专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

91. 发明授权

US09274138B2 High throughput scanning probe microscopy device 有权
标题翻译：高通量扫描探针显微镜装置
公开(公告)号：US09274138B2
公开(公告)日：2016-03-01
申请号：US14410799
申请日：2013-06-24
申请人： Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
发明人： Hamed Sadeghian Marnani , Teunis Cornelis van den Dool , Niek Rijnveld
IPC分类号： G01Q10/04 , B82Y35/00 , G01Q60/38 , G01Q70/06
CPC分类号： G01Q10/04 , B82Y35/00 , G01Q60/38 , G01Q70/06
摘要： A scanning probe microscopy device for mapping nanostructures on a sample surface of a sample is provided. The device may comprise a plurality probes for scanning the sample surface, and one or more motion actuators for enabling motion of the probes relative to the sample, wherein each of the plurality of probes comprises a probing tip mounted on a cantilever arranged for bringing the probing tip in contact with the sampling surface for enabling the scanning. The device may further comprise a plurality of Z-position detectors for determining a position of each probing tip along a Z-direction when the probing tip is in contact with the sample surface, wherein the Z-direction is a direction transverse to the sample surface, for enabling mapping of the nanostructures.
摘要翻译：提供了用于在样品表面上绘制纳米结构的扫描探针显微镜装置。该装置可以包括用于扫描样品表面的多个探针和用于使探针相对于样品运动的一个或多个运动致动器，其中多个探针中的每一个探针包括安装在悬臂上的探测头，其布置成使探测尖端与采样表面接触以实现扫描。该装置还可以包括多个Z位置检测器，用于当探测尖端与样品表面接触时确定每个探测尖端沿Z方向的位置，其中Z方向是横向于样品表面的方向，用于实现纳米结构的映射。

92. 发明申请

US20160025771A1 SCANNING PROBE MICROSCOPE HEAD DESIGN 有权
标题翻译：扫描探针显微镜头设计
公开(公告)号：US20160025771A1
公开(公告)日：2016-01-28
申请号：US14805679
申请日：2015-07-22
申请人： Angstrom Science, Inc.
发明人： Andrew Norman Erickson , Stephen Bradley Ippolito , Kyle Alfred Hofstatter
IPC分类号： G01Q20/02 , G01Q60/38 , G01Q60/24 , G02B6/26 , G02B6/255
CPC分类号： G01Q20/02 , G01Q60/24 , G01Q60/38 , G02B6/2551 , G02B6/262
摘要： A SPM head incorporates a probe and a cantilever on which the probe is mounted. The cantilever has a planar reflecting surface proximate a free end of the cantilever. The cantilever extends from a mechanical mount and a single-mode optical fiber is supported by the mechanical mount to provide a beam axis at an angle away from normal relative to the reflecting surface.
摘要翻译： SPM头包含探头和安装探头的悬臂。悬臂具有靠近悬臂的自由端的平面反射表面。悬臂从机械安装座延伸，并且单模光纤由机械安装座支撑，以提供与相对于反射表面成一定角度的光束轴。

93. 发明申请

US20150276559A1 HIGH HEATING RATE THERMAL DESORPTION FOR MOLECULAR SURFACE SAMPLING 有权
标题翻译：用于分子表面采样的高加热速率热解吸
公开(公告)号：US20150276559A1
公开(公告)日：2015-10-01
申请号：US14227364
申请日：2014-03-27
申请人： UT-BATTELLE, LLC
发明人： Olga S. OVCHINNIKOVA , Gary J. VAN BERKEL
IPC分类号： G01N1/02 , G01Q30/02 , G01Q60/38
CPC分类号： G01Q30/02 , G01N1/4022 , G01N1/405
摘要： A method for analyzing a sample having at least one analyte includes the step of heating the sample at a rate of at least 106 K/s to thermally desorb at least one analyte from the sample. The desorbed analyte is collected. The analyte can then be analyzed.
摘要翻译：用于分析具有至少一种分析物的样品的方法包括以至少106K / s的速率加热样品以从样品热解吸至少一种分析物的步骤。收集解吸的分析物。然后可以分析分析物。

