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    • 46. 发明申请
    • Access speculation predictor implemented via idle command processing resources
    • 通过空闲命令处理资源实现访问推测预测器
    • US20090265293A1
    • 2009-10-22
    • US12105427
    • 2008-04-18
    • Richard NicholasRam RaghavanEric E. RetterJeffrey A. Stuecheli
    • Richard NicholasRam RaghavanEric E. RetterJeffrey A. Stuecheli
    • G06N5/00
    • G06F12/0862G06F12/0831G06F2212/507G06F2212/6022G06F2212/6024Y02D10/13
    • An access speculation predictor is provided that may be implemented using idle command processing resources, such as registers of idle finite state machines (FSMs) in a memory controller. The access speculation predictor may predict whether to perform speculative retrieval of data for a data request from a main memory of the data processing system based on history information stored for a memory region targeted by the data request. In particular, a first address may be extracted from the data request and compared to memory regions associated with second addresses stored in address registers of a plurality of FSMs of the memory controller. A FSM whose memory region includes the first address may be selected. History information for the memory region may be obtained from the selected FSM. The history information may be used to control whether to speculatively retrieve the data for the data request from a main memory.
    • 提供了可以使用诸如存储器控制器中的空闲有限状态机(FSM)的寄存器的空闲命令处理资源来实现的访问推测预测器。 访问推测预测器可以基于针对数据请求所针对的存储区域存储的历史信息来预测是否对数据处理系统的主存储器执行针对数据请求的数据的推测检索。 特别地,可以从数据请求中提取第一地址,并与存储在存储器控制器的多个FSM的地址寄存器中的第二地址相关联的存储器区域进行比较。 可以选择其存储区域包括第一地址的FSM。 可以从所选择的FSM获得用于存储器区域的历史信息。 历史信息可以用于控制是否从主存储器推测性地检索数据请求的数据。
    • 47. 发明申请
    • MEMORY WRAP TEST MODE USING FUNCTIONAL READ/WRITE BUFFERS
    • 使用功能读/写缓冲存储器封装测试模式
    • US20080126911A1
    • 2008-05-29
    • US11466111
    • 2006-08-22
    • Mark A. BrittainEdgar R. CorderoJohn T. HollawayEric E. Retter
    • Mark A. BrittainEdgar R. CorderoJohn T. HollawayEric E. Retter
    • G11C29/00
    • G01R31/31722G01R31/31712G11C29/48
    • A memory controller for a processing unit provides a memory wrap test mode path which selectively writes data from the write buffer of the controller to the read buffer of the controller, thereby allowing the write and read buffers to substitute for a system memory device during testing of the processing unit. The processing unit can thus be tested without the attached memory device yet still operate under conditions which generate bus traffic and chip noise similar to that generated under actual (end-use) operation. When a processor issues a write operation in test mode, the controller writes the data to an entry of the read buffer which corresponds to the write address. Thereafter, the processor can issue a read operation with the same address and the read buffer will send the data from the corresponding entry.
    • 用于处理单元的存储器控​​制器提供存储器包裹测试模式路径,其选择性地将数据从控制器的写入缓冲器写入到控制器的读取缓冲器,从而允许写入和读取缓冲器在测试期间替换系统存储器件 处理单元。 因此,处理单元可以在没有附加的存储器件的情况下进行测试,但仍然在产生与实际(最终使用)操作下生成的总线流量和芯片噪声类似的条件下操作。 当处理器在测试模式下发出写入操作时,控制器将数据写入对应于写入地址的读取缓冲器的条目。 此后,处理器可以发出具有相同地址的读取操作,并且读取缓冲器将从相应的条目发送数据。