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81. 发明申请

US20200049734A1 High Speed Atomic Force Profilometry of Large Areas 审中-公开
公开(公告)号：US20200049734A1
公开(公告)日：2020-02-13
申请号：US16538474
申请日：2019-08-12
申请人： Bruker Nano, Inc.
发明人： Jason Osborne , Vladimir Fonoberov , Sean Michael Hand
IPC分类号： G01Q60/30 , G01Q60/38 , G01R1/067
摘要： An apparatus and method of operating an atomic force profiler (AFP), such as an AFM, using a feedforward control signal in subsequent scan lines of a large area sample to achieve large throughput advantages in, for example, automated applications.

82. 发明申请

US20200041541A1 Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA) 审中-公开
公开(公告)号：US20200041541A1
公开(公告)日：2020-02-06
申请号：US16530725
申请日：2019-08-02
申请人： BRUKER NANO, INC.
发明人： Sergey Osechinskiy , Anthonius Ruiter , Bede Pittenger , Syed-Asif Syed-Amanulla
IPC分类号： G01Q60/38 , G01Q10/04 , G01Q20/04 , G01Q30/04
摘要： An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.

83. 发明申请

US20200003801A1 Passive Semiconductor Device Assembly Technology 审中-公开
公开(公告)号：US20200003801A1
公开(公告)日：2020-01-02
申请号：US16486690
申请日：2018-02-15
申请人： Nu Nano Ltd
发明人： James Vicary
IPC分类号： G01Q60/38 , G01Q60/28 , H01L21/50 , H01L21/68 , H01L21/683
摘要： A method of assembling a group of devices, the method comprising the steps of: evacuating a space between each component of a first group of two or more components on a source device and a transfer device thereby to create a temporary bond between each component of the first group of two or more components and the transfer device; selectively removing the first group of two or more components from the source device whilst the transfer device is temporarily bonded to each component of the first group of two or more components on the source device; positioning the first group of two or more components on a host device; and decoupling the first group of two or more components from the transfer device, thereby to form a first group of assembled devices.

84. 发明申请

US20190383855A1 DATA PROCESSING DEVICE FOR SCANNING PROBE MICROSCOPE 审中-公开
公开(公告)号：US20190383855A1
公开(公告)日：2019-12-19
申请号：US16312729
申请日：2016-06-24
申请人： SHIMADZU CORPORATION
发明人： Kenji YAMASAKI , Akinori KOGURE
IPC分类号： G01Q60/38 , G01B9/04
摘要： A data processing device for a scanning probe microscope, the data processing device processing biaxial data indicating a change in a second physical quantity with respect to a change in a first physical quantity, the biaxial data being acquired for each of a plurality of measurement points on a sample surface by scanning the sample surface with a probe using a scanning probe microscope, the data processing device includes: a feature amount calculator 41 that acquires one or a plurality of types of feature amounts from the biaxial data at each measurement point; a feature amount selector 42 that causes a user to select one of the one or the plurality of types of feature amounts; a two-dimensional mapping image display unit 43 that displays the feature amount on a screen as a two-dimensional mapping image with each measurement point as one pixel based on selection of the feature amount by the user; and a biaxial data display unit 44 that, when the user selects one of the pixels in the two-dimensional mapping image, displays on the screen the selected pixel and the biaxial data of the measurement point corresponding to one or a plurality of pixels adjacent to the selected pixel.

85. 发明申请

US20190317126A1 METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A MEASURING TIP OF A SCANNING PROBE MICROSCOPE 审中-公开
公开(公告)号：US20190317126A1
公开(公告)日：2019-10-17
申请号：US16423687
申请日：2019-05-28
申请人： Carl Zeiss SMT GmbH
发明人： Gabriel Baralia , Rainer Becker , Kinga Kornilov , Christof Baur , Hans Hermann Pieper
IPC分类号： G01Q60/38 , G01Q70/08 , H01J37/305 , H01J37/317
摘要： The present invention relates to methods and devices for extending a time period until changing a measuring tip of a scanning probe microscope. In particular, the invention relates to a method for hardening a measuring tip for a scanning probe microscope, comprising the step of: Processing the measuring tip with a beam of an energy beam source, the energy beam source being part of a scanning electron microscope.

86. 发明授权

US10302673B2 Miniaturized and compact probe for atomic force microscopy 有权
公开(公告)号：US10302673B2
公开(公告)日：2019-05-28
申请号：US15788689
申请日：2017-10-19
申请人： VMICRO , CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE , UNIVERSITE LILLE-1
发明人： Benjamin Walter , Marc Faucher , Estelle Mairiaux-Mage
IPC分类号： G01Q20/02 , G01Q60/38 , G01Q70/10 , G01Q10/04 , G01Q20/04
摘要： A probe for atomic force microscopy comprises a tip for atomic force microscopy oriented in a longitudinal direction, wherein: the tip is arranged at one end of a sensitive part of the probe, which is movable or deformable and linked to a support structure, which is anchored to the main surface of the substrate; the sensitive portion and the support structure are planar elements, extending mainly in planes that are parallel to the main surface of the substrate; the sensitive portion is linked to the support structure via at least one element allowing the sensitive portion to be displaced or to be extended in this direction; and the tip, the sensitive part and the support structure protrude from an edge of the substrate in the longitudinal direction. An atomic force microscope comprising at least one such probe is also provided.