94. 发明授权

US09140720B2 Feedback controller in probe microscope utilizing a switch and a inverter 有权
标题翻译：探针显微镜中的反馈控制器利用开关和逆变器
公开(公告)号：US09140720B2
公开(公告)日：2015-09-22
申请号：US13935706
申请日：2013-07-05
申请人： Boise State University
发明人： Byung I. Kim
IPC分类号： G01Q20/00 , G01Q20/02 , G01Q60/32 , G01Q60/36 , G01Q30/14 , G01Q60/38 , G01Q70/10 , B82Y35/00
CPC分类号： G01Q20/02 , B82Y35/00 , G01Q30/14 , G01Q60/32 , G01Q60/36 , G01Q60/38 , G01Q70/10
摘要： A method of measuring properties of a sample, the method comprising: measuring a deflection of a cantilever of a COIFM; measuring a voltage at an actuator contacting the cantilever and configured to counteract the deflection of the cantilever; measuring a voltage at a scan signal source, wherein the scan signal source is communicably coupled to the piezotube and configured to move the piezotube along an X- and a Y-axis; measuring a voltage at a feedback controller, wherein the feedback controller is communicably coupled to the piezotube and configured to move the piezotube along a Z-axis; switching a switch from a first position to a second position; switching the switch to a third position; correlating at least one of the measurements to (i) a repulsive force, and (ii) an attractive force.
摘要翻译：一种测量样品性质的方法，所述方法包括：测量COIFM的悬臂的偏转; 测量与所述悬臂接触的致动器的电压并且构造成抵消所述悬臂的偏转; 测量扫描信号源处的电压，其中所述扫描信号源可通信地耦合到所述压电管并且被配置为沿X轴和Y轴移动所述压电管; 测量反馈控制器处的电压，其中所述反馈控制器可通信地耦合到所述压电管并且被配置为沿Z轴移动所述压电管; 将开关从第一位置切换到第二位置; 将开关切换到第三位置; 将至少一个测量值与（i）排斥力相关联，和（ii）吸引力。

95. 发明授权

US09110092B1 Scanning probe based apparatus and methods for low-force profiling of sample surfaces and detection and mapping of local mechanical and electromagnetic properties in non-resonant oscillatory mode 有权
标题翻译：基于扫描探针的仪器和方法，用于低强度样品表面分析，并以非共振振荡模式检测和映射局部机械和电磁特性
公开(公告)号：US09110092B1
公开(公告)日：2015-08-18
申请号：US14247041
申请日：2014-04-07
申请人： NT-MDT Development Inc.
发明人： Serguei Magonov , Sergey Belikov , John David Alexander , Craig Gordon Wall , Stanislav Leesment , Viktor Bykov
IPC分类号： G01N13/16 , G01B5/28 , G01Q10/00 , G01Q60/38 , G05D23/19
CPC分类号： G05D23/19 , G01Q10/06 , G01Q60/32 , G05D23/1919
摘要： This invention relates to multi-purpose probe-based apparatus, and to methods for providing images of surface topography, and detection and quantitative mapping of local mechanical and electromagnetic properties in non-resonant oscillatory mode. These methods may include filtering of incoming probe signals. These incoming probe signals provide time deflection curves, parts of which are used for the control of scanning and collection of data that reflects sample adhesion, stiffness, elastic modulus and viscoelastic response, electric and magnetic interactions. These methods permit adaptive choice of an AFM's deflection set-point, which allows imaging at the contact repulsive force for precise surface profilometry, as non-resonant oscillation brings tip and sample into intermittent contact. These methods permit choosing a desired deformation model that allows an extraction of quantitative mechanical properties including viscoelastic response from deflection curves. These methods also permit local quantitative measurements of tip-sample current and detection of surface potential, capacitance gradients and piezoresponse in non-resonant oscillatory mode. The stable thermal environment reduces apparatus thermal drift and improves apparatus performance.
摘要翻译：本发明涉及基于多用途探针的装置，以及用于提供表面形貌图像的方法，以及非共振振荡模式中局部机械和电磁特性的检测和定量映射。这些方法可以包括对输入探测信号的滤波。这些传入的探头信号提供时间偏转曲线，其部分用于控制扫描和收集反映样品粘附，刚度，弹性模量和粘弹性响应，电和磁相互作用的数据。这些方法允许自适应地选择AFM的偏转设定点，其允许以接触排斥力成像以进行精确的表面轮廓测量，因为非共振振荡使尖端和样品进入间歇接触。这些方法允许选择所需的变形模型，其允许提取包括偏转曲线的粘弹性响应的定量机械性能。这些方法还允许在非共振振荡模式下局部定量测量尖端样品电流和检测表面电位，电容梯度和压电应变。稳定的热环境降低了设备的热漂移，提高了设备性能。

