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    • 22. 发明授权
    • Multi-axis magnetic lens for focusing a plurality of charged particle beams
    • 用于聚焦多个带电粒子束的多轴磁性透镜
    • US09000394B2
    • 2015-04-07
    • US13464261
    • 2012-05-04
    • Weiming RenZhongwei Chen
    • Weiming RenZhongwei Chen
    • H01J37/14
    • H01J37/14B82Y10/00B82Y40/00H01J3/20H01J37/141H01J37/145H01J37/3177H01J2237/1035H01J2237/1415H01J2237/31774
    • The present invention provides two ways to form a special permeability-discontinuity unit inside every sub-lens of a multi-axis magnetic lens, which either has a simpler configuration or has more flexibility in manufacturing such as material selection and mechanical structure. Accordingly several types of multi-axis magnetic lens are proposed for various applications. One type is for general application such as a multi-axis magnetic condenser lens or a multi-axis magnetic transfer lens, another type is a multi-axis magnetic non-immersion objective which can require a lower magnetomotive force, and one more type is a multi-axis magnetic immersion objective lens which can generate smaller aberrations. Due to using permeability-discontinuity units, every multi-axis magnetic lens in this invention can also be electrically excited to function as a multi-axis electromagnetic compound lens so as to further reduce aberrations thereof and/or realize electron beam retarding for low-voltage irradiation on specimen.
    • 本发明提供了在多轴磁性透镜的每个子透镜内部形成特殊的渗透率不连续单元的两种方式,其具有更简单的构造或者在诸如材料选择和机械结构的制造中具有更大的灵活性。 因此,针对各种应用提出了几种类型的多轴磁性透镜。 一种用于一般应用,例如多轴磁聚焦透镜或多轴磁转移透镜,另一种类型是可以要求较低磁动势的多轴磁性非浸没物镜,另一种类型是 可以产生较小像差的多轴磁浸物镜。 由于使用导磁率不连续单位,本发明中的每个多轴磁性透镜也可以被电激励以用作多轴电磁复合透镜,以便进一步降低其像差和/或实现低电压的电子束延迟 对样品照射
    • 23. 发明授权
    • Monochromator for charged particle beam apparatus
    • 带电粒子束装置的单色器
    • US08274046B1
    • 2012-09-25
    • US13111851
    • 2011-05-19
    • Weiming RenZhongwei Chen
    • Weiming RenZhongwei Chen
    • G21K1/08H01J37/21H01J37/20
    • H01J37/28G21K1/093H01J37/05H01J2237/049H01J2237/057H01J2237/153
    • This invention provides a monochromator for reducing energy spread of a primary charged particle beam in charged particle apparatus, which comprises a beam adjustment element, two Wien-filter type dispersion units and an energy-limit aperture. In the monochromator, a double symmetry in deflection dispersion and fundamental trajectory along a straight optical axis is formed, which not only fundamentally avoids incurring off-axis aberrations that actually cannot be compensated but also ensures the exit beam have a virtual crossover which is stigmatic, dispersion-free and inside the monochromator. Therefore, using the monochromator in SEM can reduce chromatic aberrations without additionally incurring adverse impacts, so as to improve the ultimate imaging resolution. The improvement of the ultimate imaging resolution will be more distinct for Low-Voltage SEM and the related apparatuses which are based on LVSEM principle, such as the defect inspection and defect review in semiconductor yield management. The present invention also provides two ways to build a monochromator into a SEM, one is to locate a monochromator between the electron source and the condenser, and another is to locate a monochromator between the beam-limit aperture and the objective. The former provides an additional energy-angle depending filtering, and obtains a smaller effective energy spread.
