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1. 发明授权

US09034149B2 Method for fabricating a high coercivity hard bias structure for magnetoresistive sensor 有权
标题翻译：用于制造用于磁阻传感器的高矫顽力硬偏置结构的方法
公开(公告)号：US09034149B2
公开(公告)日：2015-05-19
申请号：US12387377
申请日：2009-05-01
申请人： Min Zheng , Kunliang Zhang , Min Li
发明人： Min Zheng , Kunliang Zhang , Min Li
IPC分类号： C23C14/58 , C23C14/14 , C23C14/02 , G01R33/09 , G11B5/31 , G11B5/39
CPC分类号： C23C14/5833 , C23C14/025 , C23C14/14 , C23C14/5873 , G01R33/098 , G11B5/3163 , G11B5/3932
摘要： A hard bias (HB) structure for longitudinally biasing a free layer in a MR sensor is disclosed that includes a mildly etched seed layer and a hard bias (HB) layer on the etched seed layer. The HB layer may contain one or more HB sub-layers stacked on a lower sub-layer which contacts the etched seed layer. Each HB sub-layer is mildly etched before depositing another HB sub-layer thereon. The etch may be performed in an IBD chamber and creates a higher concentration of nucleation sites on the etched surface thereby promoting a smaller HB average grain size than would be realized with no etch treatments. A smaller HB average grain size is responsible for increasing Hcr in a CoPt HB layer to as high as 2500 to 3000 Oe. Higher Hcr is achieved without changing the seed layer or HB material and without changing the thickness of the aforementioned layers.
摘要翻译：公开了用于纵向偏置MR传感器中的自由层的硬偏置（HB）结构，其包括在蚀刻的种子层上的温和蚀刻的种子层和硬偏置（HB）层。 HB层可以包含堆叠在与蚀刻的种子层接触的下子层上的一个或多个HB子层。每个HB子层在其上沉积另一个HB子层之前被轻度蚀刻。蚀刻可以在IBD室中进行，并且在蚀刻表面上产生更高浓度的成核位点，从而促进比无蚀刻处理实现的更小的HB平均晶粒尺寸。较小的HB平均粒径负责将CoPt HB层中的Hcr增加到高达2500至3000 Oe。在不改变种子层或HB材料而不改变上述层的厚度的情况下实现更高的Hcr。

2. 发明申请

US20140202291A1 C-TYPE PLIERS 有权
标题翻译： C型夹具
公开(公告)号：US20140202291A1
公开(公告)日：2014-07-24
申请号：US13745896
申请日：2013-01-21
申请人： MIN-ZHENG ZENG
发明人： MIN-ZHENG ZENG
IPC分类号： B25B27/20
CPC分类号： B25B27/205
摘要： A C-type pliers contains a first elongated jaw including a first recess and a third recess, a second elongated jaw including a second recess and a fourth recess; a first handle further including a first notch, and a second handle including a second notch; a switching unit including a first cover, a second cover, a shaft extending outwardly from the second cover and used to drive the first cover and the second cover simultaneously, the shaft pivots the first handle, the second handle, the first elongated jaw, and the second elongated jaw; a switching unit also including a first retainer, a second retainer, when the first retainer retains in the first recess, the second retainer retains in the fourth recess simultaneously, and when the first retainer retains in the second recess, the second retainer retains in the third recess synchronously.
摘要翻译： C型钳子包括第一细长卡爪，其包括第一凹槽和第三凹槽，第二细长卡爪包括第二凹槽和第四凹槽; 还包括第一凹口的第一手柄和包括第二凹口的第二手柄; 开关单元，包括第一盖，第二盖，从第二盖向外延伸并用于同时驱动第一盖和第二盖的轴，所述轴使第一手柄，第二手柄，第一细长卡爪和第二个细长的下巴切换单元还包括第一保持器，第二保持器，当第一保持器保持在第一凹槽中时，第二保持器同时保持在第四凹部中，并且当第一保持器保持在第二凹部中时，第二保持器保持在第三个休息时间同步。