96. 发明授权

US09081028B2 Scanning probe microscope with improved feature location capabilities 有权
标题翻译：具有改进的特征位置能力的扫描探针显微镜
公开(公告)号：US09081028B2
公开(公告)日：2015-07-14
申请号：US14386511
申请日：2013-03-19
申请人： Bruker Nano, Inc.
发明人： Charles Meyer
IPC分类号： G01Q10/04 , G01Q30/04 , G01Q60/30 , G01Q10/00 , G01Q30/02 , G01Q40/00 , G01Q60/38 , B82Y35/00
CPC分类号： G01Q10/00 , B82Y35/00 , G01Q30/02 , G01Q40/00 , G01Q60/38
摘要： An SPM assembly includes an SPM and a wide field image acquisition device that can be used to rapidly locate a region of interest and position that region within a SPM scan range of 100 microns or less. The wide field image acquisition device may include a low resolution camera having wide field of view in excess of 12 mm, and a high magnification camera having a field of view in the single mm range. Alternatively, a single camera could be used if it has sufficient zoom capability to have functionalities commensurate with both cameras. Collocation preferably is employed to coordinate translation between the low magnification and high magnification cameras (if separate cameras are used) and between the high magnification camera and the SPM.
摘要翻译： SPM组件包括SPM和广域图像采集装置，其可用于快速定位感兴趣区域并将该区域定位在100微米或更小的SPM扫描范围内。宽视场图像采集装置可以包括具有超过12mm的宽视场的低分辨率相机和具有单mm范围内的视野的高倍率相机。或者，如果具有足够的变焦能力以具有与两个相机相称的功能，则可以使用单个相机。配置优选用于协调低倍率和高倍率相机（如果使用分开的相机）之间以及高倍率相机和SPM之间的平移。

97. 发明授权

US08914911B2 Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy 有权
标题翻译：用于温度和频率依赖的原子力显微镜的磁致动和热悬臂
公开(公告)号：US08914911B2
公开(公告)日：2014-12-16
申请号：US13831187
申请日：2013-03-14
申请人： The Board of Trustees of the University of Illinois , Anasys Instruments
发明人： William P. King , Craig Prater , Byeonghee Lee , Doug Gotthard
IPC分类号： G01N13/16 , G01B5/28 , G01Q60/38 , G01Q60/00 , G01Q60/36 , G01Q10/04 , G01Q60/58 , B82Y35/00
CPC分类号： G01Q60/38 , B82Y35/00 , G01Q10/045 , G01Q60/363 , G01Q60/58
摘要： Described are methods for magnetically actuating microcantilevers and magnetically actuated and self-heated microcantilevers. Also described are methods for determining viscoelastic properties and thermal transition temperatures of materials.
摘要翻译：描述了用于磁力驱动微悬臂梁和磁力驱动和自加热微悬臂梁的方法。还描述了确定材料的粘弹性和热转变温度的方法。

