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1. 发明授权

US10197595B2 Dual-probe scanning probe microscope 有权
公开(公告)号：US10197595B2
公开(公告)日：2019-02-05
申请号：US15077599
申请日：2016-03-22
申请人： Bruker Nano, Inc.
发明人： Chanmin Su
IPC分类号： G01Q10/00 , B82Y35/00 , G01Q10/06 , G01Q70/06 , G01Q60/32 , G01Q60/36
摘要： An apparatus and method of positioning a probe of an atomic force microscope (AFM) includes using a dual probe configuration in which two probes are fabricated with a single base, yet operate independently. Feedback control is based on interaction between the reference probe and surface, giving an indication of the location of the surface, with this control being modified based on the difference in tip heights of the two probes to allow the sensing probe to be positioned relative to the sample at a range less than 10 nm.

2. 发明授权

US10088450B2 Method for evaluating structural change during production process, and analysis program 有权
公开(公告)号：US10088450B2
公开(公告)日：2018-10-02
申请号：US15526231
申请日：2014-12-08
申请人： HITACHI, LTD.
发明人： Takeshi Nakayama , Masanari Koguchi
IPC分类号： G01N27/62 , G01N33/20 , G01N1/44 , G01Q10/00 , H01J37/285
摘要： Areas having different isotopic ratios are artificially introduced into a metal material before sintering, a heat treatment, or grain boundary diffusion, and atom probe analysis results before and after sintering, a heat treatment, or grain boundary diffusion are compared to evaluate a change in isotopic distribution over time.

3. 发明授权

US10041970B2 High speed adaptive-multi-loop mode imaging atomic force microscopy 有权
公开(公告)号：US10041970B2
公开(公告)日：2018-08-07
申请号：US15326237
申请日：2015-07-14
申请人： Rutgers, The State University of New Jersey
发明人： Qingze Zou , Juan Ren , Jiangbo Liu
IPC分类号： G01Q10/00 , G01Q10/06 , G01Q60/34
摘要： A method for imaging a sample using a high speed dynamic mode atomic force microscope may include scanning a tip of a cantilever probe over a surface of the sample, regulating a vibration amplitude of the tip to remain constant at a set point value (Aset), via a first signal generated in a first feedback controller, measuring a mean tapping deflection of the tip, regulating the mean tapping deflection via a second signal generated in a second feedback controller, tracking and measuring an adjustment to the measured mean tapping deflection during the regulating. The method may further include generating an image topography of the sample based on the first signal, the second signal, and the measured adjustment of the mean tapping deflection of the cantilever probe.

4. 发明授权

US09995764B2 Method and apparatus for avoiding damage when analysing a sample surface with a scanning probe microscope 有权
公开(公告)号：US09995764B2
公开(公告)日：2018-06-12
申请号：US15455305
申请日：2017-03-10
申请人： Carl Zeiss SMT GmbH
发明人： Hans Hermann Pieper , Christof Baur , Rainer Fettig
IPC分类号： G01Q10/00 , G01Q10/06 , G01Q60/24
CPC分类号： G01Q10/065 , G01Q60/24 , G01Q60/30
摘要： The present application relates to a method for avoiding damage when analyzing a sample surface with a scanning probe microscope, the method comprising the step of: detecting an electrostatic interaction between a charging of the sample surface and a measuring tip of the scanning probe microscope in the course of the approach of the measuring tip to the sample surface already at a distance from the sample surface which is greater than the distance of the measuring tip when analyzing the sample surface.

5. 发明授权

US09977049B2 Scanning probe microscope and control method thereof 有权
公开(公告)号：US09977049B2
公开(公告)日：2018-05-22
申请号：US15092027
申请日：2016-04-06
申请人： OLYMPUS CORPORATION
发明人： Nobuaki Sakai
IPC分类号： G01Q10/00 , G01Q10/06 , G01Q60/32 , B82Y35/00
CPC分类号： G01Q10/00 , B82Y35/00 , G01Q10/065 , G01Q60/32
摘要： A scanning probe microscope includes a cantilever having a probe at a free end thereof; a scanner to three-dimensionally relatively move the probe and a sample; a vibrator to vibrate the cantilever based on a vibrating signal; a displacement detector to detect a displacement of the cantilever and to output a displacement signal indicating the displacement; and a phase difference information detecting section to generate a phase signal including information of a phase difference between the vibrating signal and the displacement signal. The phase difference information detecting section includes a phase regulating portion to provide, to the phase difference, a phase offset to cancel an initial phase difference present in a state in which the probe is not in contact with the sample.

6. 发明申请

US20170199220A1 Systems and Devices for Non-Destructive Surface Chemical Analysis of Samples 有权
公开(公告)号：US20170199220A1
公开(公告)日：2017-07-13
申请号：US15428552
申请日：2017-02-09
申请人： AIST-NT, Inc.
发明人： Sergey A. Saunin , Andrey V. Krayev , Vladimir V. Zhishimontov , Vasily V. Gavrilyuk , Leonid N. Grigorov , Alexey V. Belyaev , Dmitry A. Evplov
IPC分类号： G01Q30/02 , G01Q20/00 , G01Q10/00
CPC分类号： G01Q30/02 , G01Q10/00 , G01Q20/00 , G01Q30/025 , G01Q60/06
摘要： Aspects of the present invention include systems and devices useful for surface chemical analysis of solid samples by Tip Enhanced Raman Spectrometry (“TERS”), and particularly it relates to devices useful for chemical analysis of molecular compounds located either on or within thin surface layer of solid samples. Even more particularly, aspects of the present invention relate to systems, and devices for non-destructive analysis combining both high sensitivity and high spatial resolution of analysis of chemical compounds located or distributed on the surface of solid samples with obtaining important information regarding vibration spectra of atoms and molecular groups contained in a thin surface layer of solid samples. These objectives are realized by implementation of computer-assisted systems that use sensors to carefully regulate the motion of, and force applied to, probes of atomic force microscopes.

