample are also described.

65. 发明申请

US20220163559A1 ACTIVE BIMODAL AFM OPERATION FOR MEASUREMENTS OF OPTICAL INTERACTION 有权
公开(公告)号：US20220163559A1
公开(公告)日：2022-05-26
申请号：US17602261
申请日：2020-04-09
申请人： Attocube Systems AG
发明人： Alexander A. GOVYADINOV , Florian HUTH , Ivan MALOVICHKO , Marcus DIEM
IPC分类号： G01Q60/34 , G01Q60/30 , G01Q60/36 , G01Q60/38 , G01Q30/02
摘要： The present invention relates to a method for measuring the dielectric properties of a sample with a scanning probe microscope. In particular, the invention relates to highly-localized optical imaging and spectroscopy on a sample surface using an atomic force microscope (AFM) probe mechanically driven at two oscillation frequencies, referred to herein as “active bimodal operation”, and a modulated source of electromagnetic radiation.

66. 发明授权

US11307220B2 Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) 有权
公开(公告)号：US11307220B2
公开(公告)日：2022-04-19
申请号：US17234185
申请日：2021-04-19
申请人： BRUKER NANO, INC.
发明人： Sergey Osechinskiy , Anthonius Ruiter , Bede Pittenger , Syed-Asif Syed-Amanulla
IPC分类号： G01Q60/38 , G01Q10/04 , G01Q20/04 , G01Q30/04 , B82Y35/00
摘要： An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.

67. 发明授权

US11111528B2 Method and apparatus for ultrasensitive quantification of microRNA using an atomic force microscope and a hybrid binding domain 有权
公开(公告)号：US11111528B2
公开(公告)日：2021-09-07
申请号：US15412025
申请日：2017-01-22
申请人： POSCO , POSTECH ACADEMY-INDUSTRY FOUNDATION
发明人： Joon Won Park , Joung Hun Kim , Young Kyu Kim , Hyun Seo Koo , Yoon Hee Lee
IPC分类号： C12Q1/6837 , G01Q60/42 , G01Q60/38
摘要： The present invention provides an apparatus and a method for detecting the presence of and/or determining the amount of a label-free microRNA using an atomic force microscope. The method is extremely selective and/or ultrasensitive. In particular, the present invention provides a cantilever comprising a probe that selectively binds to a double strand of DNA/RNA hybrid complex. The probe comprises a hybrid binding domain (HBD) or a variant thereof.

68. 发明授权

US11016118B2 Atomic force microscope based instrumentation for probing nanoscale charge carrier dynamics with improved temporal and spatial resolution 有权
公开(公告)号：US11016118B2
公开(公告)日：2021-05-25
申请号：US16766228
申请日：2018-11-23
申请人： SOUTH DAKOTA STATE UNIVERSITY
发明人： Qiquan Qiao , Behzad Bahrami , Ashraful Haider Chowdhury
IPC分类号： G01Q60/30 , G01Q60/38
摘要： A system for conductive atomic force microscopy measurements includes a function generator that drives a light source as well as current provided to a sample, designed sample holder for local charge dynamics measurements and output circuitry that includes both a frequency response analysis as well as a bypass circuit analysis portion. Bypass circuit with external preamplifier helped to overcome the obstacles of commercially available AFM circuit bandwidth (e.g. 100 kHz) to see the local characteristics with high temporal resolution. By obtaining the data output of the frequency response analyzer and the bypass circuitry, local mobility map, local carrier lifetime and transport time map, local carrier density map, and a nanoscale impedance map can be made of complex solid state devices at high temporal and spatial resolutions.

69. 发明申请

US20210132110A1 Large Radius Probe 有权
公开(公告)号：US20210132110A1
公开(公告)日：2021-05-06
申请号：US17069302
申请日：2020-10-13
申请人： Bruker Nano, Inc.
发明人： Jeffrey Wong
IPC分类号： G01Q60/38 , C23C16/34 , C23C16/56 , C23C16/44 , C23C16/02 , G01Q60/36 , G01Q70/10
摘要： A large radius probe for a surface analysis instrument such as an atomic force microscope (AFM). The probe is microfabricated to have a tip with a hemispherical distal end or apex. The radius of the apex is the range of about a micron making the probes particularly useful for nanoindentation analyses. The processes of the preferred embodiments allow such large radius probes to be batch fabricated to facilitate cost and robustness.

70. 发明授权

US10955437B2 Frequency modulation detection for photo induced force microscopy 有权
公开(公告)号：US10955437B2
公开(公告)日：2021-03-23
申请号：US16482241
申请日：2018-01-30
申请人： MOLECULAR VISTA, INC.
发明人： Thomas R. Albrecht
IPC分类号： G01Q60/34 , G01Q30/02 , G01Q30/18 , G01Q60/38
摘要： An atomic force microscope and method for detecting photo-induced force using the atomic force microscope utilizes light from a photonic source at a tip-sample interface that results in photo-induced force gradient, which is detected by measuring a resonant frequency of a vibrational mode of a cantilever of the atomic force microscope.

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