3. 发明授权

US08728333B2 Method to fabricate small dimension devices for magnetic recording applications 有权
标题翻译：制造用于磁记录应用的小尺寸装置的方法
公开(公告)号：US08728333B2
公开(公告)日：2014-05-20
申请号：US12658662
申请日：2010-02-12
申请人： Hui-Chuan Wang , Tong Zhao , Min Zheng , Minghui Yu , Min Li , Cherng Chyi Han
发明人： Hui-Chuan Wang , Tong Zhao , Min Zheng , Minghui Yu , Min Li , Cherng Chyi Han
IPC分类号： B44C1/22 , B82Y25/00 , G11B5/31 , G01R33/09 , H01F41/30
CPC分类号： B82Y25/00 , B82Y40/00 , G01R33/098 , G11B5/3163 , G11B5/398 , H01F10/3254 , H01F10/3259 , H01F41/308 , H01L43/12 , Y10T29/49021
摘要： A three step ion beam etch (IBE) sequence involving low energy (
摘要翻译：公开了涉及低能量（<300eV）的三步离子束蚀刻（IBE）序列，用于将传感器临界尺寸（自由层宽度= FLW）修整到小于50nm。第一个IBE步骤相对于传感器侧壁具有陡峭的入射角，占FLW降低的60％至90％。第二IBE步骤具有浅入射角和扫动运动，以从第一IBE步骤去除残留物并进一步修整侧壁。第三IBE步骤具有陡峭的入射角度，以从第二步骤去除损坏的侧壁部分，占FLW减少量的10％至40％。结果，FLW接近30nm，同时保持60％以上的高MR比和1.2ohm-μm2的低RA。通过改变一个或多个离子束入射角来操纵侧壁角。

4. 发明授权

US08611046B2 PMR writer with graded side shield 有权
标题翻译： PMR作家与分级侧盾
公开(公告)号：US08611046B2
公开(公告)日：2013-12-17
申请号：US12799131
申请日：2010-04-19
申请人： Yan Wu , Zhigang Bai , Moris Dovek , Cherng-Chyi Han , Min Li , Jianing Zhou , Jiun-Ting Lee , Min Zheng
发明人： Yan Wu , Zhigang Bai , Moris Dovek , Cherng-Chyi Han , Min Li , Jianing Zhou , Jiun-Ting Lee , Min Zheng
IPC分类号： G11B5/11 , G11B5/23 , G11B5/31
CPC分类号： G11B5/105 , G11B5/1278 , G11B5/3116 , G11B5/315 , G11B5/3163
摘要： A perpendicular magnetic recording (PMR) head is fabricated with a pole tip shielded laterally by a graded side shield that is conformal to the shape of the pole tip at an upper portion of the shield but not conformal to the pole tip at a lower portion. The shield includes a trailing shield, that is conformal to the trailing edge of the pole tip and may include a leading edge shield that magnetically connects two bottom ends of the graded side shield.
摘要翻译：垂直磁记录（PMR）头被制造成具有通过分级侧屏蔽横向屏蔽的极尖，该平面侧屏蔽保护层在屏蔽的上部处与极尖的形状保持一致，但在下部不与极尖共形。屏蔽件包括后挡板，其与电极尖端的后缘保持一致，并且可以包括磁性连接分级侧屏蔽件的两个底端的前缘屏蔽件。

5. 发明申请

US20100330395A1 Thin seeded Co/Ni multiplayer film with perpendicular anisotropy for read head sensor stabilization 有权
标题翻译：具有垂直各向异性的薄种子Co / Ni多层膜，用于读取头传感器稳定
公开(公告)号：US20100330395A1
公开(公告)日：2010-12-30
申请号：US12456935
申请日：2009-06-24
申请人： Kunliang Zhang , Min Li , Yuchen Zhou , Min Zheng
发明人： Kunliang Zhang , Min Li , Yuchen Zhou , Min Zheng
IPC分类号： G11B5/33 , B32B15/01 , B05D3/02
CPC分类号： G11B5/332 , B82Y10/00 , B82Y25/00 , G11B5/315 , G11B5/3909 , G11B5/3912 , G11B5/3932 , G11B2005/3996 , Y10T29/49032 , Y10T29/49034 , Y10T29/49044 , Y10T29/49067 , Y10T428/1143 , Y10T428/115 , Y10T428/1157 , Y10T428/1171 , Y10T428/1193 , Y10T428/12819
摘要： A hard bias (HB) structure for producing longitudinal bias to stabilize a free layer in an adjacent spin valve is disclosed and includes a composite seed layer made of at least Ta and a metal layer having a fcc(111) or hcp(001) texture to enhance perpendicular magnetic anisotropy (PMA) in an overlying (Co/Ni)X laminated layer. The (Co/Ni)X HB layer deposition involves low power and high Ar pressure to avoid damaging Co/Ni interfaces and thereby preserves PMA. A capping layer is formed on the HB layer to protect against etchants in subsequent process steps. After initialization, magnetization direction in the HB layer is perpendicular to the sidewalls of the spin valve and generates an Mrt value that is greater than from an equivalent thickness of CoPt. A non-magnetic metal separation layer may be formed on the capping layer and spin valve to provide an electrical connection between top and bottom shields.
摘要翻译：公开了用于产生纵向偏压以稳定相邻自旋阀中的自由层的硬偏压（HB）结构，其包括至少由Ta制成的复合晶种层和具有fcc（111）或hcp（001）结构的金属层以提高上覆（Co / Ni）X层叠层的垂直磁各向异性（PMA）。（Co / Ni）X HB层沉积涉及低功率和高Ar压力，以避免损坏Co / Ni界面，从而保留PMA。在HB层上形成覆盖层以防止后续工艺步骤中的蚀刻剂。在初始化之后，HB层中的磁化方向垂直于自旋阀的侧壁，并产生大于CoPt当量厚度的Mrt值。可以在封盖层和自旋阀上形成非磁性金属分离层，以提供顶部和底部屏蔽之间的电连接。