98. 发明授权

US08895923B2 System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing 有权
标题翻译：用于非接触式显微镜的系统和方法用于样品的三维预表征，用于在纳米孔径下进行样品导航的快速和非破坏性
公开(公告)号：US08895923B2
公开(公告)日：2014-11-25
申请号：US14083438
申请日：2013-11-18
申请人： DCG Systems, Inc.
发明人： Vladimir A. Ukraintsev , Richard Stallcup , Sergiy Pryadkin , Mike Berkmyre , John Sanders
IPC分类号： H01J37/26 , H01J37/28 , G02B27/32 , G02B21/00 , G01Q60/00 , G01Q10/00 , G01Q60/38 , G01Q60/48
CPC分类号： G01Q10/02 , G01Q10/00 , G01Q30/025 , G01Q60/00 , G01Q60/38 , G01Q60/48
摘要： A system for performing sample probing. The system including an topography microscope configured to receive three-dimensional coordinates for a sample based on at least three fiducial marks; receive the sample mounted in a holder; and navigate to at least a location on the sample based on the at least three fiducial marks and the three-dimensional coordinates.
摘要翻译：用于执行抽样探测的系统。该系统包括构造成基于至少三个基准标记接收样本的三维坐标的地形显微镜; 接收安装在支架上的样品; 并基于至少三个基准标记和三维坐标导航到样本上的至少一个位置。

99. 发明授权

US08739311B2 Image force microscopy of molecular resonance 有权
标题翻译：图像力显微镜分子共振
公开(公告)号：US08739311B2
公开(公告)日：2014-05-27
申请号：US13816726
申请日：2011-08-11
申请人： H. Kumar Wickramasinghe , Indrajith Rajapaksa
发明人： H. Kumar Wickramasinghe , Indrajith Rajapaksa
IPC分类号： G01Q60/38
CPC分类号： G01Q60/38 , G01Q30/02 , G01Q60/34 , G01Q60/40
摘要： A new method in microscopy is provided which extends the domain of AFM's to nanoscale spectroscopy. Molecular resonance of nanometer features can be detected and imaged purely by mechanical detection of the force gradient between the interaction of the optically driven molecular dipole/multipole and its mirror image in a Platinum coated scanning probe tip. The method is extendable to obtain nanoscale spectroscopic information ranging from infrared to UV and RF.
摘要翻译：提供了一种新的显微镜方法，将AFM的领域扩展到纳米级光谱。纳米特征的分子共振可以通过机械检测在铂涂层扫描探针尖端中光学驱动的分子偶极/多极与其镜像的相互作用之间的力梯度来纯化而被检测和成像。该方法可扩展，以获得从红外到UV和RF的纳米级光谱信息。

100. 发明授权

US08728286B2 Method of manufacturing sample for atom probe analysis by FIB and focused ion beam apparatus implementing the same 有权
标题翻译：通过FIB制造原子探针分析的样品的方法和实施该样品的聚焦离子束装置的方法
公开(公告)号：US08728286B2
公开(公告)日：2014-05-20
申请号：US11936417
申请日：2007-11-07
申请人： Takashi Kaito
发明人： Takashi Kaito
IPC分类号： C23C14/00 , C23C14/32 , B44C1/22 , C03C15/00 , C03C25/68 , C23F1/00 , C23F3/00 , C23C14/04 , C23C14/14 , G01Q60/38 , G01Q70/10 , G01Q70/12 , B82Y35/00 , G01N1/32
CPC分类号： G01Q60/38 , B82Y35/00 , G01N1/32 , G01Q70/10 , G01Q70/12 , H01J2237/20 , H01J2237/3109 , H01J2237/31732 , H01J2237/3174
摘要： A method of manufacturing a sample for an atom probe analysis of the invention is made one going through a step of manufacturing a concave/convex structure in both of a base needle and a transplantation sample piece by an etching working of an FIB, a step of jointing mutual members, and a step of bonding such that the concave/convex structure becomes a mesh form by a deposition working of the FIB.
摘要翻译：制造本发明的原子探针分析用样品的方法是通过FIB的蚀刻加工在基针和移植样品中制造凹凸结构的工序的步骤，接合相互构件，以及通过FIB的沉积加工使凹凸结构变成网状的接合步骤。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式