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    • 1. 发明授权
    • Liquid crystal display device
    • 液晶显示装置
    • US08081282B2
    • 2011-12-20
    • US11950304
    • 2007-12-04
    • Seung-hee LeeJi-won SohnYeon-mun JeonSeong-jin HwangJae-jin Lyu
    • Seung-hee LeeJi-won SohnYeon-mun JeonSeong-jin HwangJae-jin Lyu
    • G02F1/1343G02F1/1337G02F1/136
    • G02F1/134309G02F1/1393G02F2001/13373G02F2001/134345
    • A liquid crystal display device includes a first substrate having a gate line and two data lines crossing with the gate line to define a pixel, a first pixel electrode connected to the gate line and the first data line, and a second pixel electrode connected to the gate line and the second data line. A second substrate opposes the first substrate and includes a common electrode having a common electrode cutting pattern. The pixel electrode includes a pixel electrode cutting pattern to form domains and sub domains in the pixel with the common electrode cutting pattern. A liquid crystal layer is arranged between the first and second substrates. The pixel electrodes include bent portions. The pixel electrode and the common electrode include sub cutting patterns extending towards the sub domains at the bent portions.
    • 液晶显示装置包括具有栅极线的第一基板和与栅极线交叉以限定像素的两条数据线,连接到栅极线和第一数据线的第一像素电极和连接到栅极线的第二像素电极 栅极线和第二条数据线。 第二衬底与第一衬底相对并且包括具有公共电极切割图案的公共电极。 像素电极包括像素电极切割图案,以在具有公共电极切割图案的像素中形成区域和子域。 液晶层设置在第一和第二基板之间。 像素电极包括弯曲部分。 像素电极和公共电极包括在弯曲部分处朝向子域延伸的子切割图案。
    • 4. 发明授权
    • Test handler including single-door-type stockers
    • 测试处理器,包括单门式储料器
    • US07659711B2
    • 2010-02-09
    • US11723491
    • 2007-03-20
    • Yeon-gyu SongHo-gyung KimKyong-eob EomSeung-hee LeeJae-ho Song
    • Yeon-gyu SongHo-gyung KimKyong-eob EomSeung-hee LeeJae-ho Song
    • G01R31/02G01R31/28
    • G01R31/2893G11C29/56016
    • A handler may include a handler system main body used for testing semiconductor devices; an open-type stocker portion on a front side of the handler system main body; and/or a plurality of single-door-type stockers in the open-type stocker portion. The single-door-type stockers may include windows on upper parts of front sides of the single-door-type stockers. The front sides of the single-door-type stockers may be protected. The handler also may include a front top door on an upper part of the front side of the handler system main body; locking stoppers below the windows of the single-door-type stockers; safety sensors on sides of the open-type stocker portion; and/or a working table in front of the open-type stocker portion. The open-type stocker portion may be below the front top door. The safety sensors may stop the handler when the single-door-type stockers are not closed.
    • 处理器可以包括用于测试半导体器件的处理器系统主体; 处理器系统主体的前侧的开放式储存器部; 和/或多个单门式储料器。 单门式储料器可以包括单门式储料器前侧上部的窗户。 单门式储料器的前侧可能受到保护。 处理器还可以包括在处理器系统主体的正面的上部的前顶门; 在单门式储料器的窗户下面锁定塞子; 开式储料器部分侧面的安全传感器; 和/或在开放型储料机部分前面的工作台。 开放式储料器部分可以在前顶门下方。 当单门式储料器未关闭时,安全传感器可能会停止处理程序。
    • 5. 发明申请
    • Test handler including single-door-type stockers
    • 测试处理器,包括单门式储料器
    • US20070221548A1
    • 2007-09-27
    • US11723491
    • 2007-03-20
    • Yeon-gyu SongHo-gyung KimKyong-eob EomSeung-hee LeeJae-ho Song
    • Yeon-gyu SongHo-gyung KimKyong-eob EomSeung-hee LeeJae-ho Song
    • B07C5/02
    • G01R31/2893G11C29/56016
    • A handler may include a handler system main body used for testing semiconductor devices; an open-type stocker portion on a front side of the handler system main body; and/or a plurality of single-door-type stockers in the open-type stocker portion. The single-door-type stockers may include windows on upper parts of front sides of the single-door-type stockers. The front sides of the single-door-type stockers may be protected. The handler also may include a front top door on an upper part of the front side of the handler system main body; locking stoppers below the windows of the single-door-type stockers; safety sensors on sides of the open-type stocker portion; and/or a working table in front of the open-type stocker portion. The open-type stocker portion may be below the front top door. The safety sensors may stop the handler when the single-door-type stockers are not closed.