    • 本发明提供一种用于减少带电粒子装置中的初级带电粒子束的能量扩散的单色仪,其包括光束调节元件,两个维恩滤波器型色散单元和能量限制孔径。 在单色仪中,形成沿着直线光轴的偏转色散和基本轨迹的双重对称性,其不仅从根本上避免了实际上不能被补偿的偏轴像差,而且还确保出射光束具有虚拟的虚拟交叉, 无色分离和单色仪内部。 因此,在SEM中使用单色仪可以减少色差,而不会产生不利影响,从而提高最终的成像分辨率。 对于低电压SEM和基于LVSEM原理的相关设备,如半导体产量管理中的缺陷检查和缺陷检查,最终成像分辨率的提高将会更加明显。 本发明还提供了在扫描电镜中构建单色仪的两种方法,一种是在电子源和电容器之间定位单色仪,另一种是在光束极限孔径和物镜之间定位单色仪。 前者提供额外的能量角取决于滤波,并获得较小的有效能量扩展。
    • 26. 发明申请
    • Carbon based electrocatalysts for fuel cells
    • 用于燃料电池的碳基电催化剂
    • US20100159305A1
    • 2010-06-24
    • US11376768
    • 2006-03-15
    • Yushan YanXin WangWenzhen LiMahesh WajeZhongwei ChenWilliam GoddardWei-Qiao Deng
    • Yushan YanXin WangWenzhen LiMahesh WajeZhongwei ChenWilliam GoddardWei-Qiao Deng
    • H01M4/92H01M4/88
    • H01M4/881H01M4/8605H01M4/92H01M4/926H01M8/1004H01M8/1011Y02E60/523
    • Novel proton exchange membrane fuel cells and direct methanol fuel cells with nanostructured components are configured with higher precious metal utilization rate at the electrodes, higher power density, and lower cost. To form a catalyst, platinum or platinum-ruthenium nanoparticles are deposited onto carbon-based materials, for example, single-walled, dual-walled, multi-walled and cup-stacked carbon nanotubes. The deposition process includes an ethylene glycol reduction method. Aligned arrays of these carbon nanomaterials are prepared by filtering the nanomaterials with ethanol. A membrane electrode assembly is formed by sandwiching the catalyst between a proton exchange membrane and a diffusion layer that form a first electrode. The second electrode may be formed using a conventional catalyst. The several layers of the MEA are hot pressed to form an integrated unit. Proton exchange membrane fuel cells and direct methanol fuel cells are developed by stacking the membrane electrode assemblies in a conventional manner.
    • 新型质子交换膜燃料电池和具有纳米结构组分的直接甲醇燃料电池配置在电极上的贵金属利用率更高,功率密度更高,成本更低。 为了形成催化剂,将铂或铂 - 钌纳米颗粒沉积在碳基材料上,例如单壁,双壁,多壁和杯堆叠碳纳米管。 沉积工艺包括乙二醇还原法。 通过用乙醇过滤纳米材料来制备这些碳纳米材料的对准阵列。 通过将催化剂夹在质子交换膜和形成第一电极的扩散层之间形成膜电极组件。 第二电极可以使用常规的催化剂形成。 MEA的几层被热压形成一个集成的单元。 质子交换膜燃料电池和直接甲醇燃料电池通过以常规方式堆叠膜电极组件来开发。
    • 27. 发明申请
    • E-BEAM DEFECT REVIEW SYSTEM
    • 电子束缺陷评估系统
    • US20100150429A1
    • 2010-06-17
    • US12335458
    • 2008-12-15
    • Jack JAUZhongwei CHENYi Xiang WANGChung-Shih PANJoe WANGXuedong LIUWeiming RENWei FANG
    • Jack JAUZhongwei CHENYi Xiang WANGChung-Shih PANJoe WANGXuedong LIUWeiming RENWei FANG
    • G06K9/00
    • G06T7/001G01N23/04G01N2223/102G01N2223/426G01N2223/611G06T2207/10061G06T2207/30148
    • The present invention relates to a defect review system, and/or particularly, to an apparatus and method of defect review sampling, review method and classification on a semiconductor wafer or a pattern lithography reticle during integrated circuit fabrication. These objects are achieved in comparing a reviewed image with a reference image pick-up through a smart sampling filter. A clustering computer system base on high speed network will provide data cache and save operation time and memory. A smart review sampling filter automatically relocate abnormal pattern or defects and classify the device location extracted from design database and/or from golden die image on the same substrate. The column of the present defect review system is comprised of the modified SORIL type objective lens. This column provides solution of improving throughput during sample review, material identification better image quality, and topography image of defect. One embodiment of the present invent adopts an optical auto focusing system to compromise micro height variation due wafer surface topography. And another embodiment adopts surface charge control system to regulate the charge accumulation due to electron irradiation during the review process.
    • 本发明涉及一种缺陷评估系统,和/或特别涉及在集成电路制造期间对半导体晶片或图案光刻掩模版进行缺陷评估抽样,评估方法和分类的装置和方法。 通过智能采样滤波器将经检查的图像与参考图像拾取进行比较,实现了这些目的。 基于高速网络的集群计算机系统将提供数据缓存,节省操作时间和内存。 智能检查采样过滤器自动重新定位异常模式或缺陷,并将从设计数据库中提取的设备位置和/或从相同基板上的金色模具图像分类。 本缺陷检查系统的列由改进的SORIL型物镜组成。 该栏提供了在样本审查期间提高吞吐量,材料识别更好的图像质量和缺陷的地形图像的解决方案。 本发明的一个实施例采用光学自动聚焦系统来破坏由晶片表面形貌引起的微高度变化。 另一个实施例采用表面电荷控制系统来调节在检查过程中由电子辐射引起的电荷累积。