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11. 发明申请

US20200041541A1 Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA) 审中-公开
公开(公告)号：US20200041541A1
公开(公告)日：2020-02-06
申请号：US16530725
申请日：2019-08-02
申请人： BRUKER NANO, INC.
发明人： Sergey Osechinskiy , Anthonius Ruiter , Bede Pittenger , Syed-Asif Syed-Amanulla
IPC分类号： G01Q60/38 , G01Q10/04 , G01Q20/04 , G01Q30/04
摘要： An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.

12. 发明申请

US20180059396A1 MICROSCOPIC IMAGE RECOGNITION SYSTEM AND METHOD FOR DETECTING PROTEIN-BASED MOLECULE 审中-公开
公开(公告)号：US20180059396A1
公开(公告)日：2018-03-01
申请号：US15654692
申请日：2017-07-19
申请人： I Shou University
发明人： Ching-Fen Chiang , Ming-Hung Tsai
IPC分类号： G02B21/00 , G01Q30/04 , G01N33/50
CPC分类号： G02B21/0024 , G01N33/50 , G01Q30/00 , G01Q30/04 , G02B21/00 , G02B21/0036 , G02B21/367 , G06K9/00147 , G06K9/4609 , G06T7/0012 , G06T7/44 , G06T2207/30024
摘要： A microscopic image recognition system for detecting a protein-based molecule by presenting a recognition image is provided. The protein-based molecule has a state of a monomer. The microscopic image recognition system includes an image capturing unit, a monomer tracking module and a texture mask. The image capturing unit is configured to capture an original image of the protein-based molecule. The monomer tracking module is configured to capture a monomer image from the original image based on a predetermined size and a predetermined brightness. The predetermined size and the predetermined brightness correspond to the monomer. The texture mask is configured to perform a two-dimensional masking process on the monomer image to form at least two texture images. The recognition image is formed by superimposing the at least two texture images. A microscopic image recognition method is also provided.

13. 发明授权

US09541575B2 Exploitation of second-order effects in atomic force microscopy 有权
标题翻译：在原子力显微镜中利用二阶效应
公开(公告)号：US09541575B2
公开(公告)日：2017-01-10
申请号：US14554394
申请日：2014-11-26
申请人： Tufts University
发明人： Maxim Dokukin , Igor Sokolov
IPC分类号： G01Q30/04 , G01Q60/32
CPC分类号： G01Q30/04 , G01Q60/28 , G01Q60/32
摘要： A processing system cooperates with an atomic force microscope operating in ramp mode at a ramp frequency is configured to collect data indicative of at least one of physical and chemical properties of a sample. The system collects data indicative of probe movement at a frequency that is higher than the ramp frequency. This data comprises a second-order portion of the probe's signal. Based at least in part on the second-order portion, the processor obtains a parameter that is indicative at least one of a physical and a chemical property of a sample.
摘要翻译：处理系统与以斜坡频率工作在斜坡模式的原子力显微镜配合以收集指示样品的物理和化学特性中的至少一个的数据。系统以高于斜坡频率的频率收集指示探头移动的数据。该数据包括探头信号的二阶部分。至少部分地基于二阶部分，处理器获得指示样品的物理和化学性质中的至少一个的参数。

14. 发明授权

US09397587B2 Multi-actuator design and control for a high-speed/large-range nanopositioning system 有权
标题翻译：用于高速/大范围纳米定位系统的多执行器设计和控制
公开(公告)号：US09397587B2
公开(公告)日：2016-07-19
申请号：US14547480
申请日：2014-11-19
申请人： Massachusetts Institute of Technology
发明人： Kamal Youcef-Toumi , Iman Soltani Bozchalooi , Andrew Careaga Houck
IPC分类号： H01L39/00 , H02N2/06 , H02N2/04 , G01Q10/04 , G01Q10/06 , G01Q30/04
CPC分类号： H02N2/06 , G01Q10/04 , G01Q10/06 , G01Q30/04 , H02N2/04
摘要： Multi-actuator system. The system includes at least two nano positioners having different ranges and bandwidths located in cascaded serial form to contact and move an object. A control system employs data-based control design to combine the at least two nano positioners so as to apportion actuation responsibilities among the at least two nano positioners so as to compensate for their coupled dynamics while moving the object. It is preferred to provide a separate controller for controlling separately each of the at least two nano positioners. Parameters of the separate controllers may be determined by minimizing output error.
摘要翻译：多执行器系统该系统包括具有不同范围和带宽的至少两个纳米定位器，其位于级联串行形式中以接触和移动物体。控制系统采用基于数据的控制设计来组合至少两个纳米定位器，以便在至少两个纳米定位器之间分配致动责任，以便在移动物体时补偿它们的耦合动力学。优选地提供单独的控制器，用于分别控制至少两个纳米定位器中的每一个。可以通过最小化输出误差来确定单独控制器的参数。