6. 外观设计

USD625978S1 Cutting device 有权
标题翻译：切割装置
公开(公告)号：USD625978S1
公开(公告)日：2010-10-26
申请号：US29355977
申请日：2010-02-18
申请人： Min-Zheng Zeng
设计人： Min-Zheng Zeng

7. 发明授权

US07773341B2 Laminated film for head applications 有权
标题翻译：用于头部应用的层压膜
公开(公告)号：US07773341B2
公开(公告)日：2010-08-10
申请号：US11825034
申请日：2007-07-03
申请人： Kunliang Zhang , Min Zheng , Min Li , Chen-Jung Chien , Cherng-Chyi Han
发明人： Kunliang Zhang , Min Zheng , Min Li , Chen-Jung Chien , Cherng-Chyi Han
IPC分类号： G11B5/33
CPC分类号： G11B5/3116 , G11B5/1278
摘要： A laminated main pole layer is disclosed in which a non-AFC scheme is used to break the magnetic coupling between adjacent high moment layers and reduce remanence in a hard axis direction while maintaining a high magnetic moment and achieving low values for Hch, Hce, and Hk. An amorphous material layer with a thickness of 3 to 20 Angstroms and made of an oxide, nitride, or oxynitride of one or more of Hf, Zr, Ta, Al, Mg, Zn, or Si is inserted between adjacent high moment stacks. The laminated structure also includes an alignment layer below each high moment layer within each stack. In one embodiment, a Ru coupling layer is inserted between two high moment layers in each stack to introduce an AFC scheme. An uppermost Ru layer is used as a CMP stop layer. A post annealing process may be employed to further reduce the anisotropy field (Hk).
摘要翻译：公开了一种层叠主极层，其中使用非AFC方案来破坏相邻的高力矩层之间的磁耦合，并且在保持高磁矩的同时降低硬轴方向的剩磁，并实现Hch，Hce和 Hk。由Hf，Zr，Ta，Al，Mg，Zn或Si中的一种或多种的氧化物，氮化物或氧氮化物形成的厚度为3〜20埃的无定形材料层插入相邻的高强度叠层之间。层叠结构还包括在每个堆叠内的每个高力矩层下面的对准层。在一个实施例中，Ru耦合层插入每个堆叠中的两个高矩层之间以引入AFC方案。使用最上层的Ru层作为CMP停止层。可以采用后退火工艺来进一步降低各向异性场（Hk）。