    • 处理器可以包括用于测试半导体器件的处理器系统主体; 处理器系统主体的前侧的开放式储存器部; 和/或多个单门式储料器。 单门式储料器可以包括单门式储料器前侧上部的窗户。 单门式储料器的前侧可能受到保护。 处理器还可以包括在处理器系统主体的正面的上部的前顶门; 在单门式储料器的窗户下面锁定塞子; 开式储料器部分侧面的安全传感器; 和/或在开放型储料机部分前面的工作台。 开放式储料器部分可以在前顶门下方。 当单门式储料器未关闭时,安全传感器可能会停止处理程序。
    • 6. 发明授权
    • All optical gain-clamped amplifier and method thereof
    • 所有光增益钳位放大器及其方法
    • US06160657A
    • 2000-12-12
    • US181856
    • 1998-10-29
    • Seung-hee LeeSeong-ha Kim
    • Seung-hee LeeSeong-ha Kim
    • G02F1/35H01S3/067H01S3/00
    • H04B10/296G02F1/3538H01S3/06754
    • In an optical amplifier including an optical wavelength selective coupler for coupling an input optical signal by a wavelength selective coupling method, a gain medium for amplifying a signal from the optical wavelength selective coupler and outputting the amplified signal, and a pump connected to the optical wavelength selective coupler for causing a population inversion in the gain medium, an all optical gain-clamped amplifier further includes a nonlinear mineral material provided at the next part of the gain medium for restricting a signal output of the gain medium by emitting stimulated Brillouin scattered light, inputting it back to the gain medium and saturating the gain medium when the intensity of the input signal output from the gain medium is larger than preset standard value. In the optical amplifier as above, it is advantageous that in a wavelength division multiplexing network, when an input signal of n channels is changed to an input signal of (n-k) channels and is input into a gain medium due to circumstances such as faults, switching, adding and/or dropping of wavelengths, the gain medium is saturated without changing the population inversion level even though the number of channels of the input signal is changed, and a constant gain is obtainable with no relation to the number of channels.
    • 在包括用于通过波长选择耦合方法耦合输入光信号的光波长选择耦合器的光放大器中,用于放大来自光波长选择耦合器的信号并输出​​放大信号的增益介质和连接到光波长的泵 选择耦合器,用于在增益介质中引起群体反转,全光增益钳位放大器还包括在增益介质的下一部分提供的非线性矿物材料,用于通过发射受激布里渊散射光来限制增益介质的信号输出, 当从增益介质输出的输入信号的强度大于预设的标准值时,将其输入到增益介质并使增益介质饱和。 在如上所述的光放大器中,有利的是,在波分复用网络中,当n个信道的输入信号被改变为(nk)个信道的输入信号并且由于诸如故障的情况而被输入到增益介质中时, 切换,添加和/或丢弃波长,即使输入信号的信道数量改变,增益介质饱和而不改变总体反转电平,并且可以获得与信道数目无关的恒定增益。
    • 10. 发明授权
    • Test system for conducting parallel bit test
    • 用于并行位测试的测试系统
    • US07979760B2
    • 2011-07-12
    • US12382026
    • 2009-03-06
    • Byoung-sul KimSeung-hee LeeJung-kuk LeeHee-joo Choi
    • Byoung-sul KimSeung-hee LeeJung-kuk LeeHee-joo Choi
    • G11C29/00
    • G11C29/26G11C5/04G11C2029/2602
    • Provided is a test system conducting a parallel bit test. The test system, conducting a parallel bit test on a plurality of memory modules mounted on a socket, comprises a plurality of counters and a comparator. Each of the counters counts the number of data output signals in the same logic state, among the data output signals outputted from each memory of the memory modules, and outputs a count signal. The comparator compares the count signal outputted from each of the counters and outputs a comparison signal corresponding to a defect of the memory modules. According to the test system, defects in a memory module can be accurately detected and a possibility of an error in the detection can be reduced when a plurality of memory modules are tested, as compared to conventional test systems.
    • 提供了进行并行位测试的测试系统。 测试系统对安装在插座上的多个存储器模块进行并行位测试,包括多个计数器和比较器。 每个计数器对从存储器模块的每个存储器输出的数据输出信号中的相同逻辑状态下的数据输出信号的数量进行计数,并输出计数信号。 比较器比较从每个计数器输出的计数信号,并输出与存储器模块的缺陷相对应的比较信号。 根据测试系统,与常规测试系统相比,可以准确地检测存储器模块中的缺陷,并且当测试多个存储器模块时,可以减少检测中的错误的可能性。