15. 发明授权

US09383387B2 System for lightweight image processing 有权
公开(公告)号：US09383387B2
公开(公告)日：2016-07-05
申请号：US14751769
申请日：2015-06-26
申请人： THE JOHNS HOPKINS UNIVERSITY
发明人： Adam Sean Jermyn , Justin David Silverman , Nina Markovic
IPC分类号： G06K9/00 , G01Q30/04 , G06T5/20 , G06K9/50 , G06T7/00 , G06T7/60 , B82Y35/00
CPC分类号： G01Q30/04 , B82Y35/00 , C01B2202/34 , G06K9/0014 , G06K9/50 , G06T5/20 , G06T7/12 , G06T7/62 , G06T2207/30108
摘要： An embodiment in accordance with the present invention provides a system and method for image analysis and processing. The present invention provides a software package for processing AFM data. More particularly it can be used for characterizing carbon nanotubes found within AFM images, though it does offer editing features that are general in nature. Its features are split amongst five menus, one button, and four data panels. The software package can be used to determine physical characteristics related to the imaged subject, such as, for instance length data for imaged carbon nanotubes.

16. 发明申请

US20150204902A1 METHOD AND APPARATUS OF TUNING A SCANNING PROBE MICROSCOPE 有权
标题翻译：调谐扫描探针显微镜的方法和装置
公开(公告)号：US20150204902A1
公开(公告)日：2015-07-23
申请号：US14675140
申请日：2015-03-31
申请人： Bruker Nano, Inc.
发明人： Chanmin Su , Paul Silva , Lin Huang , Bede Pittenger , Shuiqing Hu
IPC分类号： G01Q30/04 , G01Q60/34
CPC分类号： G01Q30/04 , B82Y35/00 , G01Q30/00 , G01Q40/00 , G01Q60/24 , G01Q60/34
摘要： An apparatus and method of automatically determining an operating frequency of a scanning probe microscope such as an atomic force microscope (AFM) is shown. The operating frequency is not selected based on a peak of the amplitude response of the probe when swept over a range of frequencies; rather, the operating frequency is selected using only peak data corresponding to a TIDPS curve.
摘要翻译：示出了自动确定诸如原子力显微镜（AFM）的扫描探针显微镜的操作频率的装置和方法。基于在扫描频率范围时探头的振幅响应的峰值，不选择工作频率; 而是仅使用对应于TIDPS曲线的峰值数据来选择工作频率。

17. 发明授权

US09081028B2 Scanning probe microscope with improved feature location capabilities 有权
标题翻译：具有改进的特征位置能力的扫描探针显微镜
公开(公告)号：US09081028B2
公开(公告)日：2015-07-14
申请号：US14386511
申请日：2013-03-19
申请人： Bruker Nano, Inc.
发明人： Charles Meyer
IPC分类号： G01Q10/04 , G01Q30/04 , G01Q60/30 , G01Q10/00 , G01Q30/02 , G01Q40/00 , G01Q60/38 , B82Y35/00
CPC分类号： G01Q10/00 , B82Y35/00 , G01Q30/02 , G01Q40/00 , G01Q60/38
摘要： An SPM assembly includes an SPM and a wide field image acquisition device that can be used to rapidly locate a region of interest and position that region within a SPM scan range of 100 microns or less. The wide field image acquisition device may include a low resolution camera having wide field of view in excess of 12 mm, and a high magnification camera having a field of view in the single mm range. Alternatively, a single camera could be used if it has sufficient zoom capability to have functionalities commensurate with both cameras. Collocation preferably is employed to coordinate translation between the low magnification and high magnification cameras (if separate cameras are used) and between the high magnification camera and the SPM.
摘要翻译： SPM组件包括SPM和广域图像采集装置，其可用于快速定位感兴趣区域并将该区域定位在100微米或更小的SPM扫描范围内。宽视场图像采集装置可以包括具有超过12mm的宽视场的低分辨率相机和具有单mm范围内的视野的高倍率相机。或者，如果具有足够的变焦能力以具有与两个相机相称的功能，则可以使用单个相机。配置优选用于协调低倍率和高倍率相机（如果使用分开的相机）之间以及高倍率相机和SPM之间的平移。