8. 发明申请

US20100159605A1 Method of Correction of Particle Interference to Hemoglobin Measurement 有权
标题翻译：血红蛋白测量的粒子干扰校正方法
公开(公告)号：US20100159605A1
公开(公告)日：2010-06-24
申请号：US12616273
申请日：2009-11-11
申请人： Shuliang ZHANG , Jiuliu Lu , Min Zheng , Eric M. Grace , Jing Li , Maritza Lavernia , Ted W. Britton
发明人： Shuliang ZHANG , Jiuliu Lu , Min Zheng , Eric M. Grace , Jing Li , Maritza Lavernia , Ted W. Britton
IPC分类号： G01N33/72
CPC分类号： G01N33/721 , G01N33/491 , Y10T436/10 , Y10T436/101666 , Y10T436/25 , Y10T436/25125
摘要： A method of correction of particle interference to hemoglobin measurement of a blood sample on a hematology analyzer is provided. The method includes mixing an aliquot of a blood sample with a lytic reagent to lyse red blood cells and forming a sample mixture; measuring absorbance of the sample mixture at a predetermined wavelength of a hemoglobin chromogen formed in the sample mixture, and obtaining an apparent hemoglobin concentration of the blood sample using obtained absorbance; measuring concentration and size of cellular particles remaining in the sample mixture; removing contribution of the cellular particles to the apparent hemoglobin concentration using the concentration and the size of the cellular particles to obtain a corrected hemoglobin concentration of the blood sample; and reporting the corrected hemoglobin concentration of the blood sample.
摘要翻译：提供了一种在血液分析仪上校正血液样品的血红蛋白测量的粒子干扰的方法。该方法包括将血样的等分试样与裂解试剂混合以溶解红细胞并形成样品混合物; 测量在样品混合物中形成的血红蛋白色原子的预定波长处的样品混合物的吸光度，并使用所获得的吸光度获得血液样品的表观血红蛋白浓度; 测量残留在样品混合物中的细胞颗粒的浓度和尺寸; 使用细胞颗粒的浓度和大小去除细胞颗粒对表观血红蛋白浓度的贡献，以获得血液样品的校正血红蛋白浓度; 并报告血样的校正血红蛋白浓度。

9. 发明申请

US20090323227A1 Ta/W film as heating device for dynamic fly height adjustment 有权
标题翻译： Ta / W薄膜作为动态飞行高度调节的加热装置
公开(公告)号：US20090323227A1
公开(公告)日：2009-12-31
申请号：US12215825
申请日：2008-06-30
申请人： Min Zheng , Min Li , Chen-Jung Chien , Kowang Liu , Sung Chung
发明人： Min Zheng , Min Li , Chen-Jung Chien , Kowang Liu , Sung Chung
IPC分类号： G11B5/33
CPC分类号： G11B5/314 , G11B5/6064
摘要： A dynamic fly heater (DFH) for improved lifetime and better film uniformity is disclosed for a magnetic head. The heater has a lower amorphous Ta layer and an upper W layer to promote small grain size and reduced electro-migration. The composite film is especially advantageous for heaters greater than 1000 Angstroms thick where dR/R is difficult to control in the prior art. The DFH may be a (Ta/W)n laminate in which the Ta layers are about 30 Angstroms thick and the combined thickness of the W layers is from 400 to 1200 Angstroms. A Ta film is preferably sputter deposited with an Ar pressure of 3 to 5 mTorr and the W film is sputter deposited in the same chamber with a 3 to 20 mTorr Ar pressure. In one embodiment, a merged read/write head has one DFH in the read head and a second DFH in the write head.
摘要翻译：公开了一种用于改善寿命和更好的膜均匀性的动态飞行加热器（DFH）。加热器具有较低的非晶Ta层和上W层，以促进小晶粒尺寸和减少的电迁移。复合膜对于现有技术中dR / R难以控制的大于1000埃的加热器是特别有利的。 DFH可以是（Ta / W）n层叠体，其中Ta层的厚度约为30埃，W层的组合厚度为400至1200埃。优选以3至5mTorr的Ar压力溅射沉积Ta膜，并将W膜以3至20mTorr Ar压力溅射沉积在相同的室中。在一个实施例中，合并的读/写头在读头中具有一个DFH，在写头中具有第二DFH。

10. 发明申请

US20070143033A1 Systems and methods for particle counting 有权
标题翻译：粒子计数的系统和方法
公开(公告)号：US20070143033A1
公开(公告)日：2007-06-21
申请号：US11312722
申请日：2005-12-20
申请人： Shuliang Zhang , Min Zheng , Dongqing Lin , Ziling Huo
发明人： Shuliang Zhang , Min Zheng , Dongqing Lin , Ziling Huo
IPC分类号： G06F19/00
CPC分类号： G01N15/12 , G01N35/00584 , G01N2015/1062 , G01N2015/1068 , G01N2015/1081 , G01N2015/1087
摘要： Systems and methods consistent with embodiments of the present invention provide a method for the measurement and analysis of particle counts in flow cytometry and hematology instruments. In some methods for the measurement and analysis of particle counts, a corrected histogram of particle distributions is calculated and used to obtain an accurate count of particles and an accurate measurement of other particle parameters.
摘要翻译：与本发明的实施方案一致的系统和方法提供了流式细胞术和血液学仪器中的颗粒计数的测量和分析方法。在一些用于测量和分析颗粒计数的方法中，计算颗粒分布的校正直方图并用于获得精确的颗粒计数和其他颗粒参数的精确测量。

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