87. 发明申请

US20190027559A1 METHODS AND SYSTEMS FOR CHEMICALLY ENCODING HIGH-RESOLUTION SHAPES IN SILICON NANOWIRES 审中-公开
公开(公告)号：US20190027559A1
公开(公告)日：2019-01-24
申请号：US16129394
申请日：2018-09-12
申请人： The University of North Carolina at Chapel Hill
发明人： James F. Cahoon , Joseph D. Christesen , Christopher W. Pinion
IPC分类号： H01L29/06 , G01Q60/38 , B81B3/00 , B81C1/00 , H01L21/02 , H01L21/283 , H01L29/16 , H01L31/09 , H01L31/0352 , H01L21/306 , H01L31/028
摘要： Methods of chemically encoding high-resolution shapes in silicon nanowires during metal nanoparticle catalyzed vapor-liquid-solid growth or vapor-solid-solid growth are provided. In situ phosphorus or boron doping of the silicon nanowires can be controlled during the growth of the silicon nanowires such that high-resolution shapes can be etched along a growth axis on the silicon nanowires. Nanowires with an encoded morphology can have high-resolution shapes with a size resolution of about 1,000 nm to about 10 nm and comprise geometrical shapes, conical profiles, nanogaps and gratings.

88. 发明授权

US10145861B2 Detection device having attached probe 有权
公开(公告)号：US10145861B2
公开(公告)日：2018-12-04
申请号：US15537120
申请日：2015-12-29
申请人： STROMLINET NANO LIMITED
发明人： En-Te Hwu
IPC分类号： G01Q60/38 , G01Q70/02 , G01Q70/04 , B82Y35/00 , G01Q20/00
摘要： A detection device having an attached probe, the detection device including a base body (100) and a probe (200). The base body (100) is provided with a stage (140), the probe (200) is provided with a probe base body (210) and a tip (220) extending from a side surface of one end of the probe base body (210), another end of the probe base body (210) is adhered to the base body (100) via an adhesion piece (230), the probe base body (210) can be removed from the base body (100), and the tip (220) is close to the stage (140) and deployed in the direction thereof. The probe base body (210) is directly attached to the base body (100) and easily removed therefrom. It is therefore easy to replace the probe (200).

89. 发明申请

US20180172728A1 PHOTONIC PROBE FOR ATOMIC FORCE MICROSCOPY 审中-公开
公开(公告)号：US20180172728A1
公开(公告)日：2018-06-21
申请号：US15799337
申请日：2017-10-31
申请人： Government of the United States of America, as represented by the Secretary of Commerce
发明人： VLADIMIR AKSYUK , MARCELO DAVANCO
IPC分类号： G01Q60/38 , G02B6/293 , G02B6/122
CPC分类号： H01J37/3174 , G01Q20/02 , G01Q20/04 , G01Q60/38 , G02B6/1225 , G02B6/29338 , G02B2006/12138 , H01J37/3026
摘要： A photonic probe for atomic force microscopy includes: a cantilever including: a tip; a wing in mechanical communication with the tip; an extension interposed between the tip and the wing to synchronously communicate motion of the tip with the wing; an optical resonator disposed proximate to the cantilever and that: receives input light; and produces output light, such that: the cantilever is spaced by a gap distance from the optical resonator, wherein the gap distance varies as the cantilever moves relative to the optical resonator, and the output light differs from the input light in response to movement of the cantilever relative to the optical resonator; an optical waveguide in optical communication with the optical resonator and that: provides the input light to the optical resonator; and receives the output light from the optical resonator.

90. 发明申请

US20170067902A1 A THREE ARM Y-SHAPED BISBIOTIN LIGAND 审中-公开
标题翻译：一个三臂的Y形形状的BISBIOTIN LIGAND
公开(公告)号：US20170067902A1
公开(公告)日：2017-03-09
申请号：US15119549
申请日：2015-02-18
申请人： Arizona Board of Regents on behalf of Arizona State University
发明人： Peiming ZHANG , Stuart LINDSAY , Subhadip SENAPATI , Sudipta BISWAS
IPC分类号： G01N33/58 , G01Q60/38 , C12Q1/68 , C07D495/04
CPC分类号： G01N33/587 , C07C247/04 , C07D495/04 , C12Q1/6816 , C12Q1/6834 , G01N33/58 , G01Q60/38 , C12Q2563/131
摘要： Embodiments of the present disclosure provide bisbiotin ligands and related conjugates and methods. The bisbiotin ligands, combined with streptavidin, can be used in the separation, labelling, targeting, and immobilization of biomolecules.
摘要翻译：本公开的实施方案提供双生物素配体和相关的缀合物和方法。结合链霉抗生物素蛋白的双生物素配体可用于分离，标记，靶向和固定生物分子。

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