18. 发明授权

US08798935B2 Imaging method and use thereof 有权
标题翻译：成像方法及其用途
公开(公告)号：US08798935B2
公开(公告)日：2014-08-05
申请号：US13321935
申请日：2010-05-28
申请人： Christoph Riethmüller
发明人： Christoph Riethmüller
IPC分类号： G01N33/48 , G01Q60/42 , B82Y35/00 , B82Y15/00 , G01N33/50 , G01Q30/04
CPC分类号： G01N33/5026 , B82Y15/00 , B82Y35/00 , G01Q30/04 , G01Q60/42
摘要： The present invention relates to a method based on atomic force microscopy and the use thereof on biological surfaces. A method is provided to detect the Local Deviational Volume (LDV) of defined subcellular structures irrespective of a biochemical characterization.
摘要翻译：本发明涉及一种基于原子力显微镜的方法及其在生物学表面上的应用。提供了一种检测定义的亚细胞结构的局部偏差体积（LDV）的方法，而不考虑生物化学特性。

19. 发明授权

US08296856B2 Control system for scanning probe microscope 有权
标题翻译：扫描探针显微镜控制系统
公开(公告)号：US08296856B2
公开(公告)日：2012-10-23
申请号：US13147864
申请日：2010-02-04
申请人： Andrew Humphris , David Catto
发明人： Andrew Humphris , David Catto
IPC分类号： G01N13/16 , G01Q10/06 , G01Q30/04
CPC分类号： G01Q10/065 , G01Q30/04
摘要： A control system (32, 75) is for use with a scanning probe microscope of a type in which measurement data is collected at positions within a scan pattern described as a probe and sample are moved relative to each other. The control system is used in conjunction with a position detection system (34) that measures the position of at least one of the probe and sample such that their relative spatial location (x, y) is determined. Measurement data may then be correlated with empirically-determined spatial locations in constructing an image. The use of empirical location data means that image quality is not limited by the ability of a microscope scanning system to control mechanically the relative location of probe and sample.
摘要翻译：控制系统（32,75）用于扫描探针显微镜，其中测量数据在被描述为探针和样品相对于彼此移动的扫描图案内的位置被收集。控制系统与位置检测系统（34）一起使用，位置检测系统（34）测量探针和样本中的至少一个的位置，使得它们的相对空间位置（x，y）被确定。然后，测量数据可以在构建图像时与经验确定的空间位置相关联。使用经验位置数据意味着图像质量不受显微镜扫描系统机械控制探针和样品的相对位置的能力的限制。

20. 发明授权

US07865966B2 Method and apparatus of automatic scanning probe imaging 有权
标题翻译：自动扫描探针成像的方法和装置
公开(公告)号：US07865966B2
公开(公告)日：2011-01-04
申请号：US12210075
申请日：2008-09-12
申请人： Chanmin Su , Sergey Belikov
发明人： Chanmin Su , Sergey Belikov
IPC分类号： G01Q10/06 , G01Q30/04 , G01Q30/06
CPC分类号： G01Q30/04 , G01Q10/06 , Y10S977/85
摘要： A method of operating a scanning probe microscope (SPM) includes scanning a sample as a probe of the SPM interacts with a sample, and collecting sample surface data in response to the scanning step. The method identifies a feature of the sample from the sample surface data and automatically performs a zoom-in scan of the feature based on the identifying step. The method operates to quickly identify and confirm the location of features of interest, such as nano-asperities, so as to facilitate performing a directed high resolution image of the feature.
摘要翻译：操作扫描探针显微镜（SPM）的方法包括扫描样品作为SPM的探针与样品相互作用，并响应于扫描步骤收集样品表面数据。该方法从样品表面数据识别样品的特征，并基于识别步骤自动执行特征的放大扫描。该方法用于快速识别和确认感兴趣的特征的位置，例如纳米凹凸，以便于执行特征的定向高分辨率图像。

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