7. 发明授权

US09645182B2 Method and apparatus for detecting an energized E-field 有权
公开(公告)号：US09645182B2
公开(公告)日：2017-05-09
申请号：US14055195
申请日：2013-10-16
申请人： Whirlpool Corporation
发明人： Mark L. Herman , Garry L. Peterman , Daniel M. Putnam
IPC分类号： G01R31/00 , G01R29/12 , H05B6/62 , G01R1/00 , G05F1/00 , G01Q10/00
CPC分类号： G01R29/0857 , D06F58/02 , D06F58/266 , G01Q10/00 , G01R1/00 , G01R29/12 , G05F1/00 , G08B7/06 , G08B21/18 , H05B6/62
摘要： A method for detecting the presence of an energized e-field in a space, wherein the space includes at least one electrically conductive element disposed in the space and coupled with a controller, the method including receiving in the controller a signal from the at least one electrically conductive element, comparing the value to a threshold, and if the value exceeds the threshold, determining that an energized e-field occupies the space, and sending a signal from the controller indicative of the presence of the energized e-field in the space.

8. 发明授权

US09519005B2 Scanning mechanism and scanning probe microscope 有权
公开(公告)号：US09519005B2
公开(公告)日：2016-12-13
申请号：US14862538
申请日：2015-09-23
申请人： OLYMPUS CORPORATION
发明人： Nobuaki Sakai
IPC分类号： G01Q10/00 , G01Q20/02 , G01Q10/04 , G01Q30/02
CPC分类号： G01Q10/00 , G01Q10/04 , G01Q20/02 , G01Q30/025
摘要： A scanning mechanism includes a cantilever, an XY movable portion movable in X and Y directions parallel to an X-Y plane, an XY actuator to scan the XY movable portion in the X and Y directions, a Z actuator to scan the cantilever in a Z direction perpendicular to the X-Y plane, and a light condensing portion to cause light for detecting a displacement of the cantilever to enter the cantilever. The Z actuator and the light condensing portion are held by the XY movable portion and arranged side by side in projection to the X-Y plane.

9. 发明授权

US09410984B2 Surface force measuring method and surface force measuring apparatus 有权
标题翻译：表面力测量方法和表面力测量仪
公开(公告)号：US09410984B2
公开(公告)日：2016-08-09
申请号：US14762261
申请日：2014-01-16
申请人： ELIONIX INC.
发明人： Hironao Amemiya , Hayato Kobayashi , Takahisa Kato
IPC分类号： G01Q60/24 , G01Q10/06 , G01Q60/38 , G01Q20/04 , G01Q10/00
CPC分类号： G01Q60/38 , G01N2203/0286 , G01Q10/00 , G01Q20/04
摘要： The present invention provides a method and an apparatus for measuring a force (which will be referred to as surface force) acting between two material surfaces. A surface force measuring method includes moving an object (1) toward a probe (4) until the probe (4) is adsorbed to the object (1), then applying a load from an electromagnetic-force generator (20) to a supporting member (6) in a direction as to separate the probe (4) from the object (1) while gradually increasing an electric current supplied to the electromagnetic-force generator (20), obtaining a value of the electric current supplied to the electromagnetic-force generator (20) when the probe (4) is separated from the object (1), and converting the value of the electric current into a surface force acting between the probe (4) and the object (1).
摘要翻译：本发明提供一种用于测量作用在两个材料表面之间的力（将被称为表面力）的方法和装置。表面力测量方法包括将物体（1）朝向探针（4）移动直到探针（4）被吸附到物体（1），然后将负载从电磁力发生器（20）施加到支撑构件（6）沿着使探针（4）与物体（1）分离的方向，同时逐渐增加供应到电磁力发生器（20）的电流，获得提供给电磁力的电流值发生器（20），当探头（4）与物体（1）分离时，将电流值转换成作用在探头（4）和物体（1）之间的表面力。

10. 发明授权

US09404855B2 Method to obtain absorption spectra from near-field infrared scattering using homo-dyne detection 有权
标题翻译：使用同态电位检测从近场红外散射获得吸收光谱的方法
公开(公告)号：US09404855B2
公开(公告)日：2016-08-02
申请号：US14647410
申请日：2013-11-27
申请人： Xiaoji Xu , Gilbert C Walker
发明人： Xiaoji Xu , Gilbert C Walker
IPC分类号： G01Q20/02 , G01Q30/00 , G01N21/359 , B82Y20/00 , G01Q30/02 , G01Q60/22 , G01B9/02 , G01Q10/00
CPC分类号： G01N21/359 , B82Y20/00 , G01B9/0203 , G01N2201/06113 , G01N2201/10 , G01Q10/00 , G01Q30/02 , G01Q60/06 , G01Q60/22
摘要： The present disclosure provides a procedure and an apparatus to obtain the absorption profiles of molecular resonance with ANSOM. The method includes setting a reference field phase to φ=0.5π relative to the near-field field, and reference amplitude A≧5|αeff|. The requirement on phase precision is found to be
摘要翻译：本公开提供了获得与ANSOM的分子共振的吸收曲线的方法和装置。该方法包括相对于近场场设定参考场相位φ=0.5π，参考振幅A≥5|αeff|。相位精度的要求为<0.3π。该装置包括除了ANSOM之外的相位稳定机制，以保持小于0.1rad的高相位精度零差相位条件。该方法使ANSOM能够以纳米级空间分辨率执行振动光谱。

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