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    • 4. 发明授权
    • Substrate processing apparatus using neutralized beam and method thereof
    • 使用中和束的基板处理装置及其方法
    • US07385183B2
    • 2008-06-10
    • US11335725
    • 2006-01-19
    • Sung-Chan ParkSung-Wook Hwang
    • Sung-Chan ParkSung-Wook Hwang
    • H05H3/02H01J37/26H01S1/00
    • H01J37/026H01J37/32357H01J2237/0042H01J2237/334
    • In a substrate processing apparatus using a neutralized beam and a method thereof, the substrate processing apparatus includes: an ion source for emitting an ion beam at an emitting angle; reflectors at which the ion beam emitted by the ion source is incident and subject to 2n collisions (where n is a positive integer) in first and second opposite directions to neutralize the ion beam as a neutralized beam and to restore a direction of propagation of the neutralized beam to the emitting angle of the ion beam; and a substrate at which the neutralized beam generated by the reflectors is incident on to perform a process. Accordingly, an incident angle of the resultant neutralized beam is perpendicular to a substrate, while the direction of propagation of the originating ion source and the surface of the substrate are maintained to be perpendicular to each other.
    • 在使用中和束的基板处理装置及其方法中,基板处理装置包括:用于以发射角发射离子束的离子源; 由离子源发射的离子束入射并且在第一和第二相反方向上经受2n次碰撞(其中n是正整数)的反射器,以将离子束中和作为中和的光束,并恢复所述离子束的传播方向 中和的束到离子束的发射角; 以及由反射器产生的被中和的光束入射的基板,以执行处理。 因此,所得中和束的入射角垂直于基板,而原始离子源和基板的表面的传播方向保持彼此垂直。
    • 7. 发明申请
    • Substrate processing apparatus using neutralized beam and method thereof
    • 使用中和束的基板处理装置及其方法
    • US20060163466A1
    • 2006-07-27
    • US11335725
    • 2006-01-19
    • Sung-Chan ParkSung-Wook Hwang
    • Sung-Chan ParkSung-Wook Hwang
    • H05H3/02
    • H01J37/026H01J37/32357H01J2237/0042H01J2237/334
    • In a substrate processing apparatus using a neutralized beam and a method thereof, the substrate processing apparatus includes: an ion source for emitting an ion beam at an emitting angle; reflectors at which the ion beam emitted by the ion source is incident and subject to 2n collisions (where n is a positive integer) in first and second opposite directions to neutralize the ion beam as a neutralized beam and to restore a direction of propagation of the neutralized beam to the emitting angle of the ion beam; and a substrate at which the neutralized beam generated by the reflectors is incident on to perform a process. Accordingly, an incident angle of the resultant neutralized beam is perpendicular to a substrate, while the direction of propagation of the originating ion source and the surface of the substrate are maintained to be perpendicular to each other.
    • 在使用中和束的基板处理装置及其方法中,基板处理装置包括:用于以发射角发射离子束的离子源; 由离子源发射的离子束入射并在第一和第二相反方向经受2n次碰撞(其中n是正整数)的反射器,以将离子束中和作为中和束并且恢复其中的传播方向 中和的束到离子束的发射角; 以及由反射器产生的被中和的光束入射的基板,以执行处理。 因此,所得中和束的入射角垂直于基板,而原始离子源和基板的表面的传播方向保持彼